Tag: Atomic Force Microscopy Companies

Advantages of Atomic Force Microscopes in the Pharmaceutical Industry

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) techniques are traditionally used for measuring nanoscale images of samples in the pharmaceutical industry, and these techniques can be costly. The AFM offers an alternative to these traditional imaging techniques by its inherent properties:

• Three-dimensional topography is measured with the AFM, directly revealing surface textures.
• AFM provides nanoscale resolution in surface imaging.
• AFM requires only minimal sample preparation.
• AFM obtains images in ambient air or liquids and does not require large vacuum chambers. This could be critical for testing the effects of an environmental condition to a drug or delineating the behaviour of the sample, such as a cell or a therapeutic, under physiological conditions.
• Images of very smooth, flat materials are readily determined with AFM.
• TheAtomic Force Microscopeis the only imaging technique to provide mechanical information on the surface.
• The cost of acquisition and ownership of an AFM is a fraction of an SEM.

What roles can Atomic Force Microscopes play in the pharmaceutical industry?

• Analysis of crystal structure and growth for drug compounds.
• Characterization of biological materials at the nanoscale.
• Measurement of molecular interaction parameters at a nanometer spatial resolution.
• Obtaining tertiary and quaternary structural information from proteins.
• Evaluation of morphological characteristics of polymers, nanoparticles, and other materials used in drug delivery.
• Quantification of the individual active pharmaceutical ingredient (API)-excipient interaction across different conditions.
• Identification of the surface properties of powdered excipients, colloids, microbiological systems and implants.
• Visualization of homogeneity of dispersions at a molecular level.
• Monitoring structural changes in any living & non-living material.

To learn more about our Atomic Force Microscope Usesand its price,please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Atomic Force Microscopes: An Ideal Tool For Instrument Innovators

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument. TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics. Because the software is written in LabVIEW, it can be easily modified to meet very specific demands.

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Additionally, National Instrument Data Acquisition Cards can be integrated into the TT-2 AFM to create a customized experiment.

Instrument Innovators are no longer faced with the decision to either create an entirely new AFM, or to live with the limitations of commercial AFMs that have limited documentation and a closed architecture. An engineering documentation package is available as an option to TT-2 AFM customers.

Mechanical Drawings

All the drawings for mechanical parts used to build a TT-2 AFM were created in AutoCAD and are included in the optional documentation package. If you require a .dwg file for a specific part in the TT-2 AFM, AFMWorkshop will provide it to you. Additionally, single parts in the microscope can be purchased if you need to modify a part for your needs. Each part is identified by part numbers on each mechanical drawing.

Software

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The TT-2 AFM includes a VI that can be modified for specific needs. The instrument control protocol for addressing functions such as Z feedback, XY scanning and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

Electronics

Direct access to TT-2 AFM electronics signals may be gained from a 50 pin ribbon cable at the rear of the TT-2 AFM EBox, or from the mode connector at the front of the microscope stage. For developers who want even more access, the technical guide includes schematics to all electronics in the TT-2 AFM, including: photodetector board, piezo electric control board, controller main board, and even the power supply board. There are several pinned signal access points on the main controller board.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

AFMWorkshop Atomic Force Microscope Probes

Where Atomic Force Microscopy Probes are used? Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force-distance scanning.

AFMWorkshop offers AFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

ACLA AFM Probes

ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact) applications. Compatible with most commercially available SPMs/AFMs, ACLA probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities. This is a box of 10 probes.

SHOCONA Probes

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

For a more in-depth understanding of how AFM probes work, as well as some helpful AFM tips and pointers, you can get in touch with experts of AFMWorkshop. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy. They provide a closer look at their AFMs, including full demonstrations, introductory AFM videos and more.

AFMWorkshop designed the free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM technology and how an Atomic Force Microscope works. They offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

  • One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
  • The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
  • Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
  • Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
  • The stage can hold many smaller samples that may then be imaged in a specific order.
  • Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
  • NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.

Applications of Atomic Force Microscopy

For visualizing nanostructures and making measurements at the nano scale, atomic force microscopes (AFM) are an essential tool. AFMs are routinely used by scientists and researchers throughout the world to visualize surface structure and to make dimensional measurements.

Atomic Force Microscopes have a wide range of applications in physical sciences, life sciences and all disciplines of engineering. Here are a few of the common applications for atomic force microscopes:

Nanotechnology

Nanotechnology is an almagum of all disciplines of science and engineering, Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments.  Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and more.

Life Sciences

AFMs are effective tool for scanning biological samples that are not possible to scan with any other type of microscope. Biomaterials, cells, and other soft samples can be scanned by AFMs in ambient air as well as liquids.  Besides measuring 3-D images an afm can measure parameters including stiffness and adhesion.

Process Development/Control

Atomic force microscope is finding acceptance for evaluating samples for process development, and to control a process. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips. AFM measurements used in process control are typically made repetitively.

Instrument Innovation

Atomic force microscopes are ideal for instrument builders and engineers. They can be used as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument such as a mass spectrometer, nanoindenter, and IR spectrometer.

Nanoparticles

Atomic force microscopy can be used for Nanoparticle characterization. Often with an AFM information is gained that cannot be measured with dynamic light scattering, electron microscopy, and other optical characterization methods. AFM allows 3D characterization of nanoparticles with sub-nanometer resolution.

Photonics

AFMs are ideal for the analysis of materials used in the photonics industry. Thus, it offers substantially better horizontal and vertical resolution than optical and stylus profilers.

Polymer Characterization

Atomic force microscopy is an ideal method for imaging polymers, imaging polymers blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM gives better resolution than optical microscopy and unlike in a scanning electron microscope, an AFM does not require coating the sample before imaging.

If you want to learn more about Atomic Force Microscopes (AFMs) applications or AFMWorkshop products, contact AFMWorkshop or one of our distribution partners. For more information, please visit https://www.afmworkshop.com.