Standalone AFM- Flexible Enough to Scan All Sizes and Shapes of Samples

Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning almost any size and shape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has a linearized XY scan range of 40 microns, and two different Z ceramics: a 7-micron high resolution Z scanner, and a large motion 17-micron Z scanner.

Advanced Features of the SA-AFM Include:

• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Life Sciences Atomic Force Microscope – Perfect for Soft-Sample Applications

The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Electronics in the LS-AFM are constructed around industry standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

24-bit scan DAC

Scanning waveforms for generating precision motion in the X-Y axis with the piezo scanners are created with 24-bit DACS driven by a 32-bit micro controller. With 24-bit scanning, the highest resolution Atomic Force Microscopesimages may be measured. Feedback control using the xy strain gauges assures accurate tracking of the probe over the surface.

Phase and Amplitude Detector Circuit

Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can be configured to feedback on either phase or amplitude when scanning in vibrating mode.

Signal Accessible

At the rear of the EBox is a 50-pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.

Precision Analog Feedback

Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.

Variable Gain High Voltage Piezo Drivers

An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers. The LS-AFM is used in biology applications in conjunction with an inverted optical microscope. Customers can buy the LS-AFM in two variations:

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

TT-2 AFM – A Compact, Second-Generation High-Resolution Tabletop AFM

This high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.
Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.
Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.
Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.
Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.
LabView Software
The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.
Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.
Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.
Light Lever Large Adjustment Range
Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.
Applications:
Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More
Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
Education
With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.
Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

How Atomic Force Microscopes Useful in The Study of Polymers

AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. However, atomic force microscopy provides specific advantages over other microscopies because it provides mechanical interaction between the tip and sample. This mechanical source contrast often provides contrast in situations where electron or photon-based microscopies struggle or even fail.

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers.

Key Benefits of AFM

• Suitable for polymers, polymer blends, polymer composites
• Used to establish structure-property relationships
• Lateral resolution is ~10nm
• Information obtained includes morphology, dispersion, domain size, internal structure
• Sample preparation – cryo-microtoming – often needed to remove skin effects from molding, other processing methods
• Phase imaging is excellent method for contrast where contrast is based on material/mechanical properties such as stiffness and adhesion
• No post processing needed

Phase Imaging

Phase imaging is a channel collected in vibrating mode and requires no post processing. Phase imaging collects the information on the phase shift (Φ) induced in the cantilever vibration motion. The cantilever is driven at a resonant frequency and interacts with the sample at a given oscillation amplitude set by the user. The phase shift (Φ) is then induced by interacting with the sample and is mapped as a channel simultaneously with the topography channel while the tip raster scans over the surface. A variety of material properties can affect the tip-sample interaction and induce a phase shift including stiffness, adhesion, viscoelasticity, and capillary forces.

Sample Preparation

AFM imaging requires flat surfaces for imaging. However, polymer samples may require additional sample preparation beyond this. If there is a sample with a “skin”, or a sample that has been processed and only the inner bulk material needs to be imaged, it will need to be cryo-microtomed for AFM imaging. Cryo-microtoming is a process by which a very smooth surface is cut and prepared at cold temperatures on a cryomicrotome. Many samples such as thin films or spin-coated films can be imaged as is without this preparation.

A side from cryo-microtoming, no further sample preparation is required – i.e. no staining is required as is the case for electron microscopy-based methods such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Our AFM Users Recent Polymer Reference Publications

AFMWorkshop’s TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Advantages of using Atomic Force Microscopy for Nanoparticle characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nano meter resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include:

• Characterization of nanoparticles that are .5 nm in diameter and larger.
• Nanoparticle mixture distributions below 30 nm.
• Characterization of variable geometry nanoparticles.
• Direct visualization of hydrated nanoparticles/liquid medium.
• Characterization of nanoparticle physical properties such as magnetic fields.
• Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter

An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.

Nanoparticle Mixture Distributions below 30 nm

AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles

AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.

Hydrated Samples/Liquid Mediums

The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles

Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis

A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three-dimensional structure of the nanoparticles.

Why choose AFMWorkshop?

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, feel free to visit http://www.afmworkshop.com Or call at 1 (888) 671-5539.

Atomic Force Microscope for Nanotechnology Research – An Overview!

Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. With noise floors as low as 0.08 nm, AFM Workshop microscopes are fully capable of handling your nanotechnology research needs.

Atomic force microscopes are essential for nanotechnology research requiring the visualization and measurement of nano structures. AFMWorkshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Our instruments are robust and can be used in single-user as well as multi-user laboratories.

AFMWorkshop’s microscopes share a powerful and intuitive user interface that meet the needs of casual as well as advanced AFM operators.

Our Atomic Force Microscopes:
• give great images of nanostructures on both soft and hard materials;
• have an open architecture to facilitate the development of novel instruments;
• are used by customers to create images used in publications;
• include the most common modes.

Publications
Throughout the world, AFMWorkshop products are used every day for nanotechnology research projects in both life and physical sciences. While AFMWorkshop products were introduced to the market in late 2010, we already have a growing list of publications by successful AFMWorkshop customers. (It typically takes several years for customers to produce publications based on research generated by a new AFM.) To view a list of publications referencing AFMWorkshop products, click here.

Scanned Samples
All types of samples are scanned with AFMWorkshop atomic force microscopes, such as patterned surfaces, materials, and life science samples. Many more AFM images from AFMWorkshop atomic force microscopes can be viewed in our AFM Image Gallery.

Samples Screening
AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes already dedicated to specialized experiments. Routine and repetitive scanning of not particularly challenging samples can be completed without losing valuable time to readjusting the dedicated and more expensive instruments. Additionally, students and researchers can prepare themselves for operating higher-end microscopes by first learning to operate and master the TT-AFM.

Advanced Features of AFMWorkshop Products

High Resolution Scanning
with a Z noise floor of 0.08 nm, the TT-AFM is capable of high-resolution scanning on samples such as DNA, nanoparticles and nanotubes. To ensure optimal performance, our technical staff can provide pre-sales evaluation of your proposed AFM installation location
Expandable architecture
Our product line is expandable with many features offered as upgrades that can be purchased after your initial purchase. We uniquely offer several stage options that may be purchased for the same SPM Control Station.

Modes
Our products are offered with standard modes such as vibrating, and non-vibrating topography modes as well as phase mode and LFM. Additional modes such as C-AFM, lithography, MFM, and F/D are available as options for all of our products. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

What Are the Benefits of Attending AFM Workshops?

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bio applications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

TT-2 AFM Assembly Workshop
Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

Characterization of Polymer Materials – AFM Training
The two-day course on the application of atomic force microscopy on various materials, with an emphasis on polymer materials. Hands-on lab work mixed with lecture sessions gives participants a detailed understanding of the mechanisms involved. AFM is an essential tool for characterizing polymer structure, morphology, and other material properties.

Nanoparticle Characterization with Atomic Force Microscopy
Two-day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Advanced AFM Operation Techniques
This two-day AFM course mixes lectures with labwork on atomic force microscopy operation. While we will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, attendees with experience on any make or model of AFM instrument will find the labwork relevant and practical.

AFM Bioapplications
AFMWorkshop offers training for bio applications with Atomic Force Microscopes. Includes sample preparation, measuring Force Distance, imaging in liquid air.

Porto AFM Training Workshop
This is a training workshop, aimed at any researcher or scientist, who wants to learn about AFM or increase their knowledge of the technique. The course will include several hours of hands-on training in acquiring images with the atomic force microscope as well as AFM data processing.

Atomic force microscopes require training and education for optimal use. Without proper theoretical and operational training, users can run into frustration and problems with the AFM even if the issue is easily resolved. Training is an essential aspect of AFMWorkshop, as we want our customers to be fully prepared to have success using an atomic force microscope.

Our upcoming TT-2 AFM assembly workshop schedule is as follows:
• July 27-31, 2020
• October 19-23, 2020
To get yourself registered, visit www.afmworkshop.com Or call us at 1 (888) 671-5539.

Atomic Force Microscope Modes: An Overview

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.

Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM. AFMWorkshop instruments come with many options included.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.

Environmental Cell

Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with the TT-AFM probe holder while scanning.

Dunk and Scan Liquid Cell and Probe Holder for TT-AFM

A probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-AFM probe holder. To learn more about AFMWorkshop, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

AFM Workshop: A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 300 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS-AFM is the best option for scientists and researchers working with soft samples and biomaterials. Our newest model, the B-AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about AFMWorkshop and its products, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

The Technology Behind Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning

Atomic Force Microscope Technology

Light Lever Force Sensor

The light lever force sensor had its origins in the work of precision engineers working on surface profilers. In 1932, Smaltz presented a light lever stylus profile that used film to record the movement of a sharp probe as it scanned across a surface. This technique was first applied to AFM by Amer, an IBM scientist. The light lever force sensor is now the standard in AFM designs.

Vibrating Mode AFM

As with the light lever force sensor, vibrating probe instruments were developed first for surface profilers. It was discovered that by vibrating the probe above a surface as it was scanned, lateral forces on the probe were reduced. Although Binnig and Quate discussed vibrating modes in their pioneering paper, it was a team of IBM scientists led by Kumar Wickramsinghe that first applied vibrating techniques to the AFM. Wickramsinghe’s group found that they were able to make the technique sensitive enough that they did not have to tap the surface. The AFMWorkshop does not recommend tapping the surface in vibrating mode AFM. This is possible using the technology developed by IBM scientists.

**The Technology Behind Atomic Force Microscopy**

Feedback Circuits

The first scanning tunneling microscope developed at IBM in Switzerland utilized analog feedback to control the relationship between the probe and surface while measuring an image. This is very similar to the pioneering work of Young at the NBS. Soon after that pioneers such as A. Lewis built scanning probe microscopes with digital feedback. However, because of the limitations of ADC and DAC converters, AFM Workshop uses high-fidelity analog feedback circuits to control the Z position of the probe/sample in its microscopes.

Re-Trace Technology

In a scanning probe microscope it is often advantageous to store height information while scanning a sample. This stored information can then be used for a following scan to hold the probe at a fixed distance above a sample’s surface. This technique was pioneered by University of Texas professor Alan Bard.

For a more complete introduction to Atomic Force Microscopy, we recommend Atomic Force Microscopy, by Peter Eaton and Paul West, published by Oxford University Press.

To learn more about atomic force microscopy, feel free to visit www.afmworkshop.com.