Advantages of Atomic Force Microscopes in the Pharmaceutical Industry

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) techniques are traditionally used for measuring nanoscale images of samples in the pharmaceutical industry, and these techniques can be costly. The AFM offers an alternative to these traditional imaging techniques by its inherent properties:

• Three-dimensional topography is measured with the AFM, directly revealing surface textures.
• AFM provides nanoscale resolution in surface imaging.
• AFM requires only minimal sample preparation.
• AFM obtains images in ambient air or liquids and does not require large vacuum chambers. This could be critical for testing the effects of an environmental condition to a drug or delineating the behaviour of the sample, such as a cell or a therapeutic, under physiological conditions.
• Images of very smooth, flat materials are readily determined with AFM.
• TheAtomic Force Microscopeis the only imaging technique to provide mechanical information on the surface.
• The cost of acquisition and ownership of an AFM is a fraction of an SEM.

What roles can Atomic Force Microscopes play in the pharmaceutical industry?

• Analysis of crystal structure and growth for drug compounds.
• Characterization of biological materials at the nanoscale.
• Measurement of molecular interaction parameters at a nanometer spatial resolution.
• Obtaining tertiary and quaternary structural information from proteins.
• Evaluation of morphological characteristics of polymers, nanoparticles, and other materials used in drug delivery.
• Quantification of the individual active pharmaceutical ingredient (API)-excipient interaction across different conditions.
• Identification of the surface properties of powdered excipients, colloids, microbiological systems and implants.
• Visualization of homogeneity of dispersions at a molecular level.
• Monitoring structural changes in any living & non-living material.

To learn more about our Atomic Force Microscope Usesand its price,please visit www.afmworkshop.com or call at 1 (888) 671-5539.

An Overview of Atomic Force Microscopy Workshops!

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope. AFMWorkshop offers both domestic (U.S.) and international (all others) packages for AFM installation and training.

International On-Site Installation and Training

For those AFMWorkshop customers outside of the USA electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

On-Site AFM Installation and Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Vibration Solutions – For High-Resolution Scanning!!

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause blurred or noisy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshophas designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Our Vibration Isolation Solutions filter out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A moderate structural vibration isolation is possible with the Passive Vibration Table. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Vibration Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations, and then electromechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee Option is that the Vibration Table top is more stable and more compact than a platform suspended with bungee cords.

Bungee Option

Placing the AFM on a platform suspended by bungee cords offers one of the best structural isolation platforms possible. Further, the Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations. The Bungee Options is designed to be used with the Acoustic Enclosure (AC-7859) Included with the option are a platform, and bungee cords, as well as associated metal support hooks.

Vibration Cabinet

The Acoustic chamber reduces vibrations transmitted through air. The enclosure is constructed from 3/4” HDPE and has 1” acoustic foam on its interior surfaces.

At the rear of the chamber is a sealed passage for wires and cables. The door of the chamber can be configured to open to the left or to the right.

On optional support table is available for the acoustic chamber. The optional support table has an opening at its back side that is 20.5”. The AFM system EBox can be stored inside the support table.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. AFMWorkshop can fabricate acoustic enclosures of almost any size and shape.

To learn more, feel free to visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop – A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design

AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. . Our newest model, The B AFM, is useful for routine scanning and educational purposes, and our latest model, the HR-AFM AFM has been designed from the ground up for ultra-low noise, highest-possible resolution imaging. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee

AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training

About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education

AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, andengineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

For more details about AFM Workshop Products and its services, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop – Seeking Collaborations with Companies, Development Labs and Educational Institutions

AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for researchers, educators, and engineers.

Excellent training and transparent pricing complement AFMWorkshop’s robust instrumentation.

All instrumentation from the AFM Workshop has an open design that allows customization of the products. Additionally, the AFM Workshop actively seeks collaborations with companies, development labs and educational institutions. Types of collaborations we seek include:

Products for Nanotechnology/AFM Instrumentation: Often in the course of research new features and options are developed. In the event that the product can be produced and sold in reasonable volumes and prices, we are interested in offering the products on our website.

Discount for development of a new product feature: There are many new features that can be added to the AFM Workshop products. We can offer a discount for products if you are able to develop a new feature. The feature can be offered for sale on our website, or shared with other customers on the Forum pages of our website.

Contribute AFM expertise for development of new products: Employees of the AFM Workshop have substantial experience with AFM design and instrumentation. We are willing to share our expertise to help you design new instrumentation or applications.

OEM and VARs: If a company needs an AFM for a product and requires an AFM platform, we can work with you in customizing our instrumentation to your product requirements. Discount on instrumentation are available for volume purchases.

Teaching: If you would like to incorporate our products into your teaching curriculum, we would be delighted to hear your ideas. We may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

For additional information about our products and collaborations, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFM Webinars and How They Help Gain the Best Performance from Your Atomic Force Microscopes

Atomic force microscope webinars are pre-recorded video sessions with our AFM Experts, covering a range of topics from image processing and sample preparation to advantages and disadvantages of AFM. Learn how to gain the best performance from your atomic force microscope with instructional videos on the best operating practices and techniques of AFM.

AFM Image Processing

Getting the most from your AFM requires effective utilization of image processing software. This video recording of a live-streaming seminar covers how to level images, display images, and analyze images with AFM image processing software. The demonstration will utilize Gwyddion’s open source software.

AFM Sample Preparation

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this video recording from a live-streaming seminar.

Artifacts in AFM Images

An inability to detect artifacts vs. actual sample featurescan undermine the validity of your research. This AFM video seminar reviews the most common artifact issues and their sources.

AFM Probe Selection

AFM operators must choose from a wide array of probe types when scanning samples. This video recording from a live-streaming AFM seminar covers the probe types that work best for varying types of samples.

AFM Performance Vs. Price

AFMWorkshop is the only Atomic Force Microscopy company offering a complete product line of AFMs that balance performance with price. This seminar reviews AFMWorkshop’s high-value product line and includes a demonstration.

TT-AFM Demonstration

Live-streaming demonstration of the TT-AFM, a popular and versatile atomic force microscope for researchers, educators, and engineers. This 40-minute demonstration highlights the TT-AFM’s wide variety of functions and applications. With a sale price starting at $32,275, the TT-AFM’s quality and success in research and business applications is unparalleled within atomic force microscopy.

AFMWorkshop designed these free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM Technology and how an Atomic Force Microscope works. We offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Image Logger for TT-2 Atomic Force Microscope – An overview!

The Image Logger for the TT-2 AFM features the ability to view forward and reverse images for six channels, display real time oscilloscope-data logger for 6 channels and visualize the spectrum of the 6 data channels.

Image Logger Features

• View forward and reverse images for six channels
• Display real time oscilloscope-data logger for 6 channels
• Visualize the spectrum of the 6 data channels

A great advantage of an atomic force microscope is that it can capture several types of images. Each type of image reveals critical information about the surface topography or physical parameters.

Software

It is possible to display up to six channels from the Z feedback control loop in an atomic force microscope. These include:

• Z Error
• Z Drive (topography)
• Z Sensor
• Phase
• L-R (friction)
• Amplitude

Additionally, these channels may be displayed in the forward and reverse scan directions. With the data logger it is possible to display all six channels of data in the forward and reverse direction. This capability allows real time visualization of all channels.

Image Logger

The image logger simultaneously displays six image channels in forward and reverse directions. During scanning, the palettes and the histogram can be updated. Once a scan is completed, all twelve channel imagescan be saved.

Real Time Oscilloscope

Software for Focus Assist is integrated with the AFMControl software used on the TT-2 AFM. Using the software is easy. Simply focus the optical microscope on the probe, and then on the sample. Once this registration is completed, you can use the software to move directly to the sample, to the probe, or you can even have the optic follow the probe during probe approach.

Spectrum Analyzer

The spectrum of one input data channels can be displayed. Several types of windows and averaging algorithms may be applied to the incoming data stream. Identifying sources of unwanted vibrationsis possible with the spectrum analyser function.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

15 Micron Atomic Force Microscope Scanner for High-Resolution Scans

The 15-micron scanner is interchangeable with the 50-micron or 100-micron scanner in the TT-2 AFM or HR-AFM. Extremely high-resolution scans are made with the 15-micron scanner.

Description
The PS-2010, PS-2011 and PS-2019 piezoelectric scanners are designed for use with the AFMWorkshop TT-2 and HR-AFM Atomic Force Microscopes, and scan samples in the X, Y, and Z-axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y-axis. The PS-2010 and PS-2019 have temperature compensated strain gauges in the Z-axis, while the PS-2011 does not.All scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1, in the 100 µm scanner it’s 10:1 and in the 15 µm scanner, it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20-pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm, 50 µmand the 100µm scanners are interchangeable. The scanners are removed from the TT-2 AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20-pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with another scanner. The 15 µm scanner is our recommendation for highest resolution scanning and lowest noise on the TT2-AFM and HR-AFM.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan, and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

High-Resolution Atomic Force Microscope – The New Standard for Affordable Research!

The HR AFM is an Advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. It is ideal for researchers that need to visualize and measure nanometer or sub-nano meter-sized surface features. Besides this, it has many other features, keep on reading to learn more.

Key Features and Benefits of the HR AFM

Low Noise Floor

With a noise floor of 35 picometers, the High-Resolution Atomic Force Microscopeis capable of measuring samples with features from nano-meters to microns.

Kinematic Tip Approach

A stable kinematic design for the probe approach is used in the HR AFM. An optional direct drive approach is available.

Research Grade Top View Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The HR AFM uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the HR AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range

Because the HR AFM has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Side View Optic

Directly view the tip surface distance with the side view optic.

Applications for the HR AFM include imaging:

• Nanstructures (carbon nanotubes)
• Biomolecules (DNA)
• 2-D Materials
• Nanoroughness measurements
• Nanoparticles

With a noise floor of <35 picometers, the HR AFM is the optimal product for researchers that need an affordable AFM but can’t compromise on performance.

AFMWorkshophas extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. We are the only company in the world that offers affordable AFMs for a wide range of customers and applications. With over 300 installed units, we are your trusted partner. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Standalone AFM- Flexible Enough to Scan All Sizes and Shapes of Samples

Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning almost any size and shape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has a linearized XY scan range of 40 microns, and two different Z ceramics: a 7-micron high resolution Z scanner, and a large motion 17-micron Z scanner.

Advanced Features of the SA-AFM Include:
• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.