LS-AFM for Life Science Applications

The LS- Atomic Force Microscope is designed specifically for life science applications when paired with an inverted optical microscope. This tip-scanning atomic force microscope includes everything required for AFM scanning: AFM stage, inverted optical microscope adaptation plate, EBox, manuals, cables, and AFM-Control Software.

Have a look at some of the features of LS-AFM:

A turnkey system with guaranteed results
No additional sample holding options required for most applications
Readily scan samples in ambient air and liquids
Zoom to feature with accurate positioning for F/D curves
Readily adaptable to new operating systems
Reduce time for probe exchange (& use any manufacturer’s probes)
Facilitates tip approach and laser alignment
Most common scanning modes included for life sciences applications

When an inverted optical microscope is required for locating cells or other bio-materials on a surface, the LS-AFM has a sample positoiner for glass slides and petri dishes. The LS-AFM can be purchased with the AFMWorkshop inverted optical microscope or it can be retrofitted to almost any inverted optical microscope.

LS-AFM APPLICATIONS

Measure the Stiffness of Biomaterials

LS-AFM can be used to monitor the deflection of a cantilever as it is pushed against sample resulting in a force/distance curve. From the force-distance curve, many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

Imaging Cells

Images of cells are easily scanned in both a liquid and dry environment with the LS-AFM. The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning.

The LS-AFM is a nanoscience instrument that‌ ‌may be purchased in two different configurations:

LS-AFM-A

In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

LS-AFM-B

This configuration of the LS-AFM includes a fully-featured inverted optical microscope.

Do you want to buy LS-AFMs? If yes, buy top quality LS-AFMs from AFMWorkshop. To learn more about the LS-AFM, feel free to visit https://www.afmworkshop.com.

Which AFM is best to Create New Instrumentation?

The TT-2 AFM is ideal for instrument builders that want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument.

Now, instrument innovators no longer have to face the decision to either create an entirely new AFM or to live with the limitations of commercial AFMs that have limited documentation and closed architecture.

Why choose TT-2 AFM?

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Therefore, TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics.

TT-2 AFM was created in AutoCAD and is included in the optional documentation package. Single parts in the microscope can be purchased if you need to modify a part for your needs. All parts are identified by part numbers on each mechanical drawing.

LabVIEW software screen for AFM

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The instrument control protocol for addressing functions such as Z feedback, XY scanning, and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

The technical guide is available for developers that include schematics to all electronics in the TT-2 AFM including photodetector board, piezoelectric control board, controller mainboard, and even the power supply board.

For more information, feel free to visit https://www.afmworkshop.com.

Modes of Atomic Force Microscope

Are you looking for high-quality atomic force microscopes? If yes, then you should choose AFMWorkshop. They provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase, and lateral force modes.

All AFMWorkshop atomic force microscopes include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes including Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes help to expand the capability of your atomic force microscope. These modes help to measure the conductivity, surface magnetic field, force curves, and manipulation of surfaces. Additional AFM modes and accessories expand the capabilities of your microscope.

AFMWorkshop instruments come with many options included. You can expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.

Know more about modes of AFM:

Conductive AFM (C-AFM)

C-AFM is an option for the TT, NP, and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Magnetic Force Microscopy (MFM)

MFM is used to generate images of magnetic fields on a surface and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM. Now, easily measure surface magnetic field by incorporating a magnetic probe into the AFM.

Advanced Force/Distance

This advanced AFM module is flexible and enables many types of experiments. Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor surface parameters such as Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.

To learn more, feel free to visit https://www.afmworkshop.com.

Choose AFMWorkshop to Buy Atomic Force Microscopes

When it comes to buying innovative Atomic Force Microscopes, researchers, educators, and engineers choose AFMWorkshop. Do you know why? Continue reading to know about AFMWorkshop Atomic Force Microscopes in detail.

Here are some of the reasons, why AFMWorkshop is the best choice:

Easily Add New Features

New features and options are developed often in the course of research. You can easily add new features to the AFM Workshop products. They offer a discount for products if they are able to develop a new feature. The feature can be offered for sale on their website, or shared with other customers on the Forum pages of their website.

Easy Customization

All instrumentation from the AFM Workshop allows customization of the products due to its open design. AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for different fields. Furthermore, the AFM Workshop actively seeks collaborations with development labs, companies, and educational institutions.

Reasonable Prices

AFMWorkshop offer their products on their website and the products are manufactured and sold in reasonable volumes and prices.

OEM and VARs

If a company needs an AFM for a product and requires an AFM platform, they can work with them in customizing the instrumentation according to the product requirements. Furthermore, discount on instrumentation is available for volume purchases.

Teaching

If you would like to incorporate AFMWorkshop products into your teaching curriculum, they would be delighted to hear your ideas. They may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

Contribution of AFM expertise

All the AFM Workshop employees have substantial experience with AFM design and instrumentation. They are willing to share the expertise to help you design new instrumentation or applications.

These are some of the reasons why you should choose AFMWorkshop to buy Atomic Force Microscopes. Indeed, AFMWorkshop is a renowned atomic force microscope manufacturer, they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs. For more information, feel free to visit https://www.afmworkshop.com.

How to Make Measurements on Biological Samples

When it comes to making measurements on biological samples at the nanoscale, Atomic force microscopes are used. In both ambient atmospheric conditions as well as liquid environments, AFM allows the nanoscale imaging of soft biomaterials including cells and DNA.

Have a look at the biology applications, unique to atomic force microscopes:

Double-stranded DNA Molecules

Imaging of DNA of size 5 µm x 5 µm can be done easily. Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

Imaging of Tobacco Mosaic Virus is commonly carried out in structural studies. Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces and placement of the microscope in an environment with minimal structural and acoustic vibrations. Furthermore, TMV is commonly used as an imaging standard since it has a highly conserved structure.

Parasites

Parasites of size 25 µm x 25µm can be measured in the air using AFM. These Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Epitheleal cell of size 32 µm x 32 µm can be measured in liquid using Atomic Force Microscope. Measurement of high-resolution images of cells in a liquid (e.g., under physiological conditions) is another possibility unique to AFM and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Recommended AFM products for life sciences applications are TT-2 Atomic Force Microscope and LS-Atomic Force Microscope. To buy high-quality Atomic Force Microscope, feel free to visit https://www.afmworkshop.com/.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
The stage can hold many smaller samples that may then be imaged in a specific order.
Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.

Buy AFMWorkshop Microscopes to Handle Your Nanotechnology Research Needs

For nanotechnology research, Atomic force microscopes are essential for the visualization and measurement of nanostructures.

AFM Workshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Their Atomic force microscopes offer the necessary resolution for the measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. AFM Workshop microscopes with noise floors as low as 0.08 nm, are fully capable of handling your nanotechnology research needs.

All the products offered by AFM Workshop are robust and can be used in single-user as well as multi-user laboratories. AFMWorkshop’s microscopes share a powerful and intuitive user interface that meets the needs of casual as well as advanced AFM operators.

Atomic Force Microscopes give great images of nanostructures on both soft and hard materials. AFMWorkshop microscopes have an open architecture to facilitate the development of novel instruments. These microscopes can be used by AFMWorkshop customers to create images used in publications.

AFMWorkshop products are widely used every day in both life and physical sciences throughout the world for nanotechnology research projects. AFMWorkshop products were introduced to the market in late 2010. They already have a growing list of almost 200 publications written by successful AFMWorkshop customers. To date there are 250 AFMWorkshop microscopes installed in laboratories.

When it comes to scanning samples, almost all type of samples including nanostructures, patterned surfaces, materials, and life science samples are scanned with AFMWorkshop microscopes. AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes that are already dedicated to specialized experiments.

If you are looking for top-quality atomic force microscopes then get in touch with AFMWorkshop. AFMWorkshop guarantees their AFMs will run your application, and their customer service is always available to assist.

To learn more, feel free to visit https://www.afmworkshop.com.

Applications of Atomic Force Microscopy

For visualizing nanostructures and making measurements at the nano scale, atomic force microscopes (AFM) are an essential tool. AFMs are routinely used by scientists and researchers throughout the world to visualize surface structure and to make dimensional measurements.

Atomic Force Microscopes have a wide range of applications in physical sciences, life sciences and all disciplines of engineering. Here are a few of the common applications for atomic force microscopes:

Nanotechnology

Nanotechnology is an almagum of all disciplines of science and engineering, Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments. Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and more.

Life Sciences

AFMs are effective tool for scanning biological samples that are not possible to scan with any other type of microscope. Biomaterials, cells, and other soft samples can be scanned by AFMs in ambient air as well as liquids. Besides measuring 3-D images an afm can measure parameters including stiffness and adhesion.

Process Development/Control

Atomic force microscope is finding acceptance for evaluating samples for process development, and to control a process. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips. AFM measurements used in process control are typically made repetitively.

Instrument Innovation

Atomic force microscopes are ideal for instrument builders and engineers. They can be used as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument such as a mass spectrometer, nanoindenter, and IR spectrometer.

Nanoparticles

Atomic force microscopy can be used for Nanoparticle characterization. Often with an AFM information is gained that cannot be measured with dynamic light scattering, electron microscopy, and other optical characterization methods. AFM allows 3D characterization of nanoparticles with sub-nanometer resolution.

Photonics

AFMs are ideal for the analysis of materials used in the photonics industry. Thus, it offers substantially better horizontal and vertical resolution than optical and stylus profilers.

Polymer Characterization

Atomic force microscopy is an ideal method for imaging polymers, imaging polymers blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM gives better resolution than optical microscopy and unlike in a scanning electron microscope, an AFM does not require coating the sample before imaging.

If you want to learn more about Atomic Force Microscopes (AFMs) applications or AFMWorkshop products, contact AFMWorkshop or one of our distribution partners. For more information, please visit https://www.afmworkshop.com.