TT-2 Atomic Force Microscope – Capable of Measuring Samples with Features from Nano-Meters to Microns

This compact, second-generation high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software
The TT-2 uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range
Because the TT-2 Atomic Force Microscopehas a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications of TT-2 AFM:

Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More

Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshopfacilitates instrument innovation with an open architecture. Read More

Education
With its open design, the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

With high resolution as low as 0.08 nanometers, these atomic force microscopes offer the highest performance to price ratio in the industry. Our AFMs are the best for Education and Career Transformation, Biology, Medicine, and other Life Sciences, Nano-Profiling, nanoparticle characterization as well as for highly-demanding applications across all nano industries.

To learn more about AFMWorkshop and our Atomic Force Microscopes Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

Introduction to the Atomic Force Microscope

The working principle of the Atomic Force Microscope (AFM) is based on the forces that arise when a sample surface is scanned with a nanometer-sized tip (a few to 10s of nm) attached to a cantilever.

The advancement of the AFM over traditional stylus surface profilers is that the former uses a feedback loop to control the forces between the surface and probe. Because the forces are controlled, very small probes may be used, and not broken while capturing an image.

AFMWorkshop products all include 5 standard modes. There are two primary modes used for measuring the topography of a sample, which are contact mode and vibrating mode. Lateral Force and Phase modes offer surface material contrast. Finally Force-Distance (F/D) curves measure the interaction forces between a probe and surface.

Contact Mode:

The probing tip is in contact with the surface throughout the imaging in contact mode. The short-range forces between the surface and tip cause the deflection of the cantilever, which is recorded to generate the topographical image of the surface. However, the tip-surface contact in this mode can potentially damage the surface or wear the tip. Hence, this mode may not be suitable for imaging of soft surfaces. On the other hand, continuous contact with the surface allows identifying other features such as friction (lateral force imaging) or stiffness/elasticity map of the surface (force modulation imaging).

Vibrating Mode:

In this mode, a probe at the end of a cantilever is vibrated up and down. As the vibrating probe begins to interact with a surface, the vibration amplitude is dampened. The amount of damping is proportional to the amount of force placed on the surface by the probe on each oscillation of the vibrating probe. A feedback loop is used to maintain a fixed vibration amplitude as the probe is scanned across a surface. Forces between the probe and surface in vibrating mode can be as low as a few 10’s of piconewtons.

Phase Imaging:

A phase difference between oscillation of the cantilever and of the signal that drives cantilever oscillation (for example, by a piezoelectric crystal) is measured and visualized in phase imaging.There is no phase contrast when the surface is homogenous, or when there is no interaction between the tip and surface (i.e., the cantilever is well above the surface). However, if specific regions of the surface have distinct mechanical properties, that can be captured with phase imaging. This is because the cantilever loses a different amount of energy as probe taps to surface areas with differing mechanical properties. Hence, phase imaging is helpful to detect variations in mechanical properties such as friction, adhesion, and viscoelasticity on surfaces. It can also be used to detect patterns of various materials such as polymers on the surface or to identify contaminants that cannot be distinguished with topography imaging.

Lateral Force Mode:

In lateral force or frictional force microscopy, lateral deflections of the cantilever, arising due to forces parallel to the plane of the sample surface such as friction force, are measured. This allows detecting inhomogeneities on the material which gives rise to variations in surface friction, or to measure the friction properties of a sample at the nanometer level.

Force-Distance Mode:

A force-distance curve is measured in contact mode. To measure an F/D curve the probe at the end of a cantilever is pushed into the surface of a sample. Once the probe begins to interact with the sample, the cantilever bends. The inbound part of a F/D curve is the deflection of the cantilever when the probe is being pushed into the sample, and the outbound corresponds to when the probe and sample are moving apart.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

On-Site AFM Installation and Training Facilitates Optimal Installation and Function of Your New AFM

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site AFM Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope.

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

• Unpack AFM
• Set up AFM
• Evaluate AFM site for acoustic and structural vibrations
• Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

• Changing samples
• Changing probes
• Aligning the light lever
• Positioning the photodetector
• Selecting resonance (vibrating mode only)
• Tip approach
• Scanning
• Optimizing GPID
• High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about AFM Installation Training, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Advantages of Atomic Force Microscopes in the Pharmaceutical Industry

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) techniques are traditionally used for measuring nanoscale images of samples in the pharmaceutical industry, and these techniques can be costly. The AFM offers an alternative to these traditional imaging techniques by its inherent properties:

• Three-dimensional topography is measured with the AFM, directly revealing surface textures.
• AFM provides nanoscale resolution in surface imaging.
• AFM requires only minimal sample preparation.
• AFM obtains images in ambient air or liquids and does not require large vacuum chambers. This could be critical for testing the effects of an environmental condition to a drug or delineating the behaviour of the sample, such as a cell or a therapeutic, under physiological conditions.
• Images of very smooth, flat materials are readily determined with AFM.
• TheAtomic Force Microscopeis the only imaging technique to provide mechanical information on the surface.
• The cost of acquisition and ownership of an AFM is a fraction of an SEM.

What roles can Atomic Force Microscopes play in the pharmaceutical industry?

• Analysis of crystal structure and growth for drug compounds.
• Characterization of biological materials at the nanoscale.
• Measurement of molecular interaction parameters at a nanometer spatial resolution.
• Obtaining tertiary and quaternary structural information from proteins.
• Evaluation of morphological characteristics of polymers, nanoparticles, and other materials used in drug delivery.
• Quantification of the individual active pharmaceutical ingredient (API)-excipient interaction across different conditions.
• Identification of the surface properties of powdered excipients, colloids, microbiological systems and implants.
• Visualization of homogeneity of dispersions at a molecular level.
• Monitoring structural changes in any living & non-living material.

To learn more about our Atomic Force Microscope Usesand its price,please visit www.afmworkshop.com or call at 1 (888) 671-5539.

An Overview of Atomic Force Microscopy Workshops!

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope. AFMWorkshop offers both domestic (U.S.) and international (all others) packages for AFM installation and training.

International On-Site Installation and Training

For those AFMWorkshop customers outside of the USA electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

On-Site AFM Installation and Training

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop – A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design

AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. . Our newest model, The B AFM, is useful for routine scanning and educational purposes, and our latest model, the HR-AFM AFM has been designed from the ground up for ultra-low noise, highest-possible resolution imaging. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee

AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training

About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education

AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, andengineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

For more details about AFM Workshop Products and its services, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop – Seeking Collaborations with Companies, Development Labs and Educational Institutions

AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for researchers, educators, and engineers.

Excellent training and transparent pricing complement AFMWorkshop’s robust instrumentation.

All instrumentation from the AFM Workshop has an open design that allows customization of the products. Additionally, the AFM Workshop actively seeks collaborations with companies, development labs and educational institutions. Types of collaborations we seek include:

Products for Nanotechnology/AFM Instrumentation: Often in the course of research new features and options are developed. In the event that the product can be produced and sold in reasonable volumes and prices, we are interested in offering the products on our website.

Discount for development of a new product feature: There are many new features that can be added to the AFM Workshop products. We can offer a discount for products if you are able to develop a new feature. The feature can be offered for sale on our website, or shared with other customers on the Forum pages of our website.

Contribute AFM expertise for development of new products: Employees of the AFM Workshop have substantial experience with AFM design and instrumentation. We are willing to share our expertise to help you design new instrumentation or applications.

OEM and VARs: If a company needs an AFM for a product and requires an AFM platform, we can work with you in customizing our instrumentation to your product requirements. Discount on instrumentation are available for volume purchases.

Teaching: If you would like to incorporate our products into your teaching curriculum, we would be delighted to hear your ideas. We may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

For additional information about our products and collaborations, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Atomic Force Microscope for Nanotechnology Research – An Overview!

Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. With noise floors as low as 0.08 nm, AFM Workshop microscopes are fully capable of handling your nanotechnology research needs.

Atomic force microscopes are essential for nanotechnology research requiring the visualization and measurement of nano structures. AFMWorkshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Our instruments are robust and can be used in single-user as well as multi-user laboratories.

AFMWorkshop’s microscopes share a powerful and intuitive user interface that meet the needs of casual as well as advanced AFM operators.

Our Atomic Force Microscopes:
• give great images of nanostructures on both soft and hard materials;
• have an open architecture to facilitate the development of novel instruments;
• are used by customers to create images used in publications;
• include the most common modes.

Publications
Throughout the world, AFMWorkshop products are used every day for nanotechnology research projects in both life and physical sciences. While AFMWorkshop products were introduced to the market in late 2010, we already have a growing list of publications by successful AFMWorkshop customers. (It typically takes several years for customers to produce publications based on research generated by a new AFM.) To view a list of publications referencing AFMWorkshop products, click here.

Scanned Samples
All types of samples are scanned with AFMWorkshop atomic force microscopes, such as patterned surfaces, materials, and life science samples. Many more AFM images from AFMWorkshop atomic force microscopes can be viewed in our AFM Image Gallery.

Samples Screening
AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes already dedicated to specialized experiments. Routine and repetitive scanning of not particularly challenging samples can be completed without losing valuable time to readjusting the dedicated and more expensive instruments. Additionally, students and researchers can prepare themselves for operating higher-end microscopes by first learning to operate and master the TT-AFM.

Advanced Features of AFMWorkshop Products

High Resolution Scanning
with a Z noise floor of 0.08 nm, the TT-AFM is capable of high-resolution scanning on samples such as DNA, nanoparticles and nanotubes. To ensure optimal performance, our technical staff can provide pre-sales evaluation of your proposed AFM installation location
Expandable architecture
Our product line is expandable with many features offered as upgrades that can be purchased after your initial purchase. We uniquely offer several stage options that may be purchased for the same SPM Control Station.

Modes
Our products are offered with standard modes such as vibrating, and non-vibrating topography modes as well as phase mode and LFM. Additional modes such as C-AFM, lithography, MFM, and F/D are available as options for all of our products. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Atomic Force Microscopy Services Offered By Afm workshop

Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

Customer Support and Technical Service
AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry / Process Development & Process Control; and Research / Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Custom Engineering of Atomic Force Microscopes
AFMWorkshop’s open architecture allows the ultimate in flexibility and customization. We will work with you to make your instrumentation and application ideas a reality.

Instrumentation from the AFMWorkshop has an open design that allows customization of the products by its users.

Atomic Force Microscopes for OEMs
AFMWorkshop actively partners with OEMs. If your company needs an Atomic Force Microscope for a product and requires an AFM platform, we will work with you in customizing our instrumentation to your product requirements. Discounts on AFM instrumentation are available for volume purchases.

AFM Workshop Customers Area
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Need assistance?

Contact AFMWorkshop to inquire about atomic force microscope information and pricing, training, application help, customer support and technical service. Our customer service will assist with choosing the right atomic force microscope for your application needs, providing any documentation or help you may need to secure funding, as well as troubleshoot over the phone, by email, and by remote-viewing on the AFM computer. Our success is your success, so please don’t hesitate to contact us today.

To learn more about atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.