Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Here’s How Atomic Force Microscope Can Help Students Develop Their Skills

AFMs for Educators

Educators generally have one or more of the following three objectives in mind when designing their AFM Education and Training programs for better students learning. The types of AFMs needed – and the dollar amount budgeted for their purchase – vary depending upon which objective the educator wants to accomplish.

For Students

Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments in all disciplines of science and engineering. There is a substantial and growing demand by students as well as professionals for AFM Education and training. AFMWorkshop has considerable advantages for both groups of learners.

Expose Students to the Nano World

Educators who fall within this category seek to expose students to an atomic force microscope by showing them what an AFM looks like and how it operates. Students learn that it is possible to create a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

This group of educators is focused on training students how to operate the AFM and how to use the instrument for measuring images of several types of samples. Students are exposed to the basic operation of the Atomic Force Microscope, including how the instrument scans and how the feedback control works. This educational experience prepares the student for operating AFM instruments in research and industrial environments. This training can last anywhere from one week to an entire semester.

Build Student Career Potential

Educators within this category seek to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments. Students will build their own AFMs and learn how to measure images on standard reference samples. A one week intensive 40-hour course can accomplish this group’s objective.

AFMWorkshop offers instrumentation and training materials to meet the demands of all three educational groups.

AFM Instrumentation

One of our most popular instruments used in educational settings is the TT-2 AFM. Because the TT-2 AFM is similar to 99% of the Atomic Force Microscopes used in research labs throughout the world, students can use skills developed on the TT-2 AFM to operate AFMs with more complex instrumentation.

On a TT-2 AFM, students learn how to operate all of the key modes such as contact, vibrating, lateral force, and phase modes. For example, the TT-2 AFM and AFMWorkshop were selected as instruments and trainers of choice by Hiroshi Yokoyama, Ph.D., director of Kent State University’s Glenn H. Brown Liquid Crystal Institute. To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

An Overview of Atomic Force Microscopy Workshops!

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope. AFMWorkshop offers both domestic (U.S.) and international (all others) packages for AFM installation and training.

International On-Site Installation and Training

For those AFMWorkshop customers outside of the USA electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

On-Site AFM Installation and Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Vibration Solutions – For High-Resolution Scanning!!

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause blurred or noisy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshophas designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Our Vibration Isolation Solutions filter out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A moderate structural vibration isolation is possible with the Passive Vibration Table. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Vibration Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations, and then electromechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee Option is that the Vibration Table top is more stable and more compact than a platform suspended with bungee cords.

Bungee Option

Placing the AFM on a platform suspended by bungee cords offers one of the best structural isolation platforms possible. Further, the Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations. The Bungee Options is designed to be used with the Acoustic Enclosure (AC-7859) Included with the option are a platform, and bungee cords, as well as associated metal support hooks.

Vibration Cabinet

The Acoustic chamber reduces vibrations transmitted through air. The enclosure is constructed from 3/4” HDPE and has 1” acoustic foam on its interior surfaces.

At the rear of the chamber is a sealed passage for wires and cables. The door of the chamber can be configured to open to the left or to the right.

On optional support table is available for the acoustic chamber. The optional support table has an opening at its back side that is 20.5”. The AFM system EBox can be stored inside the support table.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. AFMWorkshop can fabricate acoustic enclosures of almost any size and shape.

To learn more, feel free to visit www.afmworkshop.com or call at 1 (888) 671-5539.

Image Logger for TT-2 Atomic Force Microscope – An overview!

The Image Logger for the TT-2 AFM features the ability to view forward and reverse images for six channels, display real time oscilloscope-data logger for 6 channels and visualize the spectrum of the 6 data channels.

Image Logger Features

• View forward and reverse images for six channels
• Display real time oscilloscope-data logger for 6 channels
• Visualize the spectrum of the 6 data channels

A great advantage of an atomic force microscope is that it can capture several types of images. Each type of image reveals critical information about the surface topography or physical parameters.

Software

It is possible to display up to six channels from the Z feedback control loop in an atomic force microscope. These include:

• Z Error
• Z Drive (topography)
• Z Sensor
• Phase
• L-R (friction)
• Amplitude

Additionally, these channels may be displayed in the forward and reverse scan directions. With the data logger it is possible to display all six channels of data in the forward and reverse direction. This capability allows real time visualization of all channels.

Image Logger

The image logger simultaneously displays six image channels in forward and reverse directions. During scanning, the palettes and the histogram can be updated. Once a scan is completed, all twelve channel imagescan be saved.

Real Time Oscilloscope

Software for Focus Assist is integrated with the AFMControl software used on the TT-2 AFM. Using the software is easy. Simply focus the optical microscope on the probe, and then on the sample. Once this registration is completed, you can use the software to move directly to the sample, to the probe, or you can even have the optic follow the probe during probe approach.

Spectrum Analyzer

The spectrum of one input data channels can be displayed. Several types of windows and averaging algorithms may be applied to the incoming data stream. Identifying sources of unwanted vibrationsis possible with the spectrum analyser function.

AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Life Sciences Atomic Force Microscope – Perfect for Soft-Sample Applications

The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Electronics in the LS-AFM are constructed around industry standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimized with a 24-bit digital to analog converter. With the analog Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics.

24-bit scan DAC

Scanning waveforms for generating precision motion in the X-Y axis with the piezo scanners are created with 24-bit DACS driven by a 32-bit micro controller. With 24-bit scanning, the highest resolution Atomic Force Microscopesimages may be measured. Feedback control using the xy strain gauges assures accurate tracking of the probe over the surface.

Phase and Amplitude Detector Circuit

Phase and amplitude in the EBox are measured with highly stable phase and amplitude chips. The system can be configured to feedback on either phase or amplitude when scanning in vibrating mode.

Signal Accessible

At the rear of the EBox is a 50-pin ribbon cable that gives access to all of the primary electronic signals without having to open the EBox.

Precision Analog Feedback

Feedback from the light lever force sensor to the Z piezoceramic is made using a precision analog feedback circuit. The position of the probe may be fixed in the vertical direction with a sample-and-hold circuit.

Variable Gain High Voltage Piezo Drivers

An improved signal to noise ratio, as well as extremely small scan ranges are possible with the variable gain high voltage piezo drivers. The LS-AFM is used in biology applications in conjunction with an inverted optical microscope. Customers can buy the LS-AFM in two variations:

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

A brief overview of the TT-2 AFM Assembly Workshop

Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

TT-2 AFM Assembly & Operation Workshop

Attendees to this five day workshop build a TT-2 AFM atomic force microscope and learn how to operate it. Additionally, daily seminars provide attendees with training on the theory, operation and applications of an atomic force microscope. The workshop is primarily geared for customers who have purchased a TT-AFM Kit.

Each day begins with one to two hours of coursework followed by hands-on microscope assembly,testing and operation.

Attendees of the TT-2 AFM Assembly & Operation Workshop:

Are better able to operate, gain optimal performance, and obtain the best images from their TT-AFM.
Can repair the microscope whenever needed because they know the assembly process and all the parts used in its construction.
May easily modify their instrument to create unique instrumentation designed for their specific research applications.

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bioapplications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

Interested in joining our workshop?

Our upcoming TT-2 AFM assembly workshops:
June 24-28, 2019
Sept. 9-13, 2019

Visit www.afmworkshop.com and fill up the form to register yourself.

TT- Atomic Force Microscope Stage – An Overview!

Includes a stepper-motor-driven Z stage, LL-AFM force sensor, and precision X-Y stage. The stage does not include a piezo scanner or video optical microscope. Electrical connections are made at the back of the stage with a 60-pin ribbon cable connector.

Description

Model: MS-3230

The TT-AFM stage has the excellent thermal and mechanical stability required for high-resolution AFM scanning. Additionally, its open design facilitates user modification. This stage is designed to work with the AFMWorkshop Control Station including an Ebox and AFM Control software.

Features and Benefits of the TT-AFM Stage include

Rigid Frame Design

The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.

Light Lever AFM Force Sensor

Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.

Integrated Probe Holder/Probe Exchanger

Probe Exchange is made quick and easy with AFMWorkshop’s unique probe holder and clipping mechanism.

Direct Drive Z stage

A fast probe approach is possible because probe/sample angle alignment is not required. A linear motion stage is used to move the probe in a perpendicular motion to the sample.

Small Footprint

Requires little space and fit easily on a tabletop with stage dimensions of 7.5 x 12″.

Precision XY Stage with Micrometer

The sample can be moved without touch. The sample is moved relative to the probe with a precision XY micrometer stage.

Modes Electric Plug

Capabilities of the TT-AFM are dramatically expanded via a six pole electrical plug at the back of the stage

Laser/Detector Alignment

Laser/detector alignment is simplified via a direct view to both the light lever laser and the photo detector adjustment mechanism.

Video Optical Microscope

A high resolution video optical microscope is used for locating features on a surface, aligning the light lever force sensor, and facilitating probe approach. The video optical microscope includes an XY micrometer stage for moving the video microscope relative to the AFM probe.

Included with the Product

TT-AFM Stage
Video Optical Microscope
60 pin ribbon cable
USB cable
TT-AFM Manual

Besides this, AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, dunk and scan and environmental cell scanning options, and documentation packages for all AFM Workshop Products.

You can purchase a standalone AFM stage and customize it as per your requirements using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

Additional modes and accessories expand the capabilities of your microscope.

To learn more about atomic force microscope, visit www.afmworkshop.com

Vibration Solution Products to Avoid Fuzzy AFM Images

AFMs are quite susceptible to external vibrations, structural vibartions are transmitted through a building structure and acoustic vibrations are transmitted through air. Both acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope.

External vibration can degrade the resolution of scans by adding extra noise. Atomic force microscope vibration solutions offer a way to reduce external vibration that often causes fuzzy AFM images. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Vibration Isolation filters out unwanted acoustic structural vibrations that interfere with high-resolution scanning. Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform.

Below are some vibration solution products offered by AFMWorkshop:
– Passive Vibration Table
Passive Vibration Table is a moderate Vibration solution when ultimate AFM Performance is not necessary.
– Active Vibration Table
An Active Vibration Table uses a feedback control method for removing vibrations for a better quality of scans.
– Acoustic Cabinet
An acoustic cabinet reduces unwanted vibrations transmitted through air.
– Custom OEM vibration enclosure
Customized (OEM) Vibration enclosure is a scalable vibration solution for any Atomic Force Microscopy System.
–Bungee Option
A Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

Looking for the best atomic force microscope vibration solutions? If yes, feel free to get in touch with AFMWorkshop or visit https://www.afmworkshop.com/.

AFMWorkshop – A leading manufacturer for high value atomic force microscope

Being considered the leading manufacturer for high-value atomic force microscopes, AFMWorkshop works to design and manufacture high quality atomic force microscopes. Apart from this, it provides fundamental training to the customers. It ensures that the AFMs will run the application and in addition to this, the customer service provided by them is always there to help.

Looking for an atomic force microscope for research instruments? AFMWorkshop offers TT-2 AFM that includes an open architecture with unsurpassed flexibility. If you need a microscope for soft samples and biomaterials, LS-AFM is there for you at AFMWorkshop. Besides, if you are searching for a microscope for routine scanning and educational purposes, go for the newest model B-AFM.

AFMWorkshop offers in-house workshops as well as on-site training for each of their customers. They also offer tutorials on the website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education. They ensure that their customers are fully prepared to operate their AFM successfully.

Being one of the confident atomic force microscope
companies, AFMWorkshop ensures customer satisfaction. Additionally, it builds AFMs with price and resolution in mind in order to increase the accessibility of AFMs. Believe it or not, atomic force microscope education is important as it helps students to get exposed to an atomic force microscope by showing them what an AFM looks like and how it operates. I0t helps to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments.

Struggling to find the best atomic force microscope manufacturer? Look no further with AFMWorkshop. To learn more, feel free to visit https://www.afmworkshop.com.