Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Here’s How Atomic Force Microscope Can Help Students Develop Their Skills

AFMs for Educators

Educators generally have one or more of the following three objectives in mind when designing their AFM Education and Training programs for better students learning. The types of AFMs needed – and the dollar amount budgeted for their purchase – vary depending upon which objective the educator wants to accomplish.

For Students

Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments in all disciplines of science and engineering. There is a substantial and growing demand by students as well as professionals for AFM Education and training. AFMWorkshop has considerable advantages for both groups of learners.

Expose Students to the Nano World

Educators who fall within this category seek to expose students to an atomic force microscope by showing them what an AFM looks like and how it operates. Students learn that it is possible to create a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

This group of educators is focused on training students how to operate the AFM and how to use the instrument for measuring images of several types of samples. Students are exposed to the basic operation of the Atomic Force Microscope, including how the instrument scans and how the feedback control works. This educational experience prepares the student for operating AFM instruments in research and industrial environments. This training can last anywhere from one week to an entire semester.

Build Student Career Potential

Educators within this category seek to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments. Students will build their own AFMs and learn how to measure images on standard reference samples. A one week intensive 40-hour course can accomplish this group’s objective.

AFMWorkshop offers instrumentation and training materials to meet the demands of all three educational groups.

AFM Instrumentation

One of our most popular instruments used in educational settings is the TT-2 AFM. Because the TT-2 AFM is similar to 99% of the Atomic Force Microscopes used in research labs throughout the world, students can use skills developed on the TT-2 AFM to operate AFMs with more complex instrumentation.

On a TT-2 AFM, students learn how to operate all of the key modes such as contact, vibrating, lateral force, and phase modes. For example, the TT-2 AFM and AFMWorkshop were selected as instruments and trainers of choice by Hiroshi Yokoyama, Ph.D., director of Kent State University’s Glenn H. Brown Liquid Crystal Institute. To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Vibration Solutions – For High-Resolution Scanning!!

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause blurred or noisy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshophas designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Our Vibration Isolation Solutions filter out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A moderate structural vibration isolation is possible with the Passive Vibration Table. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Vibration Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations, and then electromechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee Option is that the Vibration Table top is more stable and more compact than a platform suspended with bungee cords.

Bungee Option

Placing the AFM on a platform suspended by bungee cords offers one of the best structural isolation platforms possible. Further, the Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations. The Bungee Options is designed to be used with the Acoustic Enclosure (AC-7859) Included with the option are a platform, and bungee cords, as well as associated metal support hooks.

Vibration Cabinet

The Acoustic chamber reduces vibrations transmitted through air. The enclosure is constructed from 3/4” HDPE and has 1” acoustic foam on its interior surfaces.

At the rear of the chamber is a sealed passage for wires and cables. The door of the chamber can be configured to open to the left or to the right.

On optional support table is available for the acoustic chamber. The optional support table has an opening at its back side that is 20.5”. The AFM system EBox can be stored inside the support table.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. AFMWorkshop can fabricate acoustic enclosures of almost any size and shape.

To learn more, feel free to visit www.afmworkshop.com or call at 1 (888) 671-5539.

B-AFM: A Compact and Portable Solution for Educators

The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.

Simplified Key Operational Steps

Aligning the AFM light lever

A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.

Exchanging probes

With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.

Exchanging samples

Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.

Key Components of the B-AFM

Video Optical Microscope

Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.

XY Sample Stage

The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.

Enclosure

Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.

Electronics

The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.

To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscopy Services Offered By Afm workshop

Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

Customer Support and Technical Service
AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry / Process Development & Process Control; and Research / Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Custom Engineering of Atomic Force Microscopes
AFMWorkshop’s open architecture allows the ultimate in flexibility and customization. We will work with you to make your instrumentation and application ideas a reality.

Instrumentation from the AFMWorkshop has an open design that allows customization of the products by its users.

Atomic Force Microscopes for OEMs
AFMWorkshop actively partners with OEMs. If your company needs an Atomic Force Microscope for a product and requires an AFM platform, we will work with you in customizing our instrumentation to your product requirements. Discounts on AFM instrumentation are available for volume purchases.

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Need assistance?

Contact AFMWorkshop to inquire about atomic force microscope information and pricing, training, application help, customer support and technical service. Our customer service will assist with choosing the right atomic force microscope for your application needs, providing any documentation or help you may need to secure funding, as well as troubleshoot over the phone, by email, and by remote-viewing on the AFM computer. Our success is your success, so please don’t hesitate to contact us today.

To learn more about atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

AFMWorkshop – On-Site AFM Installation And Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

Unpack AFM
Set up AFM
Evaluate AFM site for acoustic and structural vibrations
Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

Changing samples
Changing probes
Aligning the light lever
Positioning the photo-detector
Selecting resonance (vibrating mode only)
Tip approach
Scanning
Optimizing GPID
High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about our AFM Installation Training programs, feel free to visit www.afmworkshop.com.

Why Understanding Atomic Force Microscope Theory Is Important

AFMs are essential instruments for nanoscale measurements and helps nanotechnology researchers in all disciplines of engineering and science. There is a considerable and increasing demand among students and professionals for AFM training and education. There are three levels of AFM training.

Introduce Nano world to students

Instructors who fall under this category wants to introduce learners to an AFM by showing them what it looks like and how it works. Here students learn how to enlarge the view of the surface with the help of the scanning tip. Usually few samples are visually represented during this training so that students can see nanometer sized features of a surface. Students are exposed to the AFM for a couple of hours in this group.

Provide training to students that want to operate an AFM

In this group, the motive of instructors is to train students on how to operate the AFM efficiently for measure different types of images. During this training, students learn the basic functions of the AFM, how the instrument scans, and the function of feedback control. Here students come to know how to operate AFM for both industrial and research laboratiries. The training can be as short as one week and can lasts a whole semester.

Prepare students for better career

The motive of instructors here is to prepare students to do well in their careers in the future in instrument design, customer service or applications development. In this group there are additional categories of researchers who aspire to repair and modify their own instruments. Here students build AFMs on their own and also learn to measure images on standard reference samples. It is a 40 hour intensive course that fulfills the requirments of this third group.

Are you the one who wants to include AFMs in your training programs?

If yes, you just need to browse through our website www.afmworkshop.com. We are 24/7 are here to assist you in any regard concerning your AFM queries.

Uses of Atomic Force Microscope in Life Sciences Applications

Do you think it’s not possible to measure biological samples on nano scale? Actually, Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are as follows.

Imaging Biomolecules

Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquids.

Double-stranded DNA Molecules

Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

High resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.

Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging Сells

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites

Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Measurement of high resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutants

The ability to image a very large number of cells, allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally the inverted microscope can be operated in epifluorescence mode.

Are you looking for a microscope that fulfills all your research needs? If yes, then choose AFMWorkshop to buy Atomic Force Microscopes. AFMWorkshop is a renowned name in atomic force microscope manufacturers; they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs.

For more information, feel free to visit https://www.afmworkshop.com.

AFMWorkshop Atomic Force Microscope Probes

Where Atomic Force Microscopy Probes are used? Atomic Force Microscopy Probes are used for all atomic force microscope applications, and are operated in vibrating (tapping), non-vibrating (contact), lithography, conductive and magnetic AFM, as well as force-distance scanning.

AFMWorkshop offers AFM probes from the largest international probe manufacturers at discounted prices. These probes are available to US customers that own AFMWorkshop products only. AFM Probes are nanofabricated using highly-doped single crystal silicon with unparalleled reproducibility, robustness, and sharpness, giving consistent high-quality AFM images.

ACLA AFM Probes

ACLA AFM Probes are designed for vibrating mode (non-contact, tapping mode, intermittent contact, and/or close contact) applications. Compatible with most commercially available SPMs/AFMs, ACLA probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities. This is a box of 10 probes.

SHOCONA Probes

SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.

For a more in-depth understanding of how AFM probes work, as well as some helpful AFM tips and pointers, you can get in touch with experts of AFMWorkshop. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy. They provide a closer look at their AFMs, including full demonstrations, introductory AFM videos and more.

AFMWorkshop designed the free Atomic Force Microscopy animated tutorials to help students and professionals learn AFM technology and how an Atomic Force Microscope works. They offer multiple AFM courses and AFM training opportunities: from building your own Atomic Force Microscope to learning advanced techniques and applications.

Important Features of the B-AFM

Are you planning to buy the best quality B-AFM? If yes, then get in touch with AFMWorkshop.

B-AFM offered by AFMWorkshop is the ideal option for scientists with bigger ideas because of genuine pricing. User-Friendly design makes the B-AFM best for teaching the basics of AFM theory and operation to the students. The B-AFM is designed to obtain AFM images without expertise.

AFMWorkshop provides a 100% money-back guarantee and if their AFMs can’t run your application, they will refund the full purchase price. The complete B-AFM system includes the AFM stage, electronics, enclosure, computer and software.

Some of the features of the B-AFM are:

Sample Stage

The sample stage has an XY translation range of 6 mm X 6 mm and is used to select an area of interest on a sample for scanning. The controls for the positioner are conveniently located on the surface of the B-AFM stage, and the magnetic sample holder makes exchanging samples easy and intuitive.

Video Optical Microscope

For locating features on samples, aligning the light lever, and facilitating the probe approach, an LED video optical microscope is used. This optical microscope is all an AFM user needs to start scanning with 200X zoom, adjustable focus, and an LED illumination light.

Exchanging Samples

At the top of the piezoelectric stage, there is the magnetic sample holder that makes sample exchange a routine process. Samples are mounted onto metal disks and easily placed on the magnetic sample holder.

Enclosure

The front-opening enclosure of the B-AFM reduces both structural and acoustic vibrations that can affect the quality of AFM scans. It is made with high-density material and lined on the inside with noise-reducing foam.

Exchanging Probes

There is a removable probe holder with a spring action clamp that allows probe exchange to be done easily within one minute. A probe holder support is provided to store the probe holder when it is not in the AFM.

To buy the best quality product, feel free to visit https://www.afmworkshop.com/.