Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning almost any size and shape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has a linearized XY scan range of 40 microns, and two different Z ceramics: a 7-micron high resolution Z scanner, and a large motion 17-micron Z scanner.

Advanced Features of the SA-AFM Include:
• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

This high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.
Key Features and Benefits of the TT-2 AFM

1. Low Noise Floor
   With a noise floor <80 picometers, the TT-2 Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.
2. Direct Drive Tip Approach
   A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.
3. Research Grade Video Optical Microscope
   With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.
4. Multiple Scanners
   Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.
5. LabView Software
   The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.
6. Modular Design
   Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.
7. Simple Probe Exchange
   With the removable probe holder, exchanging probes is simple, and takes less than a minute.
8. Light Lever Large Adjustment Range
   Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.
   Applications:
9. Research
   With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More
10. Instrument Innovators
    The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture. Read More
11. Education
    With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.
    Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with a flexible scanning software developed in LabVIEW. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

AFM is a powerful method for imaging polymers, polymer blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM now resides alongside optical microscopy and electron microscopy (SEM – scanning electron microscopy and TEM – transmission electron microscopy) as essential tools for characterization. However, atomic force microscopy provides specific advantages over other microscopies because it provides mechanical interaction between the tip and sample. This mechanical source contrast often provides contrast in situations where electron or photon-based microscopies struggle or even fail.

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers.

Key Benefits of AFM

• Suitable for polymers, polymer blends, polymer composites
• Used to establish structure-property relationships
• Lateral resolution is ~10nm
• Information obtained includes morphology, dispersion, domain size, internal structure
• Sample preparation – cryo-microtoming – often needed to remove skin effects from molding, other processing methods
• Phase imaging is excellent method for contrast where contrast is based on material/mechanical properties such as stiffness and adhesion
• No post processing needed

Phase Imaging

The predominant mode for imaging polymers is phase imaging, which is associated with vibrating mode. In phase imaging, the AFM provides excellent contrast, sensitivity, and discrimination based on various material properties of the polymers including stiffness and adhesion.

Phase imaging is a channel collected in vibrating mode and requires no post processing. Phase imaging collects the information on the phase shift (Φ) induced in the cantilever vibration motion. The cantilever is driven at a resonant frequency and interacts with the sample at a given oscillation amplitude set by the user. The phase shift (Φ) is then induced by interacting with the sample and is mapped as a channel simultaneously with the topography channel while the tip raster scans over the surface. A variety of material properties can affect the tip-sample interaction and induce a phase shift including stiffness, adhesion, viscoelasticity, and capillary forces.

Sample Preparation

AFM imaging requires flat surfaces for imaging. However, polymer samples may require additional sample preparation beyond this. If there is a sample with a “skin”, or a sample that has been processed and only the inner bulk material needs to be imaged, it will need to be cryo-microtomed for AFM imaging. Cryo-microtoming is a process by which a very smooth surface is cut and prepared at cold temperatures on a cryomicrotome. Many samples such as thin films or spin-coated films can be imaged as is without this preparation.

A side from cryo-microtoming, no further sample preparation is required – i.e. no staining is required as is the case for electron microscopy-based methods such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM).

Our AFM Users Recent Polymer Reference Publications

AFMWorkshop’s TT-AFM provides all the major Atomic Force Microscopy (AFM) modes needed to characterize polymers, including vibrating mode for topography/morphology and force distance curves for mechanical properties such as adhesion and stiffness. A number of researchers have published their work on polymers using the TT-AFM, characterizing important properties such as size, shape, and dispersion. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.