AFMWorkshop Offers Matchless Customer Support and Technical Service to Its AFM Users

AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry/Process Development & Process Control; and Research/ Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Due to AFMWorkshop’s world-class AFM training program, our customers can usually troubleshoot and service their own AFMs. However, in the event that additional support is needed, AFMWorkshops’ Service Engineers are ready to help. We provide technical service via phone, email, live web training, remote internet access and operation of customer instruments, and on-site servicing.

All AFMWorkshop instruments come with a robust one-year warranty. As of April 1, 2016, North American customers receive a Two-Year Warranty with the purchase of their new AFM from AFMWorkshop. Extended time service contracts are also available for purchase.

AFMWorkshop provides the finest Customer Support and Technical Service. We are distinguished in the field of Atomic Force Microscopes by our 100% commitment to the scientists, educators and nanotechnology researchers using our products. With more than 30 years of experience designing and using AFM, STM & SPM technology, we’ve met thousands of users who’ve shared their collective frustrations with the typical neglect or wait times involved in service and support from most instrument companies. We strive to turn this collective frustration into a historical artifact.

AFMWorkshop has changed the paradigm for AFM instrument design, pricing and service. Our transparency and user-orientation means AFMWorkshop customers learn the intricacies and successful operation of their instruments and can produce world-class images.

To learn more about our Atomic Force Microscopy Services, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Standalone AFM- Flexible Enough to Scan All Sizes and Shapes of Samples

Because the probe on the SA-AFM extends below the stage structure the SA-AFM is capable of scanning all sizes and shapes of samples. The SA-AFM includes a direct drive Z approach motor, high resolution on axis video microscope, linearize pizo XYZ scanner, and an industry standard light lever.

Overview: Stand-Alone Atomic Force Microscope (SA-AFM)

Use the SA-AFM for scanning almost any size and shape of sample. The stage can sit on top of an inverted microscope, a large structure, or on the optional xy sample stage. This tip scanning unit has a linearized XY scan range of 40 microns, and two different Z ceramics: a 7-micron high resolution Z scanner, and a large motion 17-micron Z scanner.

Advanced Features of the SA-AFM Include:

• Flexible, standalone design
• Scans any sample size
• Adaptable to inverted microscopes
• Linearized xy piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorized probe approach
• Intuitive LabVIEW-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Advantages of using Atomic Force Microscopy for Nanoparticle characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nano meter resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include:

• Characterization of nanoparticles that are .5 nm in diameter and larger.
• Nanoparticle mixture distributions below 30 nm.
• Characterization of variable geometry nanoparticles.
• Direct visualization of hydrated nanoparticles/liquid medium.
• Characterization of nanoparticle physical properties such as magnetic fields.
• Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter

An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.

Nanoparticle Mixture Distributions below 30 nm

AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles

AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.

Hydrated Samples/Liquid Mediums

The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles

Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis

A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three-dimensional structure of the nanoparticles.

Why choose AFMWorkshop?

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications. For more details, feel free to visit http://www.afmworkshop.com Or call at 1 (888) 671-5539.

AFM Curriculum: An Introduction to The Instrumentation Of AFM

Atomic force microscopy curriculum is an introduction to the instrumentation of atomic force microscopes, including theory, design, and operation. Standard AFM scanning modes are covered including vibrating and non-vibrating modes.

Description

Written by Dalia Yablon, Ph.D., Surface Char.

Laboratory–Based Curriculum for Atomic Force Microscopy: Atomic force microscopy to make nanoscale material and topographic measurements of materials.

This comprehensive all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes that will be used in the labs: contact mode, tapping mode, and force spectroscopy.

Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing, using the freeware Gwyddion, is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and then analysis/questions for further discussion for each individual laboratory (the answers are provided in the accompanying Teacher Manual). Aside from the AFM instrument, no other material or parts are necessary!

Objectives

Learn the basic operating principles behind atomic force microscopy.

Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.

Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.

Conduct basic analysis on images, including statistics and cross-sectional measurements.

Target Audience Included in Curriculum Packet Laboratory Experiments

Undergraduates

This curriculum has been developed for undergraduate students in any science or engineering background: biology, chemistry, physics, materials science, mechanical engineering materials engineering, etc. Familiarity with freshman level mathematics and physics concepts is assumed, but all concepts and theory related to atomic force microscopy are explained.

Student Guide

30-page curriculum for students – Covers the background of advanced AFM operation, modes, and application. It then goes through a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.

Teacher Manual

Accompanying Teacher Manual – Accompaniment to student guide, assists teacher/teaching assistant to help students through labs. Includes answers to the pre-lab quiz and detailed answers with sample images to all the suggested analysis questions.

AFM Sample Kit

Samples – A series of 4 prepared, mounted samples ready to be inserted into the AFM instrument. Student guide curriculum guides the students through experiments on these samples.

AFM Probe Kit

Probes – A series of 8 probes of different spring constants to be used in the curriculum.

Measuring Roughness of Thin Films.

Measuring Compositional Heterogeneity of Everyday Materials.

Metrological Measurements.

Probing Mechanical Properties of a Substrate.

To learn more, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

What Are the Benefits of Attending AFM Workshops?

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bio applications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

TT-2 AFM Assembly Workshop
Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

Characterization of Polymer Materials – AFM Training
The two-day course on the application of atomic force microscopy on various materials, with an emphasis on polymer materials. Hands-on lab work mixed with lecture sessions gives participants a detailed understanding of the mechanisms involved. AFM is an essential tool for characterizing polymer structure, morphology, and other material properties.

Nanoparticle Characterization with Atomic Force Microscopy
Two-day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Advanced AFM Operation Techniques
This two-day AFM course mixes lectures with labwork on atomic force microscopy operation. While we will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, attendees with experience on any make or model of AFM instrument will find the labwork relevant and practical.

AFM Bioapplications
AFMWorkshop offers training for bio applications with Atomic Force Microscopes. Includes sample preparation, measuring Force Distance, imaging in liquid air.

Porto AFM Training Workshop
This is a training workshop, aimed at any researcher or scientist, who wants to learn about AFM or increase their knowledge of the technique. The course will include several hours of hands-on training in acquiring images with the atomic force microscope as well as AFM data processing.

Atomic force microscopes require training and education for optimal use. Without proper theoretical and operational training, users can run into frustration and problems with the AFM even if the issue is easily resolved. Training is an essential aspect of AFMWorkshop, as we want our customers to be fully prepared to have success using an atomic force microscope.

Our upcoming TT-2 AFM assembly workshop schedule is as follows:
• July 27-31, 2020
• October 19-23, 2020
To get yourself registered, visit www.afmworkshop.com Or call us at 1 (888) 671-5539.

Atomic Force Microscope Modes: An Overview

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. These include: Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.

Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM. AFMWorkshop instruments come with many options included.

Conductive AFM (C-AFM)

An option for the TT, NP and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Magnetic Force Microscopy (MFM)

Measures surface magnetic field by incorporating a magnetic probe into the AFM. MFM is used to generate images of magnetic fields on a surface, and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Advanced Force/Distance

Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor such surface parameters as: Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness. This advanced AFM module is flexible and enables many types of experiments.

Environmental Cell

Samples may be scanned in liquids as well as inert gases with the environmental cell. The cell is interchangeable with the TT-AFM probe holder while scanning.

Dunk and Scan Liquid Cell and Probe Holder for TT-AFM

A probe holder and open liquid cell for scanning samples submerged in liquids. The Dunk and Scan can directly replace the TT-AFM probe holder. To learn more about AFMWorkshop, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

AFM Workshop: A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 300 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS-AFM is the best option for scientists and researchers working with soft samples and biomaterials. Our newest model, the B-AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about AFMWorkshop and its products, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

B-AFM: A Compact and Portable Solution for Educators

The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.

Simplified Key Operational Steps

Aligning the AFM light lever

A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.

Exchanging probes

With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.

Exchanging samples

Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.

Key Components of the B-AFM

Video Optical Microscope

Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.

XY Sample Stage

The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.

Enclosure

Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.

Electronics

The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.

To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

Biology Applications Which Are Unique to Atomic Force Microscopes

Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are shown below.

Imaging Biomolecules
Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquid.

Double-stranded DNA Molecules
Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)
Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.
Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging cells
Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites
The Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells
Measurement of high-resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutant
The ability to image a very large number of cells allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally, the inverted microscope can be operated in epifluorescence mode.

Measuring Stiffness of Biomaterials at the Nanoscale
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
To learn more about our Atomic force microscopes, feel free to visit www.afmworkshop.com. Or call us at 1 (888) 671-5539

Atomic Force Microscopy Services Offered By Afm workshop

Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

Customer Support and Technical Service
AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry / Process Development & Process Control; and Research / Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Custom Engineering of Atomic Force Microscopes
AFMWorkshop’s open architecture allows the ultimate in flexibility and customization. We will work with you to make your instrumentation and application ideas a reality.

Instrumentation from the AFMWorkshop has an open design that allows customization of the products by its users.

Atomic Force Microscopes for OEMs
AFMWorkshop actively partners with OEMs. If your company needs an Atomic Force Microscope for a product and requires an AFM platform, we will work with you in customizing our instrumentation to your product requirements. Discounts on AFM instrumentation are available for volume purchases.

AFM Workshop Customers Area
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Need assistance?

Contact AFMWorkshop to inquire about atomic force microscope information and pricing, training, application help, customer support and technical service. Our customer service will assist with choosing the right atomic force microscope for your application needs, providing any documentation or help you may need to secure funding, as well as troubleshoot over the phone, by email, and by remote-viewing on the AFM computer. Our success is your success, so please don’t hesitate to contact us today.

To learn more about atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.