Biology Applications Which Are Unique to Atomic Force Microscopes

Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are shown below.

Imaging Biomolecules
Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquid.

Double-stranded DNA Molecules
Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)
Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.
Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging cells
Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites
The Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells
Measurement of high-resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutant
The ability to image a very large number of cells allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally, the inverted microscope can be operated in epifluorescence mode.

Measuring Stiffness of Biomaterials at the Nanoscale
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
To learn more about our Atomic force microscopes, feel free to visit www.afmworkshop.com. Or call us at 1 (888) 671-5539

Basic Atomic Force Microscope for Routine Scanning and Education

The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

Key Features and Benefits of the B-AFM

7-Step Scanning Software
The B-AFM 7-Step Scanning Software is designed for casual AFM users that want to obtain AFM images without in depth AFM expertise. A user-friendly design makes the B-AFM ideal for teaching students the basics of AFM theory and operation.
Intuitive Light Lever Design
A unique design of the light lever makes aligning the system a routine procedure for users with limited experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners
Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Standard AFM Scanning Modes
Scanning modes for the B-AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.
Acoustic Enclosure
The B-AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.
B-AFM’s Applications
Education
The B-AFM is ideal for educating students on the theory, operation and applications of an atomic force microscope. One of the advantages of the B-AFM for education is the open design of the light lever force sensor.
Routine Scanning
Routine scanning of samples that are not challenging to scan is a common application for the B-AFM. If a noise floor below 300pM is required, we suggest purchasing the AFMControl software and a vibration table.

If our AFMs can’t run your application, we will refund the full purchase price. Additionally, our AFMs are now backed by a two-year, return-to-factory warranty.

Contact us to take advantage of this offer (888)671-5539 or visit www.afmworkshop.com to learn more about Basic Atomic Force Microscope.

AFM: An Ideal Tool to Use in the Photonics Industry

Atomic Force Microscopes (AFMs) offer substantially better horizontal and vertical resolution than optical and stylus profilers. For this reason, AFMs are ideal for the analysis of materials used in the photonics industry.

Some of the advantages from using an AFM for analysis of photonics materials include the following:

Three dimensional structures are measured: depth and angles are measurable.
Image is independent of optical properties.
No sample preparation required – no coatings, no cross sections.
Extreme contrast on flat samples.

Atomic Force Microscopy is non-destructive.

AFM applications in the photonics industry include:
Analysis of Polished Fused Silica Substrates
Ruled Gratings
Holographic Gratings

Analysis of Polished Fused Silica Substrates

Once polished, fused silica substrates can have surface roughness values of 0.1 nm. With an AFM it is possible to visualize the surface of polished silica substrates, to measure the surface texture, and to measure the dimensions of structures created by the polishing process.

Ruled Gratings

Atomic Force Microscopes scan and directly measure the topography of ruled grating. From AFM images the ruling angle, pitch, and surface texture of features are measurable. The image below is of a ruled grating measured on a TT-AFM.

Holographic Gratings

Specifications of holographic grating including heights must be maintained to very tight tolerances. Properly operated, an AFM can measure step heights as low as a few angstroms with very high precision and accuracy.

Looking for a reliable Atomic Force Microscope company?

Try AFMWorkshop, We have extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn more about AFM Workshop Products, feel free to visit at www.afmworkshop.com.

Table Top Atomic Force Microscope for Demanding Applications

TT-2 AFM is a compact, second generation high resolution tabletop Atomic Force Microscope (AFM). It has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Ligh Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

To learn more, feel free to visit https://www.afmworkshop.com/.

AFMWorkshop Atomic Force Microscope Probes

Where Atomic Force Microscopy Probes are used? Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force-distance scanning.

AFMWorkshop offers AFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

ACLA AFM Probes

ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact) applications. Compatible with most commercially available SPMs/AFMs, ACLA probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities. This is a box of 10 probes.

SHOCONA Probes

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

For a more in-depth understanding of how AFM probes work, as well as some helpful AFM tips and pointers, you can get in touch with experts of AFMWorkshop. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy. They provide a closer look at their AFMs, including full demonstrations, introductory AFM videos and more.

AFMWorkshop designed the free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM technology and how an Atomic Force Microscope works. They offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications.

AFM Vibration Isolation Solution: Active Vibration Table

Atomic Force Microscopes which are quite susceptible to external vibrations, are able to measure topographic images at resolutions below 0.1 nanometers. The external vibrations need to be reduced in order to obtain the highest-quality AFM images, particularly for high-resolution scanning.

Both acoustic and and structural vibrations degrade the resolution and overall performance of Atomic Force Microscopy Instrumentation. The acoustic vibrations can be reduced by placing the microscope in an acoustic isolation chamber. On the other hand, structural vibrations can be reduced by using a mechanical isolation platform such as an active vibration table.

The vibration isolation tables are designed to provide stable working conditions for devices that are sensitive to vibration and shocks. The table consists of an outer table frame that supports the main work surface which is not isolated from vibration and an inner table frame that is entirely separate and supports the inner isolated work surface. This ensures vibrations are not transmitted to the isolated inner work surface. An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations and then electromechanical transducers use the output of the sensors to control the motion of the tabletop.

The advantage of an Active Vibration Table over the Bungee option is that the Vibration Isolation Tabletop is more stable than a platform suspended with bungee cords. Other equipment that provide vibration isolation include vibration enclosures, bungee options, and custom/OEM enclosures.

This being said, bungee solutions are often better for structural vibration reduction than active vibration tables.

AFMWorkshop is a leading Atomic force microscope manufacturing company in the USA and at the global market. Our customers range from researchers and engineers at high-profile institutions to educators in high schools and community colleges. Our atomic force microscopes have a modular and open design, simplifying education and training as well as allowing adjustments tailored to specific research. Feel free to visit https://www.afmworkshop.com/ for more information. You can also reach out to us via phone (1 (888) 671-5539) and email (info@afmworkshop.com).

Which AFM is best to Create New Instrumentation?

The TT-2 AFM is ideal for instrument builders that want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument.

Now, instrument innovators no longer have to face the decision to either create an entirely new AFM or to live with the limitations of commercial AFMs that have limited documentation and closed architecture.

Why choose TT-2 AFM?

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Therefore, TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics.

TT-2 AFM was created in AutoCAD and is included in the optional documentation package. Single parts in the microscope can be purchased if you need to modify a part for your needs. All parts are identified by part numbers on each mechanical drawing.

LabVIEW software screen for AFM

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The instrument control protocol for addressing functions such as Z feedback, XY scanning, and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

The technical guide is available for developers that include schematics to all electronics in the TT-2 AFM including photodetector board, piezoelectric control board, controller mainboard, and even the power supply board.

For more information, feel free to visit https://www.afmworkshop.com.

Choose AFMWorkshop to Buy Atomic Force Microscopes

When it comes to buying innovative Atomic Force Microscopes, researchers, educators, and engineers choose AFMWorkshop. Do you know why? Continue reading to know about AFMWorkshop Atomic Force Microscopes in detail.

Here are some of the reasons, why AFMWorkshop is the best choice:

Easily Add New Features

New features and options are developed often in the course of research. You can easily add new features to the AFM Workshop products. They offer a discount for products if they are able to develop a new feature. The feature can be offered for sale on their website, or shared with other customers on the Forum pages of their website.

Easy Customization

All instrumentation from the AFM Workshop allows customization of the products due to its open design. AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for different fields. Furthermore, the AFM Workshop actively seeks collaborations with development labs, companies, and educational institutions.

Reasonable Prices

AFMWorkshop offer their products on their website and the products are manufactured and sold in reasonable volumes and prices.

OEM and VARs

If a company needs an AFM for a product and requires an AFM platform, they can work with them in customizing the instrumentation according to the product requirements. Furthermore, discount on instrumentation is available for volume purchases.

Teaching

If you would like to incorporate AFMWorkshop products into your teaching curriculum, they would be delighted to hear your ideas. They may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

Contribution of AFM expertise

All the AFM Workshop employees have substantial experience with AFM design and instrumentation. They are willing to share the expertise to help you design new instrumentation or applications.

These are some of the reasons why you should choose AFMWorkshop to buy Atomic Force Microscopes. Indeed, AFMWorkshop is a renowned atomic force microscope manufacturer, they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs. For more information, feel free to visit https://www.afmworkshop.com.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
The stage can hold many smaller samples that may then be imaged in a specific order.
Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.

Buy AFMWorkshop Microscopes to Handle Your Nanotechnology Research Needs

For nanotechnology research, Atomic force microscopes are essential for the visualization and measurement of nanostructures.

AFM Workshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Their Atomic force microscopes offer the necessary resolution for the measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. AFM Workshop microscopes with noise floors as low as 0.08 nm, are fully capable of handling your nanotechnology research needs.

All the products offered by AFM Workshop are robust and can be used in single-user as well as multi-user laboratories. AFMWorkshop’s microscopes share a powerful and intuitive user interface that meets the needs of casual as well as advanced AFM operators.

Atomic Force Microscopes give great images of nanostructures on both soft and hard materials. AFMWorkshop microscopes have an open architecture to facilitate the development of novel instruments. These microscopes can be used by AFMWorkshop customers to create images used in publications.

AFMWorkshop products are widely used every day in both life and physical sciences throughout the world for nanotechnology research projects. AFMWorkshop products were introduced to the market in late 2010. They already have a growing list of almost 200 publications written by successful AFMWorkshop customers. To date there are 250 AFMWorkshop microscopes installed in laboratories.

When it comes to scanning samples, almost all type of samples including nanostructures, patterned surfaces, materials, and life science samples are scanned with AFMWorkshop microscopes. AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes that are already dedicated to specialized experiments.

If you are looking for top-quality atomic force microscopes then get in touch with AFMWorkshop. AFMWorkshop guarantees their AFMs will run your application, and their customer service is always available to assist.

To learn more, feel free to visit https://www.afmworkshop.com.