TT-2 AFM – A Compact, Second-Generation High-Resolution Tabletop AFM

This high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.
Key Features and Benefits of the TT-2 AFM

1. Low Noise Floor
   With a noise floor <80 picometers, the TT-2 Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.
2. Direct Drive Tip Approach
   A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.
3. Research Grade Video Optical Microscope
   With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.
4. Multiple Scanners
   Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.
5. LabView Software
   The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.
6. Modular Design
   Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.
7. Simple Probe Exchange
   With the removable probe holder, exchanging probes is simple, and takes less than a minute.
8. Light Lever Large Adjustment Range
   Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.
   Applications:
9. Research
   With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More
10. Instrument Innovators
    The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
11. Education
    With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.
    Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.