TT-2 Atomic Force Microscope – Capable of Measuring Samples with Features from Nano-Meters to Microns

This compact, second-generation high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software
The TT-2 uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range
Because the TT-2 Atomic Force Microscopehas a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications of TT-2 AFM:

Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More

Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshopfacilitates instrument innovation with an open architecture. Read More

Education
With its open design, the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

With high resolution as low as 0.08 nanometers, these atomic force microscopes offer the highest performance to price ratio in the industry. Our AFMs are the best for Education and Career Transformation, Biology, Medicine, and other Life Sciences, Nano-Profiling, nanoparticle characterization as well as for highly-demanding applications across all nano industries.

To learn more about AFMWorkshop and our Atomic Force Microscopes Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

Here’s How Atomic Force Microscope Can Help Students Develop Their Skills

AFMs for Educators

Educators generally have one or more of the following three objectives in mind when designing their AFM Education and Training programs for better students learning. The types of AFMs needed – and the dollar amount budgeted for their purchase – vary depending upon which objective the educator wants to accomplish.

For Students

Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments in all disciplines of science and engineering. There is a substantial and growing demand by students as well as professionals for AFM Education and training. AFMWorkshop has considerable advantages for both groups of learners.

Expose Students to the Nano World

Educators who fall within this category seek to expose students to an atomic force microscope by showing them what an AFM looks like and how it operates. Students learn that it is possible to create a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

This group of educators is focused on training students how to operate the AFM and how to use the instrument for measuring images of several types of samples. Students are exposed to the basic operation of the Atomic Force Microscope, including how the instrument scans and how the feedback control works. This educational experience prepares the student for operating AFM instruments in research and industrial environments. This training can last anywhere from one week to an entire semester.

Build Student Career Potential

Educators within this category seek to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments. Students will build their own AFMs and learn how to measure images on standard reference samples. A one week intensive 40-hour course can accomplish this group’s objective.

AFMWorkshop offers instrumentation and training materials to meet the demands of all three educational groups.

AFM Instrumentation

One of our most popular instruments used in educational settings is the TT-2 AFM. Because the TT-2 AFM is similar to 99% of the Atomic Force Microscopes used in research labs throughout the world, students can use skills developed on the TT-2 AFM to operate AFMs with more complex instrumentation.

On a TT-2 AFM, students learn how to operate all of the key modes such as contact, vibrating, lateral force, and phase modes. For example, the TT-2 AFM and AFMWorkshop were selected as instruments and trainers of choice by Hiroshi Yokoyama, Ph.D., director of Kent State University’s Glenn H. Brown Liquid Crystal Institute. To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Vibration Solutions – For High-Resolution Scanning!!

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause blurred or noisy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshophas designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Our Vibration Isolation Solutions filter out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A moderate structural vibration isolation is possible with the Passive Vibration Table. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Vibration Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations, and then electromechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee Option is that the Vibration Table top is more stable and more compact than a platform suspended with bungee cords.

Bungee Option

Placing the AFM on a platform suspended by bungee cords offers one of the best structural isolation platforms possible. Further, the Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations. The Bungee Options is designed to be used with the Acoustic Enclosure (AC-7859) Included with the option are a platform, and bungee cords, as well as associated metal support hooks.

Vibration Cabinet

The Acoustic chamber reduces vibrations transmitted through air. The enclosure is constructed from 3/4” HDPE and has 1” acoustic foam on its interior surfaces.

At the rear of the chamber is a sealed passage for wires and cables. The door of the chamber can be configured to open to the left or to the right.

On optional support table is available for the acoustic chamber. The optional support table has an opening at its back side that is 20.5”. The AFM system EBox can be stored inside the support table.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. AFMWorkshop can fabricate acoustic enclosures of almost any size and shape.

To learn more, feel free to visit www.afmworkshop.com or call at 1 (888) 671-5539.

15 Micron Atomic Force Microscope Scanner for High-Resolution Scans

The 15-micron scanner is interchangeable with the 50-micron or 100-micron scanner in the TT-2 AFM or HR-AFM. Extremely high-resolution scans are made with the 15-micron scanner.

Description
The PS-2010, PS-2011 and PS-2019 piezoelectric scanners are designed for use with the AFMWorkshop TT-2 and HR-AFM Atomic Force Microscopes, and scan samples in the X, Y, and Z-axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y-axis. The PS-2010 and PS-2019 have temperature compensated strain gauges in the Z-axis, while the PS-2011 does not.All scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1, in the 100 µm scanner it’s 10:1 and in the 15 µm scanner, it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20-pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm, 50 µmand the 100µm scanners are interchangeable. The scanners are removed from the TT-2 AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20-pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with another scanner. The 15 µm scanner is our recommendation for highest resolution scanning and lowest noise on the TT2-AFM and HR-AFM.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan, and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

The Technology Behind Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning

Atomic Force Microscope Technology

Light Lever Force Sensor

The light lever force sensor had its origins in the work of precision engineers working on surface profilers. In 1932, Smaltz presented a light lever stylus profile that used film to record the movement of a sharp probe as it scanned across a surface. This technique was first applied to AFM by Amer, an IBM scientist. The light lever force sensor is now the standard in AFM designs.

Vibrating Mode AFM

As with the light lever force sensor, vibrating probe instruments were developed first for surface profilers. It was discovered that by vibrating the probe above a surface as it was scanned, lateral forces on the probe were reduced. Although Binnig and Quate discussed vibrating modes in their pioneering paper, it was a team of IBM scientists led by Kumar Wickramsinghe that first applied vibrating techniques to the AFM. Wickramsinghe’s group found that they were able to make the technique sensitive enough that they did not have to tap the surface. The AFMWorkshop does not recommend tapping the surface in vibrating mode AFM. This is possible using the technology developed by IBM scientists.

**The Technology Behind Atomic Force Microscopy**

Feedback Circuits

The first scanning tunneling microscope developed at IBM in Switzerland utilized analog feedback to control the relationship between the probe and surface while measuring an image. This is very similar to the pioneering work of Young at the NBS. Soon after that pioneers such as A. Lewis built scanning probe microscopes with digital feedback. However, because of the limitations of ADC and DAC converters, AFM Workshop uses high-fidelity analog feedback circuits to control the Z position of the probe/sample in its microscopes.

Re-Trace Technology

In a scanning probe microscope it is often advantageous to store height information while scanning a sample. This stored information can then be used for a following scan to hold the probe at a fixed distance above a sample’s surface. This technique was pioneered by University of Texas professor Alan Bard.

For a more complete introduction to Atomic Force Microscopy, we recommend Atomic Force Microscopy, by Peter Eaton and Paul West, published by Oxford University Press.

To learn more about atomic force microscopy, feel free to visit www.afmworkshop.com.

Advantages Of Using AFMs For Nanoparticle Characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include

Characterization of nanoparticles that are .5 nm in diameter and larger.
Nanoparticle mixture distributions below 30 nm.
Characterization of variable geometry nanoparticles.
Direct visualization of hydrated nanoparticles/liquid medium.
Characterization of nanoparticle physical properties such as magnetic fields.
Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter
An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.
Nanoparticle Mixture Distributions below 30 nm
AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles
AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.
Hydrated Samples/Liquid Mediums
The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles
Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis
A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three dimensional structure of the nanoparticles.

To learn more about AFM analysis of nanoparticles, feel free to visit http://www.afmworkshop.com.

A brief overview of the TT-2 AFM Assembly Workshop

Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

TT-2 AFM Assembly & Operation Workshop

Attendees to this five day workshop build a TT-2 AFM atomic force microscope and learn how to operate it. Additionally, daily seminars provide attendees with training on the theory, operation and applications of an atomic force microscope. The workshop is primarily geared for customers who have purchased a TT-AFM Kit.

Each day begins with one to two hours of coursework followed by hands-on microscope assembly,testing and operation.

Attendees of the TT-2 AFM Assembly & Operation Workshop:

Are better able to operate, gain optimal performance, and obtain the best images from their TT-AFM.
Can repair the microscope whenever needed because they know the assembly process and all the parts used in its construction.
May easily modify their instrument to create unique instrumentation designed for their specific research applications.

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bioapplications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

Interested in joining our workshop?

Our upcoming TT-2 AFM assembly workshops:
June 24-28, 2019
Sept. 9-13, 2019

Visit www.afmworkshop.com and fill up the form to register yourself.

AFMWorkshop – On-Site AFM Installation And Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

Unpack AFM
Set up AFM
Evaluate AFM site for acoustic and structural vibrations
Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

Changing samples
Changing probes
Aligning the light lever
Positioning the photo-detector
Selecting resonance (vibrating mode only)
Tip approach
Scanning
Optimizing GPID
High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about our AFM Installation Training programs, feel free to visit www.afmworkshop.com.

Nanoparticle Characterization With Atomic Force Microscopy

Two day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Atomic Force Microscopy to Characterize Nanoparticles

Two Day Training Course

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods. The AFM provides powerful information on size, distribution, and geometries of nanoparticles.

Some of the unique advantages of nanoparticle characterization with an AFM include:

-Characterization of nanoparticles that are .5nm and up.
-Nanoparticle mixture distributions below 30 nm.
-Characterization of variable geometry nanoparticles.
-Direct visualization of hydrated nanoparticles/liquid medium.
-Characterization of nanoparticle physical properties such as magnetic fields.

This two day AFMWorkshop course mixes lecture with labwork on atomic force microscopy operation specifically as it applies to characterizing nanoparticles. AFM hardware and software will be reviewed, with special emphasis on the imaging modes and image processing needed to study nanoparticles. We will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, however attendees with experience on any make of AFM instrument will find the labwork relevant and practical.

Topics to Be Covered:

-Overview of AFM operation and different modes Topography measurements on nanoparticles.
-Nanoscale resolution
-Overview of AFM hardware
-Overview of AFM software
-Imaging modes for nanoparticles
-Imaging artifacts and best practices
-Image processing for important measurements on nanoparticles

Labwork:

-Scanning standard and reference samples.
-Nanoparticle imaging and image processing.
-AFM calibration

Interested in participating of our workshops?

To learn more about Atomic Force Microscopes Training, feel free to visit www.afmworkshop.com.

AFM: An Ideal Tool to Use in the Photonics Industry

Atomic Force Microscopes (AFMs) offer substantially better horizontal and vertical resolution than optical and stylus profilers. For this reason, AFMs are ideal for the analysis of materials used in the photonics industry.

Some of the advantages from using an AFM for analysis of photonics materials include the following:

Three dimensional structures are measured: depth and angles are measurable.
Image is independent of optical properties.
No sample preparation required – no coatings, no cross sections.
Extreme contrast on flat samples.

Atomic Force Microscopy is non-destructive.

AFM applications in the photonics industry include:
Analysis of Polished Fused Silica Substrates
Ruled Gratings
Holographic Gratings

Analysis of Polished Fused Silica Substrates

Once polished, fused silica substrates can have surface roughness values of 0.1 nm. With an AFM it is possible to visualize the surface of polished silica substrates, to measure the surface texture, and to measure the dimensions of structures created by the polishing process.

Ruled Gratings

Atomic Force Microscopes scan and directly measure the topography of ruled grating. From AFM images the ruling angle, pitch, and surface texture of features are measurable. The image below is of a ruled grating measured on a TT-AFM.

Holographic Gratings

Specifications of holographic grating including heights must be maintained to very tight tolerances. Properly operated, an AFM can measure step heights as low as a few angstroms with very high precision and accuracy.

Looking for a reliable Atomic Force Microscope company?

Try AFMWorkshop, We have extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn more about AFM Workshop Products, feel free to visit at www.afmworkshop.com.