AFM: An Ideal Tool to Use in the Photonics Industry

Atomic Force Microscopes (AFMs) offer substantially better horizontal and vertical resolution than optical and stylus profilers. For this reason, AFMs are ideal for the analysis of materials used in the photonics industry.

Some of the advantages from using an AFM for analysis of photonics materials include the following:

Three dimensional structures are measured: depth and angles are measurable.
Image is independent of optical properties.
No sample preparation required – no coatings, no cross sections.
Extreme contrast on flat samples.

Atomic Force Microscopy is non-destructive.

AFM applications in the photonics industry include:
Analysis of Polished Fused Silica Substrates
Ruled Gratings
Holographic Gratings

Analysis of Polished Fused Silica Substrates

Once polished, fused silica substrates can have surface roughness values of 0.1 nm. With an AFM it is possible to visualize the surface of polished silica substrates, to measure the surface texture, and to measure the dimensions of structures created by the polishing process.

Ruled Gratings

Atomic Force Microscopes scan and directly measure the topography of ruled grating. From AFM images the ruling angle, pitch, and surface texture of features are measurable. The image below is of a ruled grating measured on a TT-AFM.

Holographic Gratings

Specifications of holographic grating including heights must be maintained to very tight tolerances. Properly operated, an AFM can measure step heights as low as a few angstroms with very high precision and accuracy.

Looking for a reliable Atomic Force Microscope company?

Try AFMWorkshop, We have extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn more about AFM Workshop Products, feel free to visit at www.afmworkshop.com.

Why Understanding Atomic Force Microscope Theory Is Important

AFMs are essential instruments for nanoscale measurements and helps nanotechnology researchers in all disciplines of engineering and science. There is a considerable and increasing demand among students and professionals for AFM training and education. There are three levels of AFM training.

Introduce Nano world to students

Instructors who fall under this category wants to introduce learners to an AFM by showing them what it looks like and how it works. Here students learn how to enlarge the view of the surface with the help of the scanning tip. Usually few samples are visually represented during this training so that students can see nanometer sized features of a surface. Students are exposed to the AFM for a couple of hours in this group.

Provide training to students that want to operate an AFM

In this group, the motive of instructors is to train students on how to operate the AFM efficiently for measure different types of images. During this training, students learn the basic functions of the AFM, how the instrument scans, and the function of feedback control. Here students come to know how to operate AFM for both industrial and research laboratiries. The training can be as short as one week and can lasts a whole semester.

Prepare students for better career

The motive of instructors here is to prepare students to do well in their careers in the future in instrument design, customer service or applications development. In this group there are additional categories of researchers who aspire to repair and modify their own instruments. Here students build AFMs on their own and also learn to measure images on standard reference samples. It is a 40 hour intensive course that fulfills the requirments of this third group.

Are you the one who wants to include AFMs in your training programs?

If yes, you just need to browse through our website www.afmworkshop.com. We are 24/7 are here to assist you in any regard concerning your AFM queries.

Table Top Atomic Force Microscope for Demanding Applications

TT-2 AFM is a compact, second generation high resolution tabletop Atomic Force Microscope (AFM). It has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Ligh Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

To learn more, feel free to visit https://www.afmworkshop.com/.

Vibration Solution Products to Avoid Fuzzy AFM Images

AFMs are quite susceptible to external vibrations, structural vibartions are transmitted through a building structure and acoustic vibrations are transmitted through air. Both acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope.

External vibration can degrade the resolution of scans by adding extra noise. Atomic force microscope vibration solutions offer a way to reduce external vibration that often causes fuzzy AFM images. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Vibration Isolation filters out unwanted acoustic structural vibrations that interfere with high-resolution scanning. Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform.

Below are some vibration solution products offered by AFMWorkshop:
– Passive Vibration Table
Passive Vibration Table is a moderate Vibration solution when ultimate AFM Performance is not necessary.
– Active Vibration Table
An Active Vibration Table uses a feedback control method for removing vibrations for a better quality of scans.
– Acoustic Cabinet
An acoustic cabinet reduces unwanted vibrations transmitted through air.
– Custom OEM vibration enclosure
Customized (OEM) Vibration enclosure is a scalable vibration solution for any Atomic Force Microscopy System.
–Bungee Option
A Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

Looking for the best atomic force microscope vibration solutions? If yes, feel free to get in touch with AFMWorkshop or visit https://www.afmworkshop.com/.

Important Features of the B-AFM

Are you planning to buy the best quality B-AFM? If yes, then get in touch with AFMWorkshop.

B-AFM offered by AFMWorkshop is the ideal option for scientists with bigger ideas because of genuine pricing. User-Friendly design makes the B-AFM best for teaching the basics of AFM theory and operation to the students. The B-AFM is designed to obtain AFM images without expertise.

AFMWorkshop provides a 100% money-back guarantee and if their AFMs can’t run your application, they will refund the full purchase price. The complete B-AFM system includes the AFM stage, electronics, enclosure, computer and software.

Some of the features of the B-AFM are:

Sample Stage

The sample stage has an XY translation range of 6 mm X 6 mm and is used to select an area of interest on a sample for scanning. The controls for the positioner are conveniently located on the surface of the B-AFM stage, and the magnetic sample holder makes exchanging samples easy and intuitive.

Video Optical Microscope

For locating features on samples, aligning the light lever, and facilitating the probe approach, an LED video optical microscope is used. This optical microscope is all an AFM user needs to start scanning with 200X zoom, adjustable focus, and an LED illumination light.

Exchanging Samples

At the top of the piezoelectric stage, there is the magnetic sample holder that makes sample exchange a routine process. Samples are mounted onto metal disks and easily placed on the magnetic sample holder.

Enclosure

The front-opening enclosure of the B-AFM reduces both structural and acoustic vibrations that can affect the quality of AFM scans. It is made with high-density material and lined on the inside with noise-reducing foam.

Exchanging Probes

There is a removable probe holder with a spring action clamp that allows probe exchange to be done easily within one minute. A probe holder support is provided to store the probe holder when it is not in the AFM.

To buy the best quality product, feel free to visit https://www.afmworkshop.com/.

AFMWorkshop – A leading manufacturer for high value atomic force microscope

Being considered the leading manufacturer for high-value atomic force microscopes, AFMWorkshop works to design and manufacture high quality atomic force microscopes. Apart from this, it provides fundamental training to the customers. It ensures that the AFMs will run the application and in addition to this, the customer service provided by them is always there to help.

Looking for an atomic force microscope for research instruments? AFMWorkshop offers TT-2 AFM that includes an open architecture with unsurpassed flexibility. If you need a microscope for soft samples and biomaterials, LS-AFM is there for you at AFMWorkshop. Besides, if you are searching for a microscope for routine scanning and educational purposes, go for the newest model B-AFM.

AFMWorkshop offers in-house workshops as well as on-site training for each of their customers. They also offer tutorials on the website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education. They ensure that their customers are fully prepared to operate their AFM successfully.

Being one of the confident atomic force microscope
companies, AFMWorkshop ensures customer satisfaction. Additionally, it builds AFMs with price and resolution in mind in order to increase the accessibility of AFMs. Believe it or not, atomic force microscope education is important as it helps students to get exposed to an atomic force microscope by showing them what an AFM looks like and how it operates. I0t helps to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments.

Struggling to find the best atomic force microscope manufacturer? Look no further with AFMWorkshop. To learn more, feel free to visit https://www.afmworkshop.com.

LS-AFM for Life Science Applications

The LS- Atomic Force Microscope is designed specifically for life science applications when paired with an inverted optical microscope. This tip-scanning atomic force microscope includes everything required for AFM scanning: AFM stage, inverted optical microscope adaptation plate, EBox, manuals, cables, and AFM-Control Software.

Have a look at some of the features of LS-AFM:

A turnkey system with guaranteed results
No additional sample holding options required for most applications
Readily scan samples in ambient air and liquids
Zoom to feature with accurate positioning for F/D curves
Readily adaptable to new operating systems
Reduce time for probe exchange (& use any manufacturer’s probes)
Facilitates tip approach and laser alignment
Most common scanning modes included for life sciences applications

When an inverted optical microscope is required for locating cells or other bio-materials on a surface, the LS-AFM has a sample positoiner for glass slides and petri dishes. The LS-AFM can be purchased with the AFMWorkshop inverted optical microscope or it can be retrofitted to almost any inverted optical microscope.

LS-AFM APPLICATIONS

Measure the Stiffness of Biomaterials

LS-AFM can be used to monitor the deflection of a cantilever as it is pushed against sample resulting in a force/distance curve. From the force-distance curve, many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

Imaging Cells

Images of cells are easily scanned in both a liquid and dry environment with the LS-AFM. The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning.

The LS-AFM is a nanoscience instrument that‌ ‌may be purchased in two different configurations:

LS-AFM-A

In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

LS-AFM-B

This configuration of the LS-AFM includes a fully-featured inverted optical microscope.

Do you want to buy LS-AFMs? If yes, buy top quality LS-AFMs from AFMWorkshop. To learn more about the LS-AFM, feel free to visit https://www.afmworkshop.com.

Modes of Atomic Force Microscope

Are you looking for high-quality atomic force microscopes? If yes, then you should choose AFMWorkshop. They provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase, and lateral force modes.

All AFMWorkshop atomic force microscopes include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes including Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes help to expand the capability of your atomic force microscope. These modes help to measure the conductivity, surface magnetic field, force curves, and manipulation of surfaces. Additional AFM modes and accessories expand the capabilities of your microscope.

AFMWorkshop instruments come with many options included. You can expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.

Know more about modes of AFM:

Conductive AFM (C-AFM)

C-AFM is an option for the TT, NP, and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Magnetic Force Microscopy (MFM)

MFM is used to generate images of magnetic fields on a surface and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM. Now, easily measure surface magnetic field by incorporating a magnetic probe into the AFM.

Advanced Force/Distance

This advanced AFM module is flexible and enables many types of experiments. Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor surface parameters such as Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.

To learn more, feel free to visit https://www.afmworkshop.com.

Choose AFMWorkshop to Buy Atomic Force Microscopes

When it comes to buying innovative Atomic Force Microscopes, researchers, educators, and engineers choose AFMWorkshop. Do you know why? Continue reading to know about AFMWorkshop Atomic Force Microscopes in detail.

Here are some of the reasons, why AFMWorkshop is the best choice:

Easily Add New Features

New features and options are developed often in the course of research. You can easily add new features to the AFM Workshop products. They offer a discount for products if they are able to develop a new feature. The feature can be offered for sale on their website, or shared with other customers on the Forum pages of their website.

Easy Customization

All instrumentation from the AFM Workshop allows customization of the products due to its open design. AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for different fields. Furthermore, the AFM Workshop actively seeks collaborations with development labs, companies, and educational institutions.

Reasonable Prices

AFMWorkshop offer their products on their website and the products are manufactured and sold in reasonable volumes and prices.

OEM and VARs

If a company needs an AFM for a product and requires an AFM platform, they can work with them in customizing the instrumentation according to the product requirements. Furthermore, discount on instrumentation is available for volume purchases.

Teaching

If you would like to incorporate AFMWorkshop products into your teaching curriculum, they would be delighted to hear your ideas. They may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

Contribution of AFM expertise

All the AFM Workshop employees have substantial experience with AFM design and instrumentation. They are willing to share the expertise to help you design new instrumentation or applications.

These are some of the reasons why you should choose AFMWorkshop to buy Atomic Force Microscopes. Indeed, AFMWorkshop is a renowned atomic force microscope manufacturer, they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs. For more information, feel free to visit https://www.afmworkshop.com.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
The stage can hold many smaller samples that may then be imaged in a specific order.
Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.