LS-AFM for Life Science Applications

The LS- Atomic Force Microscope is designed specifically for life science applications when paired with an inverted optical microscope. This tip-scanning atomic force microscope includes everything required for AFM scanning: AFM stage, inverted optical microscope adaptation plate, EBox, manuals, cables, and AFM-Control Software.

Have a look at some of the features of LS-AFM:

A turnkey system with guaranteed results
No additional sample holding options required for most applications
Readily scan samples in ambient air and liquids
Zoom to feature with accurate positioning for F/D curves
Readily adaptable to new operating systems
Reduce time for probe exchange (& use any manufacturer’s probes)
Facilitates tip approach and laser alignment
Most common scanning modes included for life sciences applications

When an inverted optical microscope is required for locating cells or other bio-materials on a surface, the LS-AFM has a sample positoiner for glass slides and petri dishes. The LS-AFM can be purchased with the AFMWorkshop inverted optical microscope or it can be retrofitted to almost any inverted optical microscope.

LS-AFM APPLICATIONS

Measure the Stiffness of Biomaterials

LS-AFM can be used to monitor the deflection of a cantilever as it is pushed against sample resulting in a force/distance curve. From the force-distance curve, many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

Imaging Cells

Images of cells are easily scanned in both a liquid and dry environment with the LS-AFM. The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning.

The LS-AFM is a nanoscience instrument that‌ ‌may be purchased in two different configurations:

LS-AFM-A

In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

LS-AFM-B

This configuration of the LS-AFM includes a fully-featured inverted optical microscope.

Do you want to buy LS-AFMs? If yes, buy top quality LS-AFMs from AFMWorkshop. To learn more about the LS-AFM, feel free to visit https://www.afmworkshop.com.

How to Make Measurements on Biological Samples

When it comes to making measurements on biological samples at the nanoscale, Atomic force microscopes are used. In both ambient atmospheric conditions as well as liquid environments, AFM allows the nanoscale imaging of soft biomaterials including cells and DNA.

Have a look at the biology applications, unique to atomic force microscopes:

Double-stranded DNA Molecules

Imaging of DNA of size 5 µm x 5 µm can be done easily. Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

Imaging of Tobacco Mosaic Virus is commonly carried out in structural studies. Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces and placement of the microscope in an environment with minimal structural and acoustic vibrations. Furthermore, TMV is commonly used as an imaging standard since it has a highly conserved structure.

Parasites

Parasites of size 25 µm x 25µm can be measured in the air using AFM. These Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Epitheleal cell of size 32 µm x 32 µm can be measured in liquid using Atomic Force Microscope. Measurement of high-resolution images of cells in a liquid (e.g., under physiological conditions) is another possibility unique to AFM and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Recommended AFM products for life sciences applications are TT-2 Atomic Force Microscope and LS-Atomic Force Microscope. To buy high-quality Atomic Force Microscope, feel free to visit https://www.afmworkshop.com/.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
The stage can hold many smaller samples that may then be imaged in a specific order.
Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.

Education and Training With AFMWorkshop AFMs

Atomic Force Microscopes facilitate nanotechnology developments in all disciplines of science and engineering. There is an extensive and growing demand by students and professionals for AFM education and training.

Here are three types of students that AFMWorkshop products can be used for educating:

Exposure to the Nano World

Educators want to expose students to an atomic force microscope by showing them what an AFM looks like and how AFM operates. Most of the students learn that it is feasible to produce a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

Educators focused on training students to operate the AFM and to use the instrument for measuring images of several types of samples. Students are shown the basic Atomic Force Microscope operation, including how the feedback control works and how the instrument scans. This educational experience helps students that want to operate AFM instruments in industrial and research environments. This training can last from one week to an entire semester.

Career Options in AFM Design and Service

Educators focus to prepare students for a career in instrumentation design or instrument customer service. This is accomplished by helping students learn the design and construction of an Atomic Force Microscope. This includes an additional category of researchers who intend to repair or modify their own instruments. Students build their own AFMs and learn how to measure images on standard reference samples. A one-week intensive 40-hour course of AFMs can accomplish the objective of this group.

Are you looking for top quality atomic force microscope? If so, get in touch with AFMWorkshop. AFMWorkshop guarantees their AFMs will run your application, and their customer service is always available to assist.

AFMWorkshop has experience of many years in manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and used in a wide variety of applications.

For more information, feel free to visit https://www.afmworkshop.com.

All the Basics You Need to Know About Standalone AFM

For scanning all sizes and shapes of samples, SA-AFM is a flexible AFM. It is easy to integrate SA with inverted microscopes. SA-AFM is affordable and complete Atomic Force Microscopy system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research.

Why use SA-AFM?

There are many benefits of using SA-AFM and some of them are given below:

Any sized sample can be scanned due to open frame design
Allows scanning small samples as it includes a bottom plate
Reduce time for probe exchange as probe exchange tool is included
Facilitates tip approach and laser alignment as it includes top view video microscope
Most common scanning modes included for many applications including vibrating, non-vibrating, phase, LFM, and advanced F/D
Can be used with most commercially available probes due to the flexible sample holder
Readily adaptable to new operating systems due to Labview software with USB communication

All standard scanning modes are included with the system using the industry standard light lever force sensor. While non-vibrating mode can be used for routine scanning, the vibrating mode is used for high resolution and soft samples.

The control software of SA-AFM is written in LabVIEW making it simple and intuitive to use and operate. Differing windows walk users through the process: a scanning window aids in acquiring images, a force position window measures force distance curves, a pre-scan window helps align the AFM probe, and finally, a system window assists in altering system parameters.

The SA-AFM is an ideal instrument for modes measurements, along with measuring the surface structure. If you want to use the SA-AFM System for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research, then get in touch with AFMWorkshop.

AFMWorkshop’s SA-AFM is a complete Atomic Force Microscopy (AFM) system and includes everything required for scanning all sizes and shapes of samples. To learn more, feel free to visit https://www.afmworkshop.com.

Different Types of Atomic Force Microscopes

As common these days, science has become increasingly reliant on Atomic Force Microscope (AFM). With help of AFM, researchers are focusing on the tiny particles that help to conduct research on misfolding diseases such as diabetes and tuberculosis. There are many achievements and progresses achieved by these microscopes. Some of the reliable Atomic Force Microscopes include:

B-AFM

The B-AFM is a complete system for routine scanning and education. B-AFM includes a computer with software, control electronics, and a stage; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage.

The B-AFM has everything you need to perform routine scanning on a variety of samples for scientists and engineers with bigger ideas. Due to an intuitive design, this nanoscience instrument is ideal for education. The Basic Atomic Force Microscope is built with high quality material and it is the best option for scientists looking for routine sample scanning.

TT-2 AFM

TT-2 AFM is a second-generation tabletop Atomic Force Microscope and has all the important features and benefits expected from a light lever AFM.

TT-2 AFM can be used in many different fields. The Nanotechnology engineers/researchers, those want to do routine scanning of nano-structures can use the TT-2 AFM. Instrument innovators can use AFM as a platform to create a new instrument and educators can teach students about AFM construction, operation, and applications.

The TT-2 AFM Stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

NP-AFM

The NP-AFM is a nano-profiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

The NP-Atomic Force Microscope is a complete nano-profiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.

LS-AFM

When an inverted optical microscope is required for locating cells or other biomaterials on a surface, the LS-AFM is used in life sciences applications. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Once the LS-AFM is paired with an inverted optical microscope, it becomes tip-scanning atomic force microscope designed specifically for life science applications. This product includes everything required for AFM scanning: AFM stage, cables, inverted optical microscope adaptation plate, EBox, manuals, and AFM-Control Software.

SA-AFM

For large samples and industry, the Standalone AFM is a flexible AFM for scanning all sizes and shapes of samples. It can be easily integrated with all manufacturers’ inverted microscopes.

To buy high-value atomic force microscopes, you can choose AFMWorkshop, renowned atomic force microscope manufacturers. They offer a wide variety of Atomic Force Microscopes (AFM’s) to suit your research needs. For more information, feel free to visit https://www.afmworkshop.com.

Applications of Atomic Force Microscopy

For visualizing nanostructures and making measurements at the nano scale, atomic force microscopes (AFM) are an essential tool. AFMs are routinely used by scientists and researchers throughout the world to visualize surface structure and to make dimensional measurements.

Atomic Force Microscopes have a wide range of applications in physical sciences, life sciences and all disciplines of engineering. Here are a few of the common applications for atomic force microscopes:

Nanotechnology

Nanotechnology is an almagum of all disciplines of science and engineering, Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments. Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and more.

Life Sciences

AFMs are effective tool for scanning biological samples that are not possible to scan with any other type of microscope. Biomaterials, cells, and other soft samples can be scanned by AFMs in ambient air as well as liquids. Besides measuring 3-D images an afm can measure parameters including stiffness and adhesion.

Process Development/Control

Atomic force microscope is finding acceptance for evaluating samples for process development, and to control a process. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips. AFM measurements used in process control are typically made repetitively.

Instrument Innovation

Atomic force microscopes are ideal for instrument builders and engineers. They can be used as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument such as a mass spectrometer, nanoindenter, and IR spectrometer.

Nanoparticles

Atomic force microscopy can be used for Nanoparticle characterization. Often with an AFM information is gained that cannot be measured with dynamic light scattering, electron microscopy, and other optical characterization methods. AFM allows 3D characterization of nanoparticles with sub-nanometer resolution.

Photonics

AFMs are ideal for the analysis of materials used in the photonics industry. Thus, it offers substantially better horizontal and vertical resolution than optical and stylus profilers.

Polymer Characterization

Atomic force microscopy is an ideal method for imaging polymers, imaging polymers blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM gives better resolution than optical microscopy and unlike in a scanning electron microscope, an AFM does not require coating the sample before imaging.

If you want to learn more about Atomic Force Microscopes (AFMs) applications or AFMWorkshop products, contact AFMWorkshop or one of our distribution partners. For more information, please visit https://www.afmworkshop.com.