Atomic Force Microscope Vibration Solutions Help Obtain the Highest-Quality AFM Images

Atomic force microscope vibration solutions offer a way to reduce external vibration that often causes fuzzy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Vibration Isolation Our Solutions filters out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFM Workshop.

Passive Vibration Table
Passive Vibration Table is a moderate Vibration solution when ultimate AFM Performance is not necessary.

Active Vibration Table
An Active Vibration Table uses a feedback control method for removing vibrations for a better quality of scans.

Bungee Option
Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

Bungee Option is an additional Vibration Solution for Acoustic Enclosure. Such combination allows in a comparatively cost-effective way reducing structural mechanical vibrations and Acoustical noises and obtaining better quality AFM pictures and scans.

Vibration Cabinet
Vibration isolation is essential for high-resolution AFM scanning. Vibrations from buildings, tables, and external vibration can affect the resolution of scans by adding extra noise. To further reduce vibration, we recommend a vibration isolation cabinet.

Custom/OEM vibration enclosure
Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. To learn more, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Atomic Force Microscopy Webinars – An Overview

Atomic force microscope webinars are pre-recorded video sessions with our AFM Experts, covering a range of topics from image processing and sample preparation to the advantages and disadvantages of AFM. Learn how to gain the best performance from your atomic force microscope with instructional videos on the best operating practices and techniques of AFM.

Gain the Best Performance from Your AFM with the help of the following webinars:

AFM Image Processing

Getting the most from your AFM requires effective utilization of image processing software. This video recording of a live-streaming seminar covers how to level, display, and analyze images with AFM image processing software. The demonstration will utilize Gwyddion’s open-source software.

AFM Sample Preparation

With Peter Eaton Ph.D.

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this video recording from a live-streaming seminar.

AFM Probe Selection
AFM operators must choose from a wide array of probe types when scanning samples. This video recording from a live streaming AFM seminar covers the probe types that work best for different types of samples.

AFM Performance Vs. Price

AFMWorkshop is the only Atomic Force Microscopy company offering a complete product line of AFMs that balance performance with price. This seminar reviews AFMWorkshop’s high-value product line and includes a demonstration.

TT-AFM Demonstration

Livestreaming demonstration of the TT-AFM, a popular and versatile atomic force microscope for researchers, educators, and engineers. This 40-minute demonstration highlights the TT-AFM’s wide variety of functions and applications. With a sale price starting at $32,275, the TT-AFM’s quality and success in research and business applications are unparalleled within atomic force microscopy.

To learn more about AFMWorkshop and its Free Atomic Force Microscopy Webinars, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

TT-2 Atomic Force Microscope – Capable of Measuring Samples with Features from Nano-Meters to Microns

This compact, second-generation high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software
The TT-2 uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range
Because the TT-2 Atomic Force Microscopehas a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications of TT-2 AFM:

Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More

Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshopfacilitates instrument innovation with an open architecture. Read More

Education
With its open design, the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

With high resolution as low as 0.08 nanometers, these atomic force microscopes offer the highest performance to price ratio in the industry. Our AFMs are the best for Education and Career Transformation, Biology, Medicine, and other Life Sciences, Nano-Profiling, nanoparticle characterization as well as for highly-demanding applications across all nano industries.

To learn more about AFMWorkshop and our Atomic Force Microscopes Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM

The atomic force microscopy curriculum is an introduction to the instrumentation of atomic force microscopes, including theory, design, and operation. Standard AFM scanning modes are covered including vibrating and non-vibrating modes.

This comprehensive all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes that will be used in the labs: contact mode, tapping mode, and force spectroscopy.

Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing, using the freeware package Gwyddion, is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and then the Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM.

Analysis/questions for further discussion for each individual laboratory (the answers are provided in the accompanying Teacher Manual). Aside from the AFM instrument, no other material or parts are necessary!

Objectives

• Learn the basic operating principles behind atomic force microscopy.
• Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.
• Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.
• Conduct basic analysis on images, including statistics and cross-sectional measurements.

Undergraduates

This curriculum has been developed for undergraduate students in any science or engineering background: biology, chemistry, physics, materials science, mechanical engineering materials engineering, etc. Familiarity with freshman level mathematics and physics concepts is assumed, but all concepts and theory related to atomic force microscopy are explained.

Student Guide

30-page curriculum for students – Covers the background of advanced AFM operation, modes, and application. It then goes through a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.

Teacher Manual

Accompanying Teacher Manual–This accompaniment to the student guide assists teacher/teaching assistant to help students through labs. It includes answers to the pre-lab quiz and detailed answers with sample images to all the suggested analysis questions.

AFM Sample Kit

Samples – A series of 4 prepared and mounted samples which are supplied ready to be inserted into the AFM instrument. The student guide curriculum guides the students through experiments on these samples.

AFM Probe Kit

Probes – A series of 8 probes of different spring constants to be used in the curriculum.

Labs include:
• Measuring Roughness of Thin Films
• Measuring Compositional Heterogeneity of Everyday Materials
• Metrological Measurements
• Probing Mechanical Properties of a Sample

To learn more, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.

Advantages Of Using AFMs For Nanoparticle Characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include

Characterization of nanoparticles that are .5 nm in diameter and larger.
Nanoparticle mixture distributions below 30 nm.
Characterization of variable geometry nanoparticles.
Direct visualization of hydrated nanoparticles/liquid medium.
Characterization of nanoparticle physical properties such as magnetic fields.
Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter
An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.
Nanoparticle Mixture Distributions below 30 nm
AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles
AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.
Hydrated Samples/Liquid Mediums
The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles
Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis
A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three dimensional structure of the nanoparticles.

To learn more about AFM analysis of nanoparticles, feel free to visit http://www.afmworkshop.com.

Education and Training With AFMWorkshop AFMs

Atomic Force Microscopes facilitate nanotechnology developments in all disciplines of science and engineering. There is an extensive and growing demand by students and professionals for AFM education and training.

Here are three types of students that AFMWorkshop products can be used for educating:

Exposure to the Nano World

Educators want to expose students to an atomic force microscope by showing them what an AFM looks like and how AFM operates. Most of the students learn that it is feasible to produce a magnified view of a surface with a scanning tip. Typically, a few samples are imaged during this exposure time so that students directly see the nanometer-sized features on a surface. In this group, students are generally exposed to the AFM for a few hours.

Train Students to Operate an AFM

Educators focused on training students to operate the AFM and to use the instrument for measuring images of several types of samples. Students are shown the basic Atomic Force Microscope operation, including how the feedback control works and how the instrument scans. This educational experience helps students that want to operate AFM instruments in industrial and research environments. This training can last from one week to an entire semester.

Career Options in AFM Design and Service

Educators focus to prepare students for a career in instrumentation design or instrument customer service. This is accomplished by helping students learn the design and construction of an Atomic Force Microscope. This includes an additional category of researchers who intend to repair or modify their own instruments. Students build their own AFMs and learn how to measure images on standard reference samples. A one-week intensive 40-hour course of AFMs can accomplish the objective of this group.

Are you looking for top quality atomic force microscope? If so, get in touch with AFMWorkshop. AFMWorkshop guarantees their AFMs will run your application, and their customer service is always available to assist.

AFMWorkshop has experience of many years in manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and used in a wide variety of applications.

For more information, feel free to visit https://www.afmworkshop.com.

All the Basics You Need to Know About Standalone AFM

For scanning all sizes and shapes of samples, SA-AFM is a flexible AFM. It is easy to integrate SA with inverted microscopes. SA-AFM is affordable and complete Atomic Force Microscopy system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research.

Why use SA-AFM?

There are many benefits of using SA-AFM and some of them are given below:

Any sized sample can be scanned due to open frame design
Allows scanning small samples as it includes a bottom plate
Reduce time for probe exchange as probe exchange tool is included
Facilitates tip approach and laser alignment as it includes top view video microscope
Most common scanning modes included for many applications including vibrating, non-vibrating, phase, LFM, and advanced F/D
Can be used with most commercially available probes due to the flexible sample holder
Readily adaptable to new operating systems due to Labview software with USB communication

All standard scanning modes are included with the system using the industry standard light lever force sensor. While non-vibrating mode can be used for routine scanning, the vibrating mode is used for high resolution and soft samples.

The control software of SA-AFM is written in LabVIEW making it simple and intuitive to use and operate. Differing windows walk users through the process: a scanning window aids in acquiring images, a force position window measures force distance curves, a pre-scan window helps align the AFM probe, and finally, a system window assists in altering system parameters.

The SA-AFM is an ideal instrument for modes measurements, along with measuring the surface structure. If you want to use the SA-AFM System for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research, then get in touch with AFMWorkshop.

AFMWorkshop’s SA-AFM is a complete Atomic Force Microscopy (AFM) system and includes everything required for scanning all sizes and shapes of samples. To learn more, feel free to visit https://www.afmworkshop.com.

Different Types of Atomic Force Microscopes

As common these days, science has become increasingly reliant on Atomic Force Microscope (AFM). With help of AFM, researchers are focusing on the tiny particles that help to conduct research on misfolding diseases such as diabetes and tuberculosis. There are many achievements and progresses achieved by these microscopes. Some of the reliable Atomic Force Microscopes include:

B-AFM

The B-AFM is a complete system for routine scanning and education. B-AFM includes a computer with software, control electronics, and a stage; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage.

The B-AFM has everything you need to perform routine scanning on a variety of samples for scientists and engineers with bigger ideas. Due to an intuitive design, this nanoscience instrument is ideal for education. The Basic Atomic Force Microscope is built with high quality material and it is the best option for scientists looking for routine sample scanning.

TT-2 AFM

TT-2 AFM is a second-generation tabletop Atomic Force Microscope and has all the important features and benefits expected from a light lever AFM.

TT-2 AFM can be used in many different fields. The Nanotechnology engineers/researchers, those want to do routine scanning of nano-structures can use the TT-2 AFM. Instrument innovators can use AFM as a platform to create a new instrument and educators can teach students about AFM construction, operation, and applications.

The TT-2 AFM Stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

NP-AFM

The NP-AFM is a nano-profiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

The NP-Atomic Force Microscope is a complete nano-profiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.

LS-AFM

When an inverted optical microscope is required for locating cells or other biomaterials on a surface, the LS-AFM is used in life sciences applications. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Once the LS-AFM is paired with an inverted optical microscope, it becomes tip-scanning atomic force microscope designed specifically for life science applications. This product includes everything required for AFM scanning: AFM stage, cables, inverted optical microscope adaptation plate, EBox, manuals, and AFM-Control Software.

SA-AFM

For large samples and industry, the Standalone AFM is a flexible AFM for scanning all sizes and shapes of samples. It can be easily integrated with all manufacturers’ inverted microscopes.

To buy high-value atomic force microscopes, you can choose AFMWorkshop, renowned atomic force microscope manufacturers. They offer a wide variety of Atomic Force Microscopes (AFM’s) to suit your research needs. For more information, feel free to visit https://www.afmworkshop.com.