Advantages of using Atomic Force Microscopy for Nanoparticle characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nano meter resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include:

• Characterization of nanoparticles that are .5 nm in diameter and larger.
• Nanoparticle mixture distributions below 30 nm.
• Characterization of variable geometry nanoparticles.
• Direct visualization of hydrated nanoparticles/liquid medium.
• Characterization of nanoparticle physical properties such as magnetic fields.
• Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter

An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.

Nanoparticle Mixture Distributions below 30 nm

AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles

AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.

Hydrated Samples/Liquid Mediums

The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles

Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis

A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three-dimensional structure of the nanoparticles.

Why choose AFMWorkshop?

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, feel free to visit http://www.afmworkshop.com Or call at 1 (888) 671-5539.

AFM Curriculum: An Introduction to The Instrumentation Of AFM

Atomic force microscopy curriculum is an introduction to the instrumentation of atomic force microscopes, including theory, design, and operation. Standard AFM scanning modes are covered including vibrating and non-vibrating modes.

Description

Written by Dalia Yablon, Ph.D., Surface Char.

Laboratory–Based Curriculum for Atomic Force Microscopy: Atomic force microscopy to make nanoscale material and topographic measurements of materials.

This comprehensive all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes that will be used in the labs: contact mode, tapping mode, and force spectroscopy.

Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing, using the freeware Gwyddion, is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and then analysis/questions for further discussion for each individual laboratory (the answers are provided in the accompanying Teacher Manual). Aside from the AFM instrument, no other material or parts are necessary!

Objectives

Learn the basic operating principles behind atomic force microscopy.

Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.

Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.

Conduct basic analysis on images, including statistics and cross-sectional measurements.

Target Audience Included in Curriculum Packet Laboratory Experiments

Undergraduates

This curriculum has been developed for undergraduate students in any science or engineering background: biology, chemistry, physics, materials science, mechanical engineering materials engineering, etc. Familiarity with freshman level mathematics and physics concepts is assumed, but all concepts and theory related to atomic force microscopy are explained.

Student Guide

30-page curriculum for students – Covers the background of advanced AFM operation, modes, and application. It then goes through a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.

Teacher Manual

Accompanying Teacher Manual – Accompaniment to student guide, assists teacher/teaching assistant to help students through labs. Includes answers to the pre-lab quiz and detailed answers with sample images to all the suggested analysis questions.

AFM Sample Kit

Samples – A series of 4 prepared, mounted samples ready to be inserted into the AFM instrument. Student guide curriculum guides the students through experiments on these samples.

AFM Probe Kit

Probes – A series of 8 probes of different spring constants to be used in the curriculum.

Measuring Roughness of Thin Films.

Measuring Compositional Heterogeneity of Everyday Materials.

Metrological Measurements.

Probing Mechanical Properties of a Substrate.

To learn more, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

B-AFM: A Compact and Portable Solution for Educators

The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.

Simplified Key Operational Steps

Aligning the AFM light lever

A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.

Exchanging probes

With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.

Exchanging samples

Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.

Key Components of the B-AFM

Video Optical Microscope

Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.

XY Sample Stage

The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.

Enclosure

Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.

Electronics

The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.

To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

An Overview Of AFM Workshop’s 15 Micron AFM Scanner

The 15 micron scanner is interchangeable with the 50 micron scanner in the TT-AFM. Extremely high resolution scans are made with the 15 micron scanner.

Description
Model: PS-2011

The PS-2010 and PS-2011 piezoelectric scanners are designed for use with the AFMWorkshop TT-AFM, and scan samples in the X, Y, and Z axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y axis. The PS-2010 has a temperature compensated strain gauge in the Z axis, while the PS-2011 does not. Both scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1 and in the 15 µm scanner it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20 pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm and the 50 µm scanners are interchangeable. The scanners are removed from the TT-AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20 pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with the other scanner.

Want to expand the capabilities of your microscope?

You can add additional modes and accessories to achieve that. AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

To learn more about atomic force microscope, visit www.afmworkshop.com

Features of Table Top Atomic Force Microscope

This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for educators, industry, and research can be found by clicking on www.afmworkshop.com or call at (888)671-5539 any queries.

Basic Atomic Force Microscope for Routine Scanning and Education

The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

Key Features and Benefits of the B-AFM

7-Step Scanning Software
The B-AFM 7-Step Scanning Software is designed for casual AFM users that want to obtain AFM images without in depth AFM expertise. A user-friendly design makes the B-AFM ideal for teaching students the basics of AFM theory and operation.
Intuitive Light Lever Design
A unique design of the light lever makes aligning the system a routine procedure for users with limited experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners
Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Standard AFM Scanning Modes
Scanning modes for the B-AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.
Acoustic Enclosure
The B-AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.
B-AFM’s Applications
Education
The B-AFM is ideal for educating students on the theory, operation and applications of an atomic force microscope. One of the advantages of the B-AFM for education is the open design of the light lever force sensor.
Routine Scanning
Routine scanning of samples that are not challenging to scan is a common application for the B-AFM. If a noise floor below 300pM is required, we suggest purchasing the AFMControl software and a vibration table.

If our AFMs can’t run your application, we will refund the full purchase price. Additionally, our AFMs are now backed by a two-year, return-to-factory warranty.

Contact us to take advantage of this offer (888)671-5539 or visit www.afmworkshop.com to learn more about Basic Atomic Force Microscope.

Why Use Atomic Force Microscopes to Make Measurements on Biological Samples

Atomic force microscopes are well suited for making measurements on biological samples at the nanoscale in ambient air and in liquids.

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Recommended AFM products for life sciences applications are TT-2 Atomic Force Microscope and LS-Atomic Force Microscope.

Just have a look at some of these biological applications:

Double-stranded DNA Molecules

Using atomic force microscopes, imaging of DNA of size 5 µm x 5 µm can be done easily. Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

In structural studies, imaging of Tobacco Mosaic Virus is commonly carried out. Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, placement of the microscope in an environment with minimal structural, the capability to scan with very light forces and acoustic vibrations. Furthermore, TMV is commonly used as an imaging standard since it has a highly conserved structure.

Parasites

In the air, Parasites of size 25 µm x 25µm can be measured using AFM. These Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Using an Atomic Force Microscope, Epithelial cell of size 32 µm x 32 µm can be measured in liquid. Measurement of high-resolution images of cells in a liquid (e.g., under physiological conditions) is another possibility unique to AFM and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

If you want to buy high-quality Atomic Force Microscope, feel free to visit https://www.afmworkshop.com/.

Table Top Atomic Force Microscope for Demanding Applications

TT-2 AFM is a compact, second generation high resolution tabletop Atomic Force Microscope (AFM). It has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Ligh Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

To learn more, feel free to visit https://www.afmworkshop.com/.

AFMWorkshop Atomic Force Microscope Probes

Where Atomic Force Microscopy Probes are used? Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force-distance scanning.

AFMWorkshop offers AFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

ACLA AFM Probes

ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact) applications. Compatible with most commercially available SPMs/AFMs, ACLA probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities. This is a box of 10 probes.

SHOCONA Probes

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

For a more in-depth understanding of how AFM probes work, as well as some helpful AFM tips and pointers, you can get in touch with experts of AFMWorkshop. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy. They provide a closer look at their AFMs, including full demonstrations, introductory AFM videos and more.

AFMWorkshop designed the free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM technology and how an Atomic Force Microscope works. They offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications.

AFM Vibration Isolation Solution: Active Vibration Table

Atomic Force Microscopes which are quite susceptible to external vibrations, are able to measure topographic images at resolutions below 0.1 nanometers. The external vibrations need to be reduced in order to obtain the highest-quality AFM images, particularly for high-resolution scanning.

Both acoustic and and structural vibrations degrade the resolution and overall performance of Atomic Force Microscopy Instrumentation. The acoustic vibrations can be reduced by placing the microscope in an acoustic isolation chamber. On the other hand, structural vibrations can be reduced by using a mechanical isolation platform such as an active vibration table.

The vibration isolation tables are designed to provide stable working conditions for devices that are sensitive to vibration and shocks. The table consists of an outer table frame that supports the main work surface which is not isolated from vibration and an inner table frame that is entirely separate and supports the inner isolated work surface. This ensures vibrations are not transmitted to the isolated inner work surface. An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations and then electromechanical transducers use the output of the sensors to control the motion of the tabletop.

The advantage of an Active Vibration Table over the Bungee option is that the Vibration Isolation Tabletop is more stable than a platform suspended with bungee cords. Other equipment that provide vibration isolation include vibration enclosures, bungee options, and custom/OEM enclosures.

This being said, bungee solutions are often better for structural vibration reduction than active vibration tables.

AFMWorkshop is a leading Atomic force microscope manufacturing company in the USA and at the global market. Our customers range from researchers and engineers at high-profile institutions to educators in high schools and community colleges. Our atomic force microscopes have a modular and open design, simplifying education and training as well as allowing adjustments tailored to specific research. Feel free to visit https://www.afmworkshop.com/ for more information. You can also reach out to us via phone (1 (888) 671-5539) and email (info@afmworkshop.com).