AFMWorkshop Has Developed A Reputation of Being the Leading Manufacturer for High-Value Atomic Force Microscopes

We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For ultimate performance, our HR-AFM is highly stable with ultra-low noise levels. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. The B AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

On-Site AFM Installation and Training Facilitates Optimal Installation and Function of Your New AFM

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site AFM Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope.

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

• Unpack AFM
• Set up AFM
• Evaluate AFM site for acoustic and structural vibrations
• Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

• Changing samples
• Changing probes
• Aligning the light lever
• Positioning the photodetector
• Selecting resonance (vibrating mode only)
• Tip approach
• Scanning
• Optimizing GPID
• High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about AFM Installation Training, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Advantages of Atomic Force Microscopes in the Pharmaceutical Industry

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) techniques are traditionally used for measuring nanoscale images of samples in the pharmaceutical industry, and these techniques can be costly. The AFM offers an alternative to these traditional imaging techniques by its inherent properties:

• Three-dimensional topography is measured with the AFM, directly revealing surface textures.
• AFM provides nanoscale resolution in surface imaging.
• AFM requires only minimal sample preparation.
• AFM obtains images in ambient air or liquids and does not require large vacuum chambers. This could be critical for testing the effects of an environmental condition to a drug or delineating the behaviour of the sample, such as a cell or a therapeutic, under physiological conditions.
• Images of very smooth, flat materials are readily determined with AFM.
• TheAtomic Force Microscopeis the only imaging technique to provide mechanical information on the surface.
• The cost of acquisition and ownership of an AFM is a fraction of an SEM.

What roles can Atomic Force Microscopes play in the pharmaceutical industry?

• Analysis of crystal structure and growth for drug compounds.
• Characterization of biological materials at the nanoscale.
• Measurement of molecular interaction parameters at a nanometer spatial resolution.
• Obtaining tertiary and quaternary structural information from proteins.
• Evaluation of morphological characteristics of polymers, nanoparticles, and other materials used in drug delivery.
• Quantification of the individual active pharmaceutical ingredient (API)-excipient interaction across different conditions.
• Identification of the surface properties of powdered excipients, colloids, microbiological systems and implants.
• Visualization of homogeneity of dispersions at a molecular level.
• Monitoring structural changes in any living & non-living material.

To learn more about our Atomic Force Microscope Usesand its price,please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Atomic Force Microscope for Nanotechnology Research – An Overview!

Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. With noise floors as low as 0.08 nm, AFM Workshop microscopes are fully capable of handling your nanotechnology research needs.

Atomic force microscopes are essential for nanotechnology research requiring the visualization and measurement of nano structures. AFMWorkshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Our instruments are robust and can be used in single-user as well as multi-user laboratories.

AFMWorkshop’s microscopes share a powerful and intuitive user interface that meet the needs of casual as well as advanced AFM operators.

Our Atomic Force Microscopes:
• give great images of nanostructures on both soft and hard materials;
• have an open architecture to facilitate the development of novel instruments;
• are used by customers to create images used in publications;
• include the most common modes.

Publications
Throughout the world, AFMWorkshop products are used every day for nanotechnology research projects in both life and physical sciences. While AFMWorkshop products were introduced to the market in late 2010, we already have a growing list of publications by successful AFMWorkshop customers. (It typically takes several years for customers to produce publications based on research generated by a new AFM.) To view a list of publications referencing AFMWorkshop products, click here.

Scanned Samples
All types of samples are scanned with AFMWorkshop atomic force microscopes, such as patterned surfaces, materials, and life science samples. Many more AFM images from AFMWorkshop atomic force microscopes can be viewed in our AFM Image Gallery.

Samples Screening
AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes already dedicated to specialized experiments. Routine and repetitive scanning of not particularly challenging samples can be completed without losing valuable time to readjusting the dedicated and more expensive instruments. Additionally, students and researchers can prepare themselves for operating higher-end microscopes by first learning to operate and master the TT-AFM.

Advanced Features of AFMWorkshop Products

High Resolution Scanning
with a Z noise floor of 0.08 nm, the TT-AFM is capable of high-resolution scanning on samples such as DNA, nanoparticles and nanotubes. To ensure optimal performance, our technical staff can provide pre-sales evaluation of your proposed AFM installation location
Expandable architecture
Our product line is expandable with many features offered as upgrades that can be purchased after your initial purchase. We uniquely offer several stage options that may be purchased for the same SPM Control Station.

Modes
Our products are offered with standard modes such as vibrating, and non-vibrating topography modes as well as phase mode and LFM. Additional modes such as C-AFM, lithography, MFM, and F/D are available as options for all of our products. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Atomic Force Microscope Modes: An Overview

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.

Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM. AFMWorkshop instruments come with many options included.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.

Environmental Cell

Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with the TT-AFM probe holder while scanning.

Dunk and Scan Liquid Cell and Probe Holder for TT-AFM

A probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-AFM probe holder. To learn more about AFMWorkshop, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

AFMWorkshop – On-Site AFM Installation And Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

Unpack AFM
Set up AFM
Evaluate AFM site for acoustic and structural vibrations
Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

Changing samples
Changing probes
Aligning the light lever
Positioning the photo-detector
Selecting resonance (vibrating mode only)
Tip approach
Scanning
Optimizing GPID
High resolution scanning on the AFMWorkshop product

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about our AFM Installation Training programs, feel free to visit www.afmworkshop.com.

Nanoparticle Characterization With Atomic Force Microscopy

Two day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Atomic Force Microscopy to Characterize Nanoparticles

Two Day Training Course

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods. The AFM provides powerful information on size, distribution, and geometries of nanoparticles.

Some of the unique advantages of nanoparticle characterization with an AFM include:

-Characterization of nanoparticles that are .5nm and up.
-Nanoparticle mixture distributions below 30 nm.
-Characterization of variable geometry nanoparticles.
-Direct visualization of hydrated nanoparticles/liquid medium.
-Characterization of nanoparticle physical properties such as magnetic fields.

This two day AFMWorkshop course mixes lecture with labwork on atomic force microscopy operation specifically as it applies to characterizing nanoparticles. AFM hardware and software will be reviewed, with special emphasis on the imaging modes and image processing needed to study nanoparticles. We will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, however attendees with experience on any make of AFM instrument will find the labwork relevant and practical.

Topics to Be Covered:

-Overview of AFM operation and different modes Topography measurements on nanoparticles.
-Nanoscale resolution
-Overview of AFM hardware
-Overview of AFM software
-Imaging modes for nanoparticles
-Imaging artifacts and best practices
-Image processing for important measurements on nanoparticles

Labwork:

-Scanning standard and reference samples.
-Nanoparticle imaging and image processing.
-AFM calibration

Interested in participating of our workshops?

To learn more about Atomic Force Microscopes Training, feel free to visit www.afmworkshop.com.

Magnetic Force Microscopy – Description, Specifications And More

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Description
Model: LITHO

This Lithography Software Option is used for nanolithography. That is, the AFM’s probe is used to alter the physical or chemical properties of the surface.

The software uses a script of commands to move the probe in a pre-determined pattern over a surface. The two commands are: “movement” and “hold”. During a movement and hold command, the voltage and force on the probe can be varied.A MOVEMENT command consists of 5 numbers (no letters) separated by commas:

They represent X, Y, Velocity, Setpoint%, and Z_DAC voltage
 X and Y are the coordinates in micron from the image plot.
 Velocity is the speed from one point to the next listed point in nm/sec.
 Setpoint% is the percent value of the existing setpoint.
 Z_DAC voltage is a voltage in the range of 0 to +5V which may be applied to the probe.

A HOLD command consists of 3 numbers (no letters) separated by commas:

They represent Setpoint%, Z_DAC voltage, and Delay Time (ms)

 Setpoint% is the percent value of the existing setpoint.
 Z_DAC voltage is a voltage in the range of 0 to +5V which may be applied to the probe.
 Delay time(ms) is the time in milliseconds that the probe is held in its present position.

A scripting file is a text file that may be created with any program capable of outputting a .txt file. Each motion of the probe required to create the pattern must be added to the .txt file. Complex patterns may be created using a large number of movement and hold commands.
As with all AFMWorkshop software products, this software option is created using VI’s in a LabVIEW™ environment and is integrated with the AFM Control software. The VI’s used to create the software are available to customers who want to modify the lithography software and create new capabilities.

Software

The lithography software window allows a user to load a scripting file. Once loaded, the pattern that will be made is displayed in an image window. When the start button is pressed, the script is implemented and the specifics of each step are listed in the window. A green light is displayed when the script is completed.

Included with the option

 PMMA sample
 Manual
 Plug for rear of unit
 Two probes:
 AppNANO: Doped Diamond (DD-ACTA-5)
 Conductive Diamond Tip – Non-contact mode probe
 Material: Si, N-Type, 0.01~0.025 Ohm/cm
 Cantilever: L= 125 μ, W=35 μ, T=4.5 μ
 Tip Radius: < 150nm, Height: 14-16 μ
 f: 200-400KHz, K=25~75 N/m

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. Besides Lithography, it includes: Conductive AFM, Magnetic Force Microscopy (MFM), and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.
Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.

To learn more about atomic force microscopes, feel free to visit http://www.afmworkshop.com.

TT- Atomic Force Microscope Stage – An Overview!

Includes a stepper-motor-driven Z stage, LL-AFM force sensor, and precision X-Y stage. The stage does not include a piezo scanner or video optical microscope. Electrical connections are made at the back of the stage with a 60-pin ribbon cable connector.

Description

Model: MS-3230

The TT-AFM stage has the excellent thermal and mechanical stability required for high-resolution AFM scanning. Additionally, its open design facilitates user modification. This stage is designed to work with the AFMWorkshop Control Station including an Ebox and AFM Control software.

Features and Benefits of the TT-AFM Stage include

Rigid Frame Design

The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.

Light Lever AFM Force Sensor

Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.

Integrated Probe Holder/Probe Exchanger

Probe Exchange is made quick and easy with AFMWorkshop’s unique probe holder and clipping mechanism.

Direct Drive Z stage

A fast probe approach is possible because probe/sample angle alignment is not required. A linear motion stage is used to move the probe in a perpendicular motion to the sample.

Small Footprint

Requires little space and fit easily on a tabletop with stage dimensions of 7.5 x 12″.

Precision XY Stage with Micrometer

The sample can be moved without touch. The sample is moved relative to the probe with a precision XY micrometer stage.

Modes Electric Plug

Capabilities of the TT-AFM are dramatically expanded via a six pole electrical plug at the back of the stage

Laser/Detector Alignment

Laser/detector alignment is simplified via a direct view to both the light lever laser and the photo detector adjustment mechanism.

Video Optical Microscope

A high resolution video optical microscope is used for locating features on a surface, aligning the light lever force sensor, and facilitating probe approach. The video optical microscope includes an XY micrometer stage for moving the video microscope relative to the AFM probe.

Included with the Product

TT-AFM Stage
Video Optical Microscope
60 pin ribbon cable
USB cable
TT-AFM Manual

Besides this, AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, dunk and scan and environmental cell scanning options, and documentation packages for all AFM Workshop Products.

You can purchase a standalone AFM stage and customize it as per your requirements using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

Additional modes and accessories expand the capabilities of your microscope.

To learn more about atomic force microscope, visit www.afmworkshop.com