For visualizing nanostructures and making measurements at the nano scale, atomic force microscopes (AFM) are an essential tool. AFMs are routinely used by scientists and researchers throughout the world to visualize surface structure and to make dimensional measurements.

Atomic Force Microscopes have a wide range of applications in physical sciences, life sciences and all disciplines of engineering. Here are a few of the common applications for atomic force microscopes:

Nanotechnology

Nanotechnology is an almagum of all disciplines of science and engineering, Atomic Force Microscopes are key nanoscale measurement instruments facilitating nanotechnology developments.  Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and more.

Life Sciences

AFMs are effective tool for scanning biological samples that are not possible to scan with any other type of microscope. Biomaterials, cells, and other soft samples can be scanned by AFMs in ambient air as well as liquids.  Besides measuring 3-D images an afm can measure parameters including stiffness and adhesion.

Process Development/Control

Atomic force microscope is finding acceptance for evaluating samples for process development, and to control a process. Accuracy and precision can be assured by using standard measurement protocols and qualified probe tips. AFM measurements used in process control are typically made repetitively.

Instrument Innovation

Atomic force microscopes are ideal for instrument builders and engineers. They can be used as a platform for creating new instrumentation, such as new imaging modes. AFM can also be used in combination with another analytical instrument such as a mass spectrometer, nanoindenter, and IR spectrometer.

Nanoparticles

Atomic force microscopy can be used for Nanoparticle characterization. Often with an AFM information is gained that cannot be measured with dynamic light scattering, electron microscopy, and other optical characterization methods. AFM allows 3D characterization of nanoparticles with sub-nanometer resolution.

Photonics

AFMs are ideal for the analysis of materials used in the photonics industry. Thus, it offers substantially better horizontal and vertical resolution than optical and stylus profilers.

Polymer Characterization

Atomic force microscopy is an ideal method for imaging polymers, imaging polymers blends, and polymer composites with nanometer lateral resolution. For polymer applications, the AFM gives better resolution than optical microscopy and unlike in a scanning electron microscope, an AFM does not require coating the sample before imaging.

If you want to learn more about Atomic Force Microscopes (AFMs) applications or AFMWorkshop products, contact AFMWorkshop or one of our distribution partners. For more information, please visit https://www.afmworkshop.com.