Tag: Atomic Force Microscope

Different Types of Atomic Force Microscopes

As common these days, science has become increasingly reliant on Atomic Force Microscope (AFM). With help of AFM, researchers are focusing on the tiny particles that help to conduct research on misfolding diseases such as diabetes and tuberculosis. There are many achievements and progresses achieved by these microscopes. Some of the reliable Atomic Force Microscopes include:

 B-AFM

The B-AFM is a complete system for routine scanning and education. B-AFM includes a computer with software, control electronics, and a stage; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. 

The B-AFM has everything you need to perform routine scanning on a variety of samples for scientists and engineers with bigger ideas. Due to an intuitive design, this nanoscience instrument is ideal for education. The Basic Atomic Force Microscope is built with high quality material and it is the best option for scientists looking for routine sample scanning.

TT-2 AFM

TT-2 AFM is a second-generation tabletop Atomic Force Microscope and has all the important features and benefits expected from a light lever AFM. 

TT-2 AFM can be used in many different fields. The Nanotechnology engineers/researchers, those want to do routine scanning of nano-structures can use the TT-2 AFM. Instrument innovators can use AFM as a platform to create a new instrument and educators can teach students about AFM construction, operation, and applications. 

The TT-2 AFM Stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

NP-AFM

The NP-AFM is a nano-profiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

The NP-Atomic Force Microscope is a complete nano-profiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.

LS-AFM

When an inverted optical microscope is required for locating cells or other biomaterials on a surface, the LS-AFM is used in life sciences applications. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Once the LS-AFM is paired with an inverted optical microscope, it becomes tip-scanning atomic force microscope designed specifically for life science applications. This product includes everything required for AFM scanning: AFM stage, cables, inverted optical microscope adaptation plate, EBox, manuals, and AFM-Control Software. 

SA-AFM

For large samples and industry, the Standalone AFM is a flexible AFM for scanning all sizes and shapes of samples. It can be easily integrated with all manufacturers’ inverted microscopes.

To buy high-value atomic force microscopes, you can choose AFMWorkshop, renowned atomic force microscope manufacturers. They offer a wide variety of Atomic Force Microscopes (AFM’s) to suit your research needs. For more information, feel free to visit https://www.afmworkshop.com.


Applications of Atomic Force Microscopy

For visualizing nanostructures and making measurements at the nano scale, atomic force microscopes (AFM) are an essential tool. AFMs are routinely used by scientists and researchers throughout the world to visualize surface structure and to make dimensional measurements.

Atomic Force Microscopes have a wide range of applications in physical sciences, life sciences and all disciplines of engineering. Here are a few of the common applications for atomic force microscopes:

Nanotechnology

Nanotechnology is an almagum of all disciplines of science and engineering, Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments.  Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and more.

Life Sciences

AFMs are effective tool for scanning biological samples that are not possible to scan with any other type of microscope. Biomaterials, cells, and other soft samples can be scanned by AFMs in ambient air as well as liquids.  Besides measuring 3-D images an afm can measure parameters including stiffness and adhesion.

Process Development/Control

Atomic force microscope is finding acceptance for evaluating samples for process development, and to control a process. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips. AFM measurements used in process control are typically made repetitively.

Instrument Innovation

Atomic force microscopes are ideal for instrument builders and engineers. They can be used as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument such as a mass spectrometer, nanoindenter, and IR spectrometer.

Nanoparticles

Atomic force microscopy can be used for Nanoparticle characterization. Often with an AFM information is gained that cannot be measured with dynamic light scattering, electron microscopy, and other optical characterization methods. AFM allows 3D characterization of nanoparticles with sub-nanometer resolution.

Photonics

AFMs are ideal for the analysis of materials used in the photonics industry. Thus, it offers substantially better horizontal and vertical resolution than optical and stylus profilers.

Polymer Characterization

Atomic force microscopy is an ideal method for imaging polymers, imaging polymers blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM gives better resolution than optical microscopy and unlike in a scanning electron microscope, an AFM does not require coating the sample before imaging.

If you want to learn more about Atomic Force Microscopes (AFMs) applications or AFMWorkshop products, contact AFMWorkshop or one of our distribution partners. For more information, please visit https://www.afmworkshop.com.