Atomic Force Microscope Modes: An Overview

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.

Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM. AFMWorkshop instruments come with many options included.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.

Environmental Cell

Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with the TT-AFM probe holder while scanning.

Dunk and Scan Liquid Cell and Probe Holder for TT-AFM

A probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-AFM probe holder. To learn more about AFMWorkshop, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

AFM Workshop: A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 300 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS-AFM is the best option for scientists and researchers working with soft samples and biomaterials. Our newest model, the B-AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about AFMWorkshop and its products, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

B-AFM: A Compact and Portable Solution for Educators

The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.

Simplified Key Operational Steps

Aligning the AFM light lever

A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.

Exchanging probes

With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.

Exchanging samples

Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.

Key Components of the B-AFM

Video Optical Microscope

Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.

XY Sample Stage

The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.

Enclosure

Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.

Electronics

The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.

To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

Biology Applications Which Are Unique to Atomic Force Microscopes

Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are shown below.

Imaging Biomolecules
Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquid.

Double-stranded DNA Molecules
Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)
Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.
Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging cells
Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites
The Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells
Measurement of high-resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutant
The ability to image a very large number of cells allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally, the inverted microscope can be operated in epifluorescence mode.

Measuring Stiffness of Biomaterials at the Nanoscale
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
To learn more about our Atomic force microscopes, feel free to visit www.afmworkshop.com. Or call us at 1 (888) 671-5539

Atomic Force Microscopy Services Offered By Afm workshop

Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

Customer Support and Technical Service
AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry / Process Development & Process Control; and Research / Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Custom Engineering of Atomic Force Microscopes
AFMWorkshop’s open architecture allows the ultimate in flexibility and customization. We will work with you to make your instrumentation and application ideas a reality.

Instrumentation from the AFMWorkshop has an open design that allows customization of the products by its users.

Atomic Force Microscopes for OEMs
AFMWorkshop actively partners with OEMs. If your company needs an Atomic Force Microscope for a product and requires an AFM platform, we will work with you in customizing our instrumentation to your product requirements. Discounts on AFM instrumentation are available for volume purchases.

AFM Workshop Customers Area
Sign in to access your AFMWorkshop customer account.

Need assistance?

Contact AFMWorkshop to inquire about atomic force microscope information and pricing, training, application help, customer support and technical service. Our customer service will assist with choosing the right atomic force microscope for your application needs, providing any documentation or help you may need to secure funding, as well as troubleshoot over the phone, by email, and by remote-viewing on the AFM computer. Our success is your success, so please don’t hesitate to contact us today.

To learn more about atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscopes: An Ideal Tool For Instrument Innovators

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument. TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics. Because the software is written in LabVIEW, it can be easily modified to meet very specific demands.

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Additionally, National Instrument Data Acquisition Cards can be integrated into the TT-2 AFM to create a customized experiment.

Instrument Innovators are no longer faced with the decision to either create an entirely new AFM, or to live with the limitations of commercial AFMs that have limited documentation and a closed architecture. An engineering documentation package is available as an option to TT-2 AFM customers.

Mechanical Drawings

All the drawings for mechanical parts used to build a TT-2 AFM were created in AutoCAD and are included in the optional documentation package. If you require a .dwg file for a specific part in the TT-2 AFM, AFMWorkshop will provide it to you. Additionally, single parts in the microscope can be purchased if you need to modify a part for your needs. Each part is identified by part numbers on each mechanical drawing.

Software

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The TT-2 AFM includes a VI that can be modified for specific needs. The instrument control protocol for addressing functions such as Z feedback, XY scanning and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

Electronics

Direct access to TT-2 AFM electronics signals may be gained from a 50 pin ribbon cable at the rear of the TT-2 AFM EBox, or from the mode connector at the front of the microscope stage. For developers who want even more access, the technical guide includes schematics to all electronics in the TT-2 AFM, including: photodetector board, piezo electric control board, controller main board, and even the power supply board. There are several pinned signal access points on the main controller board.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

A brief overview of the TT-2 AFM Assembly Workshop

Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

TT-2 AFM Assembly & Operation Workshop

Attendees to this five day workshop build a TT-2 AFM atomic force microscope and learn how to operate it. Additionally, daily seminars provide attendees with training on the theory, operation and applications of an atomic force microscope. The workshop is primarily geared for customers who have purchased a TT-AFM Kit.

Each day begins with one to two hours of coursework followed by hands-on microscope assembly,testing and operation.

Attendees of the TT-2 AFM Assembly & Operation Workshop:

Are better able to operate, gain optimal performance, and obtain the best images from their TT-AFM.
Can repair the microscope whenever needed because they know the assembly process and all the parts used in its construction.
May easily modify their instrument to create unique instrumentation designed for their specific research applications.

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bioapplications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

Interested in joining our workshop?

Our upcoming TT-2 AFM assembly workshops:
June 24-28, 2019
Sept. 9-13, 2019

Visit www.afmworkshop.com and fill up the form to register yourself.

An Overview Of AFM Workshop’s 15 Micron AFM Scanner

The 15 micron scanner is interchangeable with the 50 micron scanner in the TT-AFM. Extremely high resolution scans are made with the 15 micron scanner.

Description
Model: PS-2011

The PS-2010 and PS-2011 piezoelectric scanners are designed for use with the AFMWorkshop TT-AFM, and scan samples in the X, Y, and Z axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y axis. The PS-2010 has a temperature compensated strain gauge in the Z axis, while the PS-2011 does not. Both scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1 and in the 15 µm scanner it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20 pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm and the 50 µm scanners are interchangeable. The scanners are removed from the TT-AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20 pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with the other scanner.

Want to expand the capabilities of your microscope?

You can add additional modes and accessories to achieve that. AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

To learn more about atomic force microscope, visit www.afmworkshop.com

Features of Table Top Atomic Force Microscope

This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for educators, industry, and research can be found by clicking on www.afmworkshop.com or call at (888)671-5539 any queries.

Basic Atomic Force Microscope for Routine Scanning and Education

The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

Key Features and Benefits of the B-AFM

7-Step Scanning Software
The B-AFM 7-Step Scanning Software is designed for casual AFM users that want to obtain AFM images without in depth AFM expertise. A user-friendly design makes the B-AFM ideal for teaching students the basics of AFM theory and operation.
Intuitive Light Lever Design
A unique design of the light lever makes aligning the system a routine procedure for users with limited experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners
Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Standard AFM Scanning Modes
Scanning modes for the B-AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.
Acoustic Enclosure
The B-AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.
B-AFM’s Applications
Education
The B-AFM is ideal for educating students on the theory, operation and applications of an atomic force microscope. One of the advantages of the B-AFM for education is the open design of the light lever force sensor.
Routine Scanning
Routine scanning of samples that are not challenging to scan is a common application for the B-AFM. If a noise floor below 300pM is required, we suggest purchasing the AFMControl software and a vibration table.

If our AFMs can’t run your application, we will refund the full purchase price. Additionally, our AFMs are now backed by a two-year, return-to-factory warranty.

Contact us to take advantage of this offer (888)671-5539 or visit www.afmworkshop.com to learn more about Basic Atomic Force Microscope.