AFM Vibration Isolation Solution: Active Vibration Table

Atomic Force Microscopes which are quite susceptible to external vibrations, are able to measure topographic images at resolutions below 0.1 nanometers. The external vibrations need to be reduced in order to obtain the highest-quality AFM images, particularly for high-resolution scanning.

Both acoustic and and structural vibrations degrade the resolution and overall performance of Atomic Force Microscopy Instrumentation. The acoustic vibrations can be reduced by placing the microscope in an acoustic isolation chamber. On the other hand, structural vibrations can be reduced by using a mechanical isolation platform such as an active vibration table.

The vibration isolation tables are designed to provide stable working conditions for devices that are sensitive to vibration and shocks. The table consists of an outer table frame that supports the main work surface which is not isolated from vibration and an inner table frame that is entirely separate and supports the inner isolated work surface. This ensures vibrations are not transmitted to the isolated inner work surface. An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations and then electromechanical transducers use the output of the sensors to control the motion of the tabletop.

The advantage of an Active Vibration Table over the Bungee option is that the Vibration Isolation Tabletop is more stable than a platform suspended with bungee cords. Other equipment that provide vibration isolation include vibration enclosures, bungee options, and custom/OEM enclosures.

This being said, bungee solutions are often better for structural vibration reduction than active vibration tables.

AFMWorkshop is a leading Atomic force microscope manufacturing company in the USA and at the global market. Our customers range from researchers and engineers at high-profile institutions to educators in high schools and community colleges. Our atomic force microscopes have a modular and open design, simplifying education and training as well as allowing adjustments tailored to specific research. Feel free to visit https://www.afmworkshop.com/ for more information. You can also reach out to us via phone (1 (888) 671-5539) and email (info@afmworkshop.com).

How to Reduce External Vibrations

Acoustic and structural vibrations affect the resolution and overall performance of an Atomic Force Microscope. External vibration can degrade the resolution of scans by adding extra noise. Even though AFMs are quite susceptible to external vibrations, they can measure topographic data at resolutions below 0.1 nanometers in a normal laboratory environement.

Atomic force microscope vibration solutions offer a way to reduce external vibration that often causes fuzzy AFM images. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures. Vibration Isolation solutions filter out unwanted acoustic and structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform.

Have a look at the vibration solution products offered by AFMWorkshop:

Bungee Option

Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

The Bungee Option is used in the Acoustic Enclosure. Such combination allows a comparatively cost-effective way reducing structural mechanical vibrations and Acoustical noises and obtaining better quality AFM images.

Passive Vibration Table

Passive Vibration Table is moderate Vibration solution when ultimate AFM Performance is not necessary.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations for a better quality of scans.

Vibration Cabinet

Vibration isolation is essential for high-resolution AFM scanning. Vibrations from buildings, tables, and external vibration can affect the resolution of scans by adding extra noise. To further reduce vibration, it is recommended a vibration isolation cabinet.

Custom OEM vibration enclosure

Customized (OEM) Vibration enclosure is a scalable vibration solution for any Atomic Force Microscopy System.

For the best atomic force microscope vibration solutions, feel free to get in touch with AFMWorkshop or visit https://www.afmworkshop.com/.

What Are The Unique Features Of The B-AFM?

B-AFM is the ideal option for educators that want to train students about AFM because of affordable pricing. A user-Friendly design makes the B-AFM best for teaching the basics of AFM theory and operation to the students. The B-AFM is designed to obtain AFM images without much training.

The complete B-AFM system includes the AFM stage, electronics, enclosure, computer and software. Have a look at some of the features of the B-AFM:

Video Optical Microscope

For locating features on samples, aligning the light lever, and facilitating the probe approach, an LED video optical microscope is used. This optical microscope is all an AFM user needs to start scanning with 200X zoom, adjustable focus, and an LED illumination light.

Sample Stage

The sample stage has an XY translation range of 6 mm X 6 mm and is used to select an area of interest on a sample for scanning. The controls for the positioner are conveniently located on the surface of the B-AFM stage, and the magnetic sample holder makes exchanging samples easy and intuitive.

Enclosure

The front-opening enclosure of the B-AFM reduces both structural and acoustic vibrations that can affect the quality of AFM scans. It is made with high-density material and lined on the inside with noise-reducing foam.

Exchanging Samples

At the top of the piezoelectric stage, there is the magnetic sample holder that makes sample exchange a routine process. Samples are mounted onto metal disks and easily placed on the magnetic sample holder.

Exchanging Probes

There is a removable probe holder with a spring action clamp that allows probe exchange to be done easily within one minute. A probe holder support is provided to store the probe holder when it is not in the AFM.

For the best quality B-AFM, get in touch with AFMWorkshop. They provide a 100% money-back guarantee and if their AFMs can’t run your application, they will refund the full purchase price.

To buy the best quality product, feel free to visit https://www.afmworkshop.com/.

LS-AFM for Life Science Applications

The LS- Atomic Force Microscope is designed specifically for life science applications when paired with an inverted optical microscope. This tip-scanning atomic force microscope includes everything required for AFM scanning: AFM stage, inverted optical microscope adaptation plate, EBox, manuals, cables, and AFM-Control Software.

Have a look at some of the features of LS-AFM:

A turnkey system with guaranteed results
No additional sample holding options required for most applications
Readily scan samples in ambient air and liquids
Zoom to feature with accurate positioning for F/D curves
Readily adaptable to new operating systems
Reduce time for probe exchange (& use any manufacturer’s probes)
Facilitates tip approach and laser alignment
Most common scanning modes included for life sciences applications

When an inverted optical microscope is required for locating cells or other bio-materials on a surface, the LS-AFM has a sample positoiner for glass slides and petri dishes. The LS-AFM can be purchased with the AFMWorkshop inverted optical microscope or it can be retrofitted to almost any inverted optical microscope.

LS-AFM APPLICATIONS

Measure the Stiffness of Biomaterials

LS-AFM can be used to monitor the deflection of a cantilever as it is pushed against sample resulting in a force/distance curve. From the force-distance curve, many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

Imaging Cells

Images of cells are easily scanned in both a liquid and dry environment with the LS-AFM. The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning.

The LS-AFM is a nanoscience instrument that‌ ‌may be purchased in two different configurations:

LS-AFM-A

In this configuration, AFMWorkshop fabricates a special plate that pairs the LS-AFM with the customer’s existing inverted optical microscope.

LS-AFM-B

This configuration of the LS-AFM includes a fully-featured inverted optical microscope.

Do you want to buy LS-AFMs? If yes, buy top quality LS-AFMs from AFMWorkshop. To learn more about the LS-AFM, feel free to visit https://www.afmworkshop.com.

Which AFM is best to Create New Instrumentation?

The TT-2 AFM is ideal for instrument builders that want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument.

Now, instrument innovators no longer have to face the decision to either create an entirely new AFM or to live with the limitations of commercial AFMs that have limited documentation and closed architecture.

Why choose TT-2 AFM?

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Therefore, TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics.

TT-2 AFM was created in AutoCAD and is included in the optional documentation package. Single parts in the microscope can be purchased if you need to modify a part for your needs. All parts are identified by part numbers on each mechanical drawing.

LabVIEW software screen for AFM

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The instrument control protocol for addressing functions such as Z feedback, XY scanning, and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

The technical guide is available for developers that include schematics to all electronics in the TT-2 AFM including photodetector board, piezoelectric control board, controller mainboard, and even the power supply board.

For more information, feel free to visit https://www.afmworkshop.com.

Modes of Atomic Force Microscope

Are you looking for high-quality atomic force microscopes? If yes, then you should choose AFMWorkshop. They provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase, and lateral force modes.

All AFMWorkshop atomic force microscopes include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes including Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes help to expand the capability of your atomic force microscope. These modes help to measure the conductivity, surface magnetic field, force curves, and manipulation of surfaces. Additional AFM modes and accessories expand the capabilities of your microscope.

AFMWorkshop instruments come with many options included. You can expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.

Know more about modes of AFM:

Conductive AFM (C-AFM)

C-AFM is an option for the TT, NP, and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.

Lithography

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Magnetic Force Microscopy (MFM)

MFM is used to generate images of magnetic fields on a surface and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM. Now, easily measure surface magnetic field by incorporating a magnetic probe into the AFM.

Advanced Force/Distance

This advanced AFM module is flexible and enables many types of experiments. Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor surface parameters such as Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.

To learn more, feel free to visit https://www.afmworkshop.com.

Choose AFMWorkshop to Buy Atomic Force Microscopes

When it comes to buying innovative Atomic Force Microscopes, researchers, educators, and engineers choose AFMWorkshop. Do you know why? Continue reading to know about AFMWorkshop Atomic Force Microscopes in detail.

Here are some of the reasons, why AFMWorkshop is the best choice:

Easily Add New Features

New features and options are developed often in the course of research. You can easily add new features to the AFM Workshop products. They offer a discount for products if they are able to develop a new feature. The feature can be offered for sale on their website, or shared with other customers on the Forum pages of their website.

Easy Customization

All instrumentation from the AFM Workshop allows customization of the products due to its open design. AFMWorkshop develops and manufactures innovative Atomic Force Microscopes for different fields. Furthermore, the AFM Workshop actively seeks collaborations with development labs, companies, and educational institutions.

Reasonable Prices

AFMWorkshop offer their products on their website and the products are manufactured and sold in reasonable volumes and prices.

OEM and VARs

If a company needs an AFM for a product and requires an AFM platform, they can work with them in customizing the instrumentation according to the product requirements. Furthermore, discount on instrumentation is available for volume purchases.

Teaching

If you would like to incorporate AFMWorkshop products into your teaching curriculum, they would be delighted to hear your ideas. They may be able to offer a discount for products that are used for teaching students about atomic force microscopes.

Contribution of AFM expertise

All the AFM Workshop employees have substantial experience with AFM design and instrumentation. They are willing to share the expertise to help you design new instrumentation or applications.

These are some of the reasons why you should choose AFMWorkshop to buy Atomic Force Microscopes. Indeed, AFMWorkshop is a renowned atomic force microscope manufacturer, they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs. For more information, feel free to visit https://www.afmworkshop.com.

How to Make Measurements on Biological Samples

When it comes to making measurements on biological samples at the nanoscale, Atomic force microscopes are used. In both ambient atmospheric conditions as well as liquid environments, AFM allows the nanoscale imaging of soft biomaterials including cells and DNA.

Have a look at the biology applications, unique to atomic force microscopes:

Double-stranded DNA Molecules

Imaging of DNA of size 5 µm x 5 µm can be done easily. Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

Imaging of Tobacco Mosaic Virus is commonly carried out in structural studies. Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces and placement of the microscope in an environment with minimal structural and acoustic vibrations. Furthermore, TMV is commonly used as an imaging standard since it has a highly conserved structure.

Parasites

Parasites of size 25 µm x 25µm can be measured in the air using AFM. These Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Epitheleal cell of size 32 µm x 32 µm can be measured in liquid using Atomic Force Microscope. Measurement of high-resolution images of cells in a liquid (e.g., under physiological conditions) is another possibility unique to AFM and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Recommended AFM products for life sciences applications are TT-2 Atomic Force Microscope and LS-Atomic Force Microscope. To buy high-quality Atomic Force Microscope, feel free to visit https://www.afmworkshop.com/.

An Insight into NP-AFM Capabilities

Looking for an Atomic Force Microscope to scan samples such as control computer, electronic box, microscope stage, probes, manuals, and a video microscope? If yes, then choose NP-AFM.

The NP-AFM is a reliable nanoprofiler tool, which includes everything for scanning samples such as microscope stage, probes, manuals, and a video microscope. Several stage options are available for many types of samples and samples as large as 200 x 200 x 20 mm is profiled by the NP-AFM system.

Have a look at NP-AFM capabilities:

One of the most powerful capabilities of the NP-AFM is visualizing the surface structure. Although not easily quantified, the surface texture of the lines on the 2 μm grating (at right) is readily visualized.
The NP-AFM is ideal for modes measurements, in addition to excelling in surface structure measurement.
Due to the flexible stage design of NP-AFM, fixtures can be created for holding almost any sample shape.
Semiconductors, glass, and metals with polished and machined surfaces are readily scanned with the NP-AFM.
The stage can hold many smaller samples that may then be imaged in a specific order.
Capable of accurately measure the dimensions of semiconductor and other micro-fabricated devices.
NP-AFM accommodates commercially available AFM probes and users can easily install specialized probes for metrology measurements.

High-Resolution Z Stage

Assuring optimal tip approach, the direct drive’s Z stage controls the motion down to 330 nm. Software controls for the Z stage rapidly move the light lever up and down and regulate the automated probe approach.

NP-AFM stage

The NP-AFM stage has excellent mechanical and thermal stability required for high-resolution AFM profiling. Furthermore, its open design facilitates user modification.

Sample Stage

The NP-AFM has numerous stage options, including a 2 x 3” manual stage with a resolution of 2 μm, and a sample stage for wafers and discs.

Video Microscope

The video microscope is essential for aligning the light lever laser, locating features for scanning, and facilitating tip approach.

Light Lever Force Sensor

The light lever force sensor can make measurements in standard modes, including lateral force, vibrating, non-vibrating, and phase mode.

Probe holder

A modular probe holder held in place with a spring clip can be used in the light lever force sensor. Probes can be replaced in less than two minutes with the NP-AFM’s probe exchange tool.

For more information, feel free to visit https://www.afmworkshop.com.

Different Types of Atomic Force Microscopes

As common these days, science has become increasingly reliant on Atomic Force Microscope (AFM). With help of AFM, researchers are focusing on the tiny particles that help to conduct research on misfolding diseases such as diabetes and tuberculosis. There are many achievements and progresses achieved by these microscopes. Some of the reliable Atomic Force Microscopes include:

B-AFM

The B-AFM is a complete system for routine scanning and education. B-AFM includes a computer with software, control electronics, and a stage; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage.

The B-AFM has everything you need to perform routine scanning on a variety of samples for scientists and engineers with bigger ideas. Due to an intuitive design, this nanoscience instrument is ideal for education. The Basic Atomic Force Microscope is built with high quality material and it is the best option for scientists looking for routine sample scanning.

TT-2 AFM

TT-2 AFM is a second-generation tabletop Atomic Force Microscope and has all the important features and benefits expected from a light lever AFM.

TT-2 AFM can be used in many different fields. The Nanotechnology engineers/researchers, those want to do routine scanning of nano-structures can use the TT-2 AFM. Instrument innovators can use AFM as a platform to create a new instrument and educators can teach students about AFM construction, operation, and applications.

The TT-2 AFM Stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

NP-AFM

The NP-AFM is a nano-profiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

The NP-Atomic Force Microscope is a complete nano-profiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.

LS-AFM

When an inverted optical microscope is required for locating cells or other biomaterials on a surface, the LS-AFM is used in life sciences applications. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Once the LS-AFM is paired with an inverted optical microscope, it becomes tip-scanning atomic force microscope designed specifically for life science applications. This product includes everything required for AFM scanning: AFM stage, cables, inverted optical microscope adaptation plate, EBox, manuals, and AFM-Control Software.

SA-AFM

For large samples and industry, the Standalone AFM is a flexible AFM for scanning all sizes and shapes of samples. It can be easily integrated with all manufacturers’ inverted microscopes.

To buy high-value atomic force microscopes, you can choose AFMWorkshop, renowned atomic force microscope manufacturers. They offer a wide variety of Atomic Force Microscopes (AFM’s) to suit your research needs. For more information, feel free to visit https://www.afmworkshop.com.