Life Sciences Atomic Force Microscope – Perfect for Soft-Sample Applications

The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Electronics in the LS-AFM are constructed around industry standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

24-bit scan DAC

Scanning waveforms for generating precision motion in the X-Y axis with the piezo scanners are created with 24-bit DACS driven by a 32-bit micro controller. With 24-bit scanning, the highest resolution Atomic Force Microscopesimages may be measured. Feedback control using the xy strain gauges assures accurate tracking of the probe over the surface.

Phase and Amplitude Detector Circuit

Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can be configured to feedback on either phase or amplitude when scanning in vibrating mode.

Signal Accessible

At the rear of the EBox is a 50-pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.

Precision Analog Feedback

Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.

Variable Gain High Voltage Piezo Drivers

An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers. The LS-AFM is used in biology applications in conjunction with an inverted optical microscope. Customers can buy the LS-AFM in two variations:

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

TT-2 AFM – A Compact, Second-Generation High-Resolution Tabletop AFM

This high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.
Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.
Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.
Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.
Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.
LabView Software
The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.
Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.
Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.
Light Lever Large Adjustment Range
Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.
Applications:
Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More
Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
Education
With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.
Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

How Atomic Force Microscopes Useful in The Study of Polymers

AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. However, atomic force microscopy provides specific advantages over other microscopies because it provides mechanical interaction between the tip and sample. This mechanical source contrast often provides contrast in situations where electron or photon-based microscopies struggle or even fail.

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers.

Key Benefits of AFM

• Suitable for polymers, polymer blends, polymer composites
• Used to establish structure-property relationships
• Lateral resolution is ~10nm
• Information obtained includes morphology, dispersion, domain size, internal structure
• Sample preparation – cryo-microtoming – often needed to remove skin effects from molding, other processing methods
• Phase imaging is excellent method for contrast where contrast is based on material/mechanical properties such as stiffness and adhesion
• No post processing needed

Phase Imaging

Phase imaging is a channel collected in vibrating mode and requires no post processing. Phase imaging collects the information on the phase shift (Φ) induced in the cantilever vibration motion. The cantilever is driven at a resonant frequency and interacts with the sample at a given oscillation amplitude set by the user. The phase shift (Φ) is then induced by interacting with the sample and is mapped as a channel simultaneously with the topography channel while the tip raster scans over the surface. A variety of material properties can affect the tip-sample interaction and induce a phase shift including stiffness, adhesion, viscoelasticity, and capillary forces.

Sample Preparation

AFM imaging requires flat surfaces for imaging. However, polymer samples may require additional sample preparation beyond this. If there is a sample with a “skin”, or a sample that has been processed and only the inner bulk material needs to be imaged, it will need to be cryo-microtomed for AFM imaging. Cryo-microtoming is a process by which a very smooth surface is cut and prepared at cold temperatures on a cryomicrotome. Many samples such as thin films or spin-coated films can be imaged as is without this preparation.

A side from cryo-microtoming, no further sample preparation is required – i.e. no staining is required as is the case for electron microscopy-based methods such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Our AFM Users Recent Polymer Reference Publications

AFMWorkshop’s TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Advantages of using Atomic Force Microscopy for Nanoparticle characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nano meter resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include:

• Characterization of nanoparticles that are .5 nm in diameter and larger.
• Nanoparticle mixture distributions below 30 nm.
• Characterization of variable geometry nanoparticles.
• Direct visualization of hydrated nanoparticles/liquid medium.
• Characterization of nanoparticle physical properties such as magnetic fields.
• Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter

An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.

Nanoparticle Mixture Distributions below 30 nm

AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles

AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.

Hydrated Samples/Liquid Mediums

The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles

Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis

A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three-dimensional structure of the nanoparticles.

Why choose AFMWorkshop?

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, feel free to visit http://www.afmworkshop.com Or call at 1 (888) 671-5539.

What Are the Benefits of Attending AFM Workshops?

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bio applications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

TT-2 AFM Assembly Workshop
Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

Characterization of Polymer Materials – AFM Training
The two-day course on the application of atomic force microscopy on various materials, with an emphasis on polymer materials. Hands-on lab work mixed with lecture sessions gives participants a detailed understanding of the mechanisms involved. AFM is an essential tool for characterizing polymer structure, morphology, and other material properties.

Nanoparticle Characterization with Atomic Force Microscopy
Two-day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Advanced AFM Operation Techniques
This two-day AFM course mixes lectures with labwork on atomic force microscopy operation. While we will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, attendees with experience on any make or model of AFM instrument will find the labwork relevant and practical.

AFM Bioapplications
AFMWorkshop offers training for bio applications with Atomic Force Microscopes. Includes sample preparation, measuring Force Distance, imaging in liquid air.

Porto AFM Training Workshop
This is a training workshop, aimed at any researcher or scientist, who wants to learn about AFM or increase their knowledge of the technique. The course will include several hours of hands-on training in acquiring images with the atomic force microscope as well as AFM data processing.

Atomic force microscopes require training and education for optimal use. Without proper theoretical and operational training, users can run into frustration and problems with the AFM even if the issue is easily resolved. Training is an essential aspect of AFMWorkshop, as we want our customers to be fully prepared to have success using an atomic force microscope.

Our upcoming TT-2 AFM assembly workshop schedule is as follows:
• July 27-31, 2020
• October 19-23, 2020
To get yourself registered, visit www.afmworkshop.com Or call us at 1 (888) 671-5539.

Biology Applications Which Are Unique to Atomic Force Microscopes

Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are shown below.

Imaging Biomolecules
Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquid.

Double-stranded DNA Molecules
Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)
Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.
Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging cells
Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites
The Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells
Measurement of high-resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutant
The ability to image a very large number of cells allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally, the inverted microscope can be operated in epifluorescence mode.

Measuring Stiffness of Biomaterials at the Nanoscale
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
To learn more about our Atomic force microscopes, feel free to visit www.afmworkshop.com. Or call us at 1 (888) 671-5539

The Technology Behind Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning

Atomic Force Microscope Technology

Light Lever Force Sensor

The light lever force sensor had its origins in the work of precision engineers working on surface profilers. In 1932, Smaltz presented a light lever stylus profile that used film to record the movement of a sharp probe as it scanned across a surface. This technique was first applied to AFM by Amer, an IBM scientist. The light lever force sensor is now the standard in AFM designs.

Vibrating Mode AFM

As with the light lever force sensor, vibrating probe instruments were developed first for surface profilers. It was discovered that by vibrating the probe above a surface as it was scanned, lateral forces on the probe were reduced. Although Binnig and Quate discussed vibrating modes in their pioneering paper, it was a team of IBM scientists led by Kumar Wickramsinghe that first applied vibrating techniques to the AFM. Wickramsinghe’s group found that they were able to make the technique sensitive enough that they did not have to tap the surface. The AFMWorkshop does not recommend tapping the surface in vibrating mode AFM. This is possible using the technology developed by IBM scientists.

**The Technology Behind Atomic Force Microscopy**

Feedback Circuits

The first scanning tunneling microscope developed at IBM in Switzerland utilized analog feedback to control the relationship between the probe and surface while measuring an image. This is very similar to the pioneering work of Young at the NBS. Soon after that pioneers such as A. Lewis built scanning probe microscopes with digital feedback. However, because of the limitations of ADC and DAC converters, AFM Workshop uses high-fidelity analog feedback circuits to control the Z position of the probe/sample in its microscopes.

Re-Trace Technology

In a scanning probe microscope it is often advantageous to store height information while scanning a sample. This stored information can then be used for a following scan to hold the probe at a fixed distance above a sample’s surface. This technique was pioneered by University of Texas professor Alan Bard.

For a more complete introduction to Atomic Force Microscopy, we recommend Atomic Force Microscopy, by Peter Eaton and Paul West, published by Oxford University Press.

To learn more about atomic force microscopy, feel free to visit www.afmworkshop.com.

Advantages Of Using AFMs For Nanoparticle Characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include

Characterization of nanoparticles that are .5 nm in diameter and larger.
Nanoparticle mixture distributions below 30 nm.
Characterization of variable geometry nanoparticles.
Direct visualization of hydrated nanoparticles/liquid medium.
Characterization of nanoparticle physical properties such as magnetic fields.
Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter
An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.
Nanoparticle Mixture Distributions below 30 nm
AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles
AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.
Hydrated Samples/Liquid Mediums
The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles
Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis
A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three dimensional structure of the nanoparticles.

To learn more about AFM analysis of nanoparticles, feel free to visit http://www.afmworkshop.com.

Atomic Force Microscopes: An Ideal Tool For Instrument Innovators

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument. TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics. Because the software is written in LabVIEW, it can be easily modified to meet very specific demands.

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Additionally, National Instrument Data Acquisition Cards can be integrated into the TT-2 AFM to create a customized experiment.

Instrument Innovators are no longer faced with the decision to either create an entirely new AFM, or to live with the limitations of commercial AFMs that have limited documentation and a closed architecture. An engineering documentation package is available as an option to TT-2 AFM customers.

Mechanical Drawings

All the drawings for mechanical parts used to build a TT-2 AFM were created in AutoCAD and are included in the optional documentation package. If you require a .dwg file for a specific part in the TT-2 AFM, AFMWorkshop will provide it to you. Additionally, single parts in the microscope can be purchased if you need to modify a part for your needs. Each part is identified by part numbers on each mechanical drawing.

Software

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The TT-2 AFM includes a VI that can be modified for specific needs. The instrument control protocol for addressing functions such as Z feedback, XY scanning and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

Electronics

Direct access to TT-2 AFM electronics signals may be gained from a 50 pin ribbon cable at the rear of the TT-2 AFM EBox, or from the mode connector at the front of the microscope stage. For developers who want even more access, the technical guide includes schematics to all electronics in the TT-2 AFM, including: photodetector board, piezo electric control board, controller main board, and even the power supply board. There are several pinned signal access points on the main controller board.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

A brief overview of the TT-2 AFM Assembly Workshop

Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

TT-2 AFM Assembly & Operation Workshop

Attendees to this five day workshop build a TT-2 AFM atomic force microscope and learn how to operate it. Additionally, daily seminars provide attendees with training on the theory, operation and applications of an atomic force microscope. The workshop is primarily geared for customers who have purchased a TT-AFM Kit.

Each day begins with one to two hours of coursework followed by hands-on microscope assembly,testing and operation.

Attendees of the TT-2 AFM Assembly & Operation Workshop:

Are better able to operate, gain optimal performance, and obtain the best images from their TT-AFM.
Can repair the microscope whenever needed because they know the assembly process and all the parts used in its construction.
May easily modify their instrument to create unique instrumentation designed for their specific research applications.

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bioapplications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

Interested in joining our workshop?

Our upcoming TT-2 AFM assembly workshops:
June 24-28, 2019
Sept. 9-13, 2019

Visit www.afmworkshop.com and fill up the form to register yourself.