High Resolution Atomic Force Microscope – Advanced Yet Affordable AFM for Researchers

The HR AFM is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. It is ideal for researchers that need to visualize and measure nanometer or sub-nanometer sized surface features.

Key Features and Benefits of the HR AFM

Low Noise Floor

With a noise floor of 35 picometers, the HR Atomic Force Microscope is capable of measuring samples with features from nano-meters to microns.

Kinematic Tip Approach

A stable kinematic design for probe approach is used in the HR AFM. An optional direct drive approach is available.

Research Grade Top View Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software

The HR AFM uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the HR AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Large Light Lever Adjustment Range

Because the HR AFM has a large adjustment range of the laser and photodetector, probes from all major manufacturers can be used.

Side View Optic

Directly view the tip to surface distance with the side view optic.

Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with flexible scanning software developed in Lab VIEW.

To learn more about AFMWorkshop and our Atomic Force Microscope’s Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Has Developed A Reputation of Being the Leading Manufacturer for High-Value Atomic Force Microscopes

We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For ultimate performance, our HR-AFM is highly stable with ultra-low noise levels. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. The B AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Offers Matchless Customer Support and Technical Service to Its AFM Users

AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry/Process Development & Process Control; and Research/ Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Due to AFMWorkshop’s world-class AFM training program, our customers can usually troubleshoot and service their own AFMs. However, in the event that additional support is needed, AFMWorkshops’ Service Engineers are ready to help. We provide technical service via phone, email, live web training, remote internet access and operation of customer instruments, and on-site servicing.

All AFMWorkshop instruments come with a robust one-year warranty. As of April 1, 2016, North American customers receive a Two-Year Warranty with the purchase of their new AFM from AFMWorkshop. Extended time service contracts are also available for purchase.

AFMWorkshop provides the finest Customer Support and Technical Service. We are distinguished in the field of Atomic Force Microscopes by our 100% commitment to the scientists, educators and nanotechnology researchers using our products. With more than 30 years of experience designing and using AFM, STM & SPM technology, we’ve met thousands of users who’ve shared their collective frustrations with the typical neglect or wait times involved in service and support from most instrument companies. We strive to turn this collective frustration into a historical artifact.

AFMWorkshop has changed the paradigm for AFM instrument design, pricing and service. Our transparency and user-orientation means AFMWorkshop customers learn the intricacies and successful operation of their instruments and can produce world-class images.

To learn more about our Atomic Force Microscopy Services, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM

The atomic force microscopy curriculum is an introduction to the instrumentation of atomic force microscopes, including theory, design, and operation. Standard AFM scanning modes are covered including vibrating and non-vibrating modes.

This comprehensive all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes that will be used in the labs: contact mode, tapping mode, and force spectroscopy.

Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing, using the freeware package Gwyddion, is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and then the Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM.

Analysis/questions for further discussion for each individual laboratory (the answers are provided in the accompanying Teacher Manual). Aside from the AFM instrument, no other material or parts are necessary!

Objectives

• Learn the basic operating principles behind atomic force microscopy.
• Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.
• Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.
• Conduct basic analysis on images, including statistics and cross-sectional measurements.

Undergraduates

This curriculum has been developed for undergraduate students in any science or engineering background: biology, chemistry, physics, materials science, mechanical engineering materials engineering, etc. Familiarity with freshman level mathematics and physics concepts is assumed, but all concepts and theory related to atomic force microscopy are explained.

Student Guide

30-page curriculum for students – Covers the background of advanced AFM operation, modes, and application. It then goes through a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.

Teacher Manual

Accompanying Teacher Manual–This accompaniment to the student guide assists teacher/teaching assistant to help students through labs. It includes answers to the pre-lab quiz and detailed answers with sample images to all the suggested analysis questions.

AFM Sample Kit

Samples – A series of 4 prepared and mounted samples which are supplied ready to be inserted into the AFM instrument. The student guide curriculum guides the students through experiments on these samples.

AFM Probe Kit

Probes – A series of 8 probes of different spring constants to be used in the curriculum.

Labs include:
• Measuring Roughness of Thin Films
• Measuring Compositional Heterogeneity of Everyday Materials
• Metrological Measurements
• Probing Mechanical Properties of a Sample

To learn more, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

AFM Webinars and How They Help Gain the Best Performance from Your Atomic Force Microscopes

Atomic force microscope webinars are pre-recorded video sessions with our AFM Experts, covering a range of topics from image processing and sample preparation to advantages and disadvantages of AFM. Learn how to gain the best performance from your atomic force microscope with instructional videos on the best operating practices and techniques of AFM.

AFM Image Processing

Getting the most from your AFM requires effective utilization of image processing software. This video recording of a live-streaming seminar covers how to level images, display images, and analyze images with AFM image processing software. The demonstration will utilize Gwyddion’s open source software.

AFM Sample Preparation

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this video recording from a live-streaming seminar.

Artifacts in AFM Images

An inability to detect artifacts vs. actual sample featurescan undermine the validity of your research. This AFM video seminar reviews the most common artifact issues and their sources.

AFM Probe Selection

AFM operators must choose from a wide array of probe types when scanning samples. This video recording from a live-streaming AFM seminar covers the probe types that work best for varying types of samples.

AFM Performance Vs. Price

AFMWorkshop is the only Atomic Force Microscopy company offering a complete product line of AFMs that balance performance with price. This seminar reviews AFMWorkshop’s high-value product line and includes a demonstration.

TT-AFM Demonstration

Live-streaming demonstration of the TT-AFM, a popular and versatile atomic force microscope for researchers, educators, and engineers. This 40-minute demonstration highlights the TT-AFM’s wide variety of functions and applications. With a sale price starting at $32,275, the TT-AFM’s quality and success in research and business applications is unparalleled within atomic force microscopy.

AFMWorkshop designed these free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM Technology and how an Atomic Force Microscope works. We offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Image Logger for TT-2 Atomic Force Microscope – An overview!

The Image Logger for the TT-2 AFM features the ability to view forward and reverse images for six channels, display real time oscilloscope-data logger for 6 channels and visualize the spectrum of the 6 data channels.

Image Logger Features

• View forward and reverse images for six channels
• Display real time oscilloscope-data logger for 6 channels
• Visualize the spectrum of the 6 data channels

A great advantage of an atomic force microscope is that it can capture several types of images. Each type of image reveals critical information about the surface topography or physical parameters.

Software

It is possible to display up to six channels from the Z feedback control loop in an atomic force microscope. These include:

• Z Error
• Z Drive (topography)
• Z Sensor
• Phase
• L-R (friction)
• Amplitude

Additionally, these channels may be displayed in the forward and reverse scan directions. With the data logger it is possible to display all six channels of data in the forward and reverse direction. This capability allows real time visualization of all channels.

Image Logger

The image logger simultaneously displays six image channels in forward and reverse directions. During scanning, the palettes and the histogram can be updated. Once a scan is completed, all twelve channel imagescan be saved.

Real Time Oscilloscope

Software for Focus Assist is integrated with the AFMControl software used on the TT-2 AFM. Using the software is easy. Simply focus the optical microscope on the probe, and then on the sample. Once this registration is completed, you can use the software to move directly to the sample, to the probe, or you can even have the optic follow the probe during probe approach.

Spectrum Analyzer

The spectrum of one input data channels can be displayed. Several types of windows and averaging algorithms may be applied to the incoming data stream. Identifying sources of unwanted vibrationsis possible with the spectrum analyser function.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

15 Micron Atomic Force Microscope Scanner for High-Resolution Scans

The 15-micron scanner is interchangeable with the 50-micron or 100-micron scanner in the TT-2 AFM or HR-AFM. Extremely high-resolution scans are made with the 15-micron scanner.

Description
The PS-2010, PS-2011 and PS-2019 piezoelectric scanners are designed for use with the AFMWorkshop TT-2 and HR-AFM Atomic Force Microscopes, and scan samples in the X, Y, and Z-axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y-axis. The PS-2010 and PS-2019 have temperature compensated strain gauges in the Z-axis, while the PS-2011 does not.All scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1, in the 100 µm scanner it’s 10:1 and in the 15 µm scanner, it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20-pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm, 50 µmand the 100µm scanners are interchangeable. The scanners are removed from the TT-2 AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20-pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with another scanner. The 15 µm scanner is our recommendation for highest resolution scanning and lowest noise on the TT2-AFM and HR-AFM.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan, and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

High-Resolution Atomic Force Microscope – The New Standard for Affordable Research!

The HR AFM is an Advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. It is ideal for researchers that need to visualize and measure nanometer or sub-nano meter-sized surface features. Besides this, it has many other features, keep on reading to learn more.

Key Features and Benefits of the HR AFM

Low Noise Floor

With a noise floor of 35 picometers, the High-Resolution Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.

Kinematic Tip Approach

A stable kinematic design for the probe approach is used in the HR AFM. An optional direct drive approach is available.

Research Grade Top View Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The HR AFM uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the HR AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range

Because the HR AFM has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Side View Optic

Directly view the tip surface distance with the side view optic.

Applications for the HR AFM include imaging:

• Nanstructures (carbon nanotubes)
• Biomolecules (DNA)
• 2-D Materials
• Nanoroughness measurements
• Nanoparticles

With a noise floor of <35 picometers, the HR AFM is the optimal product for researchers that need an affordable AFM but can’t compromise on performance.

AFMWorkshophas extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. We are the only company in the world that offers affordable AFMs for a wide range of customers and applications. With over 300 installed units, we are your trusted partner. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Standalone AFM- Flexible Enough to Scan All Sizes and Shapes of Samples

Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning almost any size and shape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has a linearized XY scan range of 40 microns, and two different Z ceramics: a 7-micron high resolution Z scanner, and a large motion 17-micron Z scanner.

Advanced Features of the SA-AFM Include:
• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Standalone AFM- Flexible Enough to Scan All Sizes and Shapes of Samples

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Advanced Features of the SA-AFM Include:

• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.