High Resolution Atomic Force Microscope – Advanced Yet Affordable AFM for Researchers

The HR AFM is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. It is ideal for researchers that need to visualize and measure nanometer or sub-nanometer sized surface features.

Key Features and Benefits of the HR AFM

Low Noise Floor

With a noise floor of 35 picometers, the HR Atomic Force Microscope is capable of measuring samples with features from nano-meters to microns.

Kinematic Tip Approach

A stable kinematic design for probe approach is used in the HR AFM. An optional direct drive approach is available.

Research Grade Top View Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software

The HR AFM uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the HR AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Large Light Lever Adjustment Range

Because the HR AFM has a large adjustment range of the laser and photodetector, probes from all major manufacturers can be used.

Side View Optic

Directly view the tip to surface distance with the side view optic.

Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with flexible scanning software developed in Lab VIEW.

To learn more about AFMWorkshop and our Atomic Force Microscope’s Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Has Developed A Reputation of Being the Leading Manufacturer for High-Value Atomic Force Microscopes

We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For ultimate performance, our HR-AFM is highly stable with ultra-low noise levels. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. The B AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

Introduction to the Atomic Force Microscope

The working principle of the Atomic Force Microscope (AFM) is based on the forces that arise when a sample surface is scanned with a nanometer-sized tip (a few to 10s of nm) attached to a cantilever.

The advancement of the AFM over traditional stylus surface profilers is that the former uses a feedback loop to control the forces between the surface and probe. Because the forces are controlled, very small probes may be used, and not broken while capturing an image.

AFMWorkshop products all include 5 standard modes. There are two primary modes used for measuring the topography of a sample, which are contact mode and vibrating mode. Lateral Force and Phase modes offer surface material contrast. Finally Force-Distance (F/D) curves measure the interaction forces between a probe and surface.

Contact Mode:

The probing tip is in contact with the surface throughout the imaging in contact mode. The short-range forces between the surface and tip cause the deflection of the cantilever, which is recorded to generate the topographical image of the surface. However, the tip-surface contact in this mode can potentially damage the surface or wear the tip. Hence, this mode may not be suitable for imaging of soft surfaces. On the other hand, continuous contact with the surface allows identifying other features such as friction (lateral force imaging) or stiffness/elasticity map of the surface (force modulation imaging).

Vibrating Mode:

In this mode, a probe at the end of a cantilever is vibrated up and down. As the vibrating probe begins to interact with a surface, the vibration amplitude is dampened. The amount of damping is proportional to the amount of force placed on the surface by the probe on each oscillation of the vibrating probe. A feedback loop is used to maintain a fixed vibration amplitude as the probe is scanned across a surface. Forces between the probe and surface in vibrating mode can be as low as a few 10’s of piconewtons.

Phase Imaging:

A phase difference between oscillation of the cantilever and of the signal that drives cantilever oscillation (for example, by a piezoelectric crystal) is measured and visualized in phase imaging.There is no phase contrast when the surface is homogenous, or when there is no interaction between the tip and surface (i.e., the cantilever is well above the surface). However, if specific regions of the surface have distinct mechanical properties, that can be captured with phase imaging. This is because the cantilever loses a different amount of energy as probe taps to surface areas with differing mechanical properties. Hence, phase imaging is helpful to detect variations in mechanical properties such as friction, adhesion, and viscoelasticity on surfaces. It can also be used to detect patterns of various materials such as polymers on the surface or to identify contaminants that cannot be distinguished with topography imaging.

Lateral Force Mode:

In lateral force or frictional force microscopy, lateral deflections of the cantilever, arising due to forces parallel to the plane of the sample surface such as friction force, are measured. This allows detecting inhomogeneities on the material which gives rise to variations in surface friction, or to measure the friction properties of a sample at the nanometer level.

Force-Distance Mode:

A force-distance curve is measured in contact mode. To measure an F/D curve the probe at the end of a cantilever is pushed into the surface of a sample. Once the probe begins to interact with the sample, the cantilever bends. The inbound part of a F/D curve is the deflection of the cantilever when the probe is being pushed into the sample, and the outbound corresponds to when the probe and sample are moving apart.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Offers Matchless Customer Support and Technical Service to Its AFM Users

AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry/Process Development & Process Control; and Research/ Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Due to AFMWorkshop’s world-class AFM training program, our customers can usually troubleshoot and service their own AFMs. However, in the event that additional support is needed, AFMWorkshops’ Service Engineers are ready to help. We provide technical service via phone, email, live web training, remote internet access and operation of customer instruments, and on-site servicing.

All AFMWorkshop instruments come with a robust one-year warranty. As of April 1, 2016, North American customers receive a Two-Year Warranty with the purchase of their new AFM from AFMWorkshop. Extended time service contracts are also available for purchase.

AFMWorkshop provides the finest Customer Support and Technical Service. We are distinguished in the field of Atomic Force Microscopes by our 100% commitment to the scientists, educators and nanotechnology researchers using our products. With more than 30 years of experience designing and using AFM, STM & SPM technology, we’ve met thousands of users who’ve shared their collective frustrations with the typical neglect or wait times involved in service and support from most instrument companies. We strive to turn this collective frustration into a historical artifact.

AFMWorkshop has changed the paradigm for AFM instrument design, pricing and service. Our transparency and user-orientation means AFMWorkshop customers learn the intricacies and successful operation of their instruments and can produce world-class images.

To learn more about our Atomic Force Microscopy Services, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

On-Site AFM Installation and Training Facilitates Optimal Installation and Function of Your New AFM

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site AFM Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope.

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

• Unpack AFM
• Set up AFM
• Evaluate AFM site for acoustic and structural vibrations
• Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

• Changing samples
• Changing probes
• Aligning the light lever
• Positioning the photodetector
• Selecting resonance (vibrating mode only)
• Tip approach
• Scanning
• Optimizing GPID
• High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about AFM Installation Training, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Here’s How Atomic Force Microscope Can Help Students Develop Their Skills

AFMs for Educators

Educators generally have one or more of the following three objectives in mind when designing their AFM Education and Training programs for better students learning. The types of AFMs needed – and the dollar amount budgeted for their purchase – vary depending upon which objective the educator wants to accomplish.

For Students

Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments in all disciplines of science and engineering. There is a substantial and growing demand by students as well as professionals for AFM Education and training. AFMWorkshop has considerable advantages for both groups of learners.

Expose Students to the Nano World

Educators who fall within this category seek to expose students to an atomic force microscope by showing them what an AFM looks like and how it operates. Students learn that it is possible to create a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

This group of educators is focused on training students how to operate the AFM and how to use the instrument for measuring images of several types of samples. Students are exposed to the basic operation of the Atomic Force Microscope, including how the instrument scans and how the feedback control works. This educational experience prepares the student for operating AFM instruments in research and industrial environments. This training can last anywhere from one week to an entire semester.

Build Student Career Potential

Educators within this category seek to prepare students for a career in instrumentation design or instrument customer service. This is accomplished in part by helping students understand the design and construction of an Atomic Force Microscope. This group may include an additional category of researchers who intend to modify or repair their own instruments. Students will build their own AFMs and learn how to measure images on standard reference samples. A one week intensive 40-hour course can accomplish this group’s objective.

AFMWorkshop offers instrumentation and training materials to meet the demands of all three educational groups.

AFM Instrumentation

One of our most popular instruments used in educational settings is the TT-2 AFM. Because the TT-2 AFM is similar to 99% of the Atomic Force Microscopes used in research labs throughout the world, students can use skills developed on the TT-2 AFM to operate AFMs with more complex instrumentation.

On a TT-2 AFM, students learn how to operate all of the key modes such as contact, vibrating, lateral force, and phase modes. For example, the TT-2 AFM and AFMWorkshop were selected as instruments and trainers of choice by Hiroshi Yokoyama, Ph.D., director of Kent State University’s Glenn H. Brown Liquid Crystal Institute. To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Advantages of Atomic Force Microscopes in the Pharmaceutical Industry

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) techniques are traditionally used for measuring nanoscale images of samples in the pharmaceutical industry, and these techniques can be costly. The AFM offers an alternative to these traditional imaging techniques by its inherent properties:

• Three-dimensional topography is measured with the AFM, directly revealing surface textures.
• AFM provides nanoscale resolution in surface imaging.
• AFM requires only minimal sample preparation.
• AFM obtains images in ambient air or liquids and does not require large vacuum chambers. This could be critical for testing the effects of an environmental condition to a drug or delineating the behaviour of the sample, such as a cell or a therapeutic, under physiological conditions.
• Images of very smooth, flat materials are readily determined with AFM.
• TheAtomic Force Microscopeis the only imaging technique to provide mechanical information on the surface.
• The cost of acquisition and ownership of an AFM is a fraction of an SEM.

What roles can Atomic Force Microscopes play in the pharmaceutical industry?

• Analysis of crystal structure and growth for drug compounds.
• Characterization of biological materials at the nanoscale.
• Measurement of molecular interaction parameters at a nanometer spatial resolution.
• Obtaining tertiary and quaternary structural information from proteins.
• Evaluation of morphological characteristics of polymers, nanoparticles, and other materials used in drug delivery.
• Quantification of the individual active pharmaceutical ingredient (API)-excipient interaction across different conditions.
• Identification of the surface properties of powdered excipients, colloids, microbiological systems and implants.
• Visualization of homogeneity of dispersions at a molecular level.
• Monitoring structural changes in any living & non-living material.

To learn more about our Atomic Force Microscope Usesand its price,please visit www.afmworkshop.com or call at 1 (888) 671-5539.

An Overview of Atomic Force Microscopy Workshops!

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope. AFMWorkshop offers both domestic (U.S.) and international (all others) packages for AFM installation and training.

International On-Site Installation and Training

For those AFMWorkshop customers outside of the USA electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

On-Site AFM Installation and Training

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Vibration Solutions – For High-Resolution Scanning!!

Atomic force microscope vibration solutions offer a way to reduce external vibration that often cause blurred or noisy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshophas designed a variety of proven options for vibration isolation including: vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Our Vibration Isolation Solutions filter out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFMWorkshop.

Passive Vibration Table

A moderate structural vibration isolation is possible with the Passive Vibration Table. This product is ideal if the AFM location has few structural vibrations and when ultimate AFM performance is not necessary. The Passive Vibration Table may be used in the acoustic isolation cabinet.

Active Vibration Table

An Active Vibration Table uses a feedback control method for removing vibrations. An acceleration sensor measures vibrations, and then electromechanical transducers use the output of the sensors to control the motion of the table top. The advantage of an Active Vibration Table over the Bungee Option is that the Vibration Table top is more stable and more compact than a platform suspended with bungee cords.

Bungee Option

Placing the AFM on a platform suspended by bungee cords offers one of the best structural isolation platforms possible. Further, the Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations. The Bungee Options is designed to be used with the Acoustic Enclosure (AC-7859) Included with the option are a platform, and bungee cords, as well as associated metal support hooks.

Vibration Cabinet

The Acoustic chamber reduces vibrations transmitted through air. The enclosure is constructed from 3/4” HDPE and has 1” acoustic foam on its interior surfaces.

At the rear of the chamber is a sealed passage for wires and cables. The door of the chamber can be configured to open to the left or to the right.

On optional support table is available for the acoustic chamber. The optional support table has an opening at its back side that is 20.5”. The AFM system EBox can be stored inside the support table.

Custom/OEM vibration enclosure

Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. AFMWorkshop can fabricate acoustic enclosures of almost any size and shape.

To learn more, feel free to visit www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop – A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 250 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design

AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. . Our newest model, The B AFM, is useful for routine scanning and educational purposes, and our latest model, the HR-AFM AFM has been designed from the ground up for ultra-low noise, highest-possible resolution imaging. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee

AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training

About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education

AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, andengineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

For more details about AFM Workshop Products and its services, please visit www.afmworkshop.com or call at 1 (888) 671-5539.