Magnetic Force Microscopy – Description, Specifications And More

This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.

Description
Model: LITHO

This Lithography Software Option is used for nanolithography. That is, the AFM’s probe is used to alter the physical or chemical properties of the surface.

The software uses a script of commands to move the probe in a pre-determined pattern over a surface. The two commands are: “movement” and “hold”. During a movement and hold command, the voltage and force on the probe can be varied.A MOVEMENT command consists of 5 numbers (no letters) separated by commas:

They represent X, Y, Velocity, Setpoint%, and Z_DAC voltage
 X and Y are the coordinates in micron from the image plot.
 Velocity is the speed from one point to the next listed point in nm/sec.
 Setpoint% is the percent value of the existing setpoint.
 Z_DAC voltage is a voltage in the range of 0 to +5V which may be applied to the probe.

A HOLD command consists of 3 numbers (no letters) separated by commas:

They represent Setpoint%, Z_DAC voltage, and Delay Time (ms)

 Setpoint% is the percent value of the existing setpoint.
 Z_DAC voltage is a voltage in the range of 0 to +5V which may be applied to the probe.
 Delay time(ms) is the time in milliseconds that the probe is held in its present position.

A scripting file is a text file that may be created with any program capable of outputting a .txt file. Each motion of the probe required to create the pattern must be added to the .txt file. Complex patterns may be created using a large number of movement and hold commands.
As with all AFMWorkshop software products, this software option is created using VI’s in a LabVIEW™ environment and is integrated with the AFM Control software. The VI’s used to create the software are available to customers who want to modify the lithography software and create new capabilities.

Software

The lithography software window allows a user to load a scripting file. Once loaded, the pattern that will be made is displayed in an image window. When the start button is pressed, the script is implemented and the specifics of each step are listed in the window. A green light is displayed when the script is completed.

Included with the option

 PMMA sample
 Manual
 Plug for rear of unit
 Two probes:
 AppNANO: Doped Diamond (DD-ACTA-5)
 Conductive Diamond Tip – Non-contact mode probe
 Material: Si, N-Type, 0.01~0.025 Ohm/cm
 Cantilever: L= 125 μ, W=35 μ, T=4.5 μ
 Tip Radius: < 150nm, Height: 14-16 μ
 f: 200-400KHz, K=25~75 N/m

All atomic force microscopes manufactured by AFMWorkshop include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes expand the capability of your atomic force microscope. Besides Lithography, it includes: Conductive AFM, Magnetic Force Microscopy (MFM), and Advanced Force Distance modes. Measuring the conductivity, surface magnetic field, force curves, and manipulation of surfaces are possible with these modes.

AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase and lateral force modes. Additional AFM modes and accessories expand the capabilities of your microscope.
Expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.

To learn more about atomic force microscopes, feel free to visit http://www.afmworkshop.com.

TT- Atomic Force Microscope Stage – An Overview!

Includes a stepper-motor-driven Z stage, LL-AFM force sensor, and precision X-Y stage. The stage does not include a piezo scanner or video optical microscope. Electrical connections are made at the back of the stage with a 60-pin ribbon cable connector.

Description

Model: MS-3230

The TT-AFM stage has the excellent thermal and mechanical stability required for high-resolution AFM scanning. Additionally, its open design facilitates user modification. This stage is designed to work with the AFMWorkshop Control Station including an Ebox and AFM Control software.

Features and Benefits of the TT-AFM Stage include

Rigid Frame Design

The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.

Light Lever AFM Force Sensor

Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.

Integrated Probe Holder/Probe Exchanger

Probe Exchange is made quick and easy with AFMWorkshop’s unique probe holder and clipping mechanism.

Direct Drive Z stage

A fast probe approach is possible because probe/sample angle alignment is not required. A linear motion stage is used to move the probe in a perpendicular motion to the sample.

Small Footprint

Requires little space and fit easily on a tabletop with stage dimensions of 7.5 x 12″.

Precision XY Stage with Micrometer

The sample can be moved without touch. The sample is moved relative to the probe with a precision XY micrometer stage.

Modes Electric Plug

Capabilities of the TT-AFM are dramatically expanded via a six pole electrical plug at the back of the stage

Laser/Detector Alignment

Laser/detector alignment is simplified via a direct view to both the light lever laser and the photo detector adjustment mechanism.

Video Optical Microscope

A high resolution video optical microscope is used for locating features on a surface, aligning the light lever force sensor, and facilitating probe approach. The video optical microscope includes an XY micrometer stage for moving the video microscope relative to the AFM probe.

Included with the Product

TT-AFM Stage
Video Optical Microscope
60 pin ribbon cable
USB cable
TT-AFM Manual

Besides this, AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, dunk and scan and environmental cell scanning options, and documentation packages for all AFM Workshop Products.

You can purchase a standalone AFM stage and customize it as per your requirements using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

Additional modes and accessories expand the capabilities of your microscope.

To learn more about atomic force microscope, visit www.afmworkshop.com

An Overview Of AFM Workshop’s 15 Micron AFM Scanner

The 15 micron scanner is interchangeable with the 50 micron scanner in the TT-AFM. Extremely high resolution scans are made with the 15 micron scanner.

Description
Model: PS-2011

The PS-2010 and PS-2011 piezoelectric scanners are designed for use with the AFMWorkshop TT-AFM, and scan samples in the X, Y, and Z axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y axis. The PS-2010 has a temperature compensated strain gauge in the Z axis, while the PS-2011 does not. Both scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1 and in the 15 µm scanner it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20 pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.

Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.

Interchangeable
The 15 µm and the 50 µm scanners are interchangeable. The scanners are removed from the TT-AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20 pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with the other scanner.

Want to expand the capabilities of your microscope?

You can add additional modes and accessories to achieve that. AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.

To learn more about atomic force microscope, visit www.afmworkshop.com

Features of Table Top Atomic Force Microscope

This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor

With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach

A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabView Software

The TT-2 uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range

Because the TT-2 has a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications

Research

With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals.

Instrument Innovators

The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshop facilitates instrument innovation with an open architecture.

Education

With its open design the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

The TT-2 AFM meets a wide variety of applications. More details on the use of the TT-2 AFM for educators, industry, and research can be found by clicking on www.afmworkshop.com or call at (888)671-5539 any queries.

Basic Atomic Force Microscope for Routine Scanning and Education

The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

Key Features and Benefits of the B-AFM

7-Step Scanning Software
The B-AFM 7-Step Scanning Software is designed for casual AFM users that want to obtain AFM images without in depth AFM expertise. A user-friendly design makes the B-AFM ideal for teaching students the basics of AFM theory and operation.
Intuitive Light Lever Design
A unique design of the light lever makes aligning the system a routine procedure for users with limited experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners
Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Standard AFM Scanning Modes
Scanning modes for the B-AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.
Acoustic Enclosure
The B-AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.
B-AFM’s Applications
Education
The B-AFM is ideal for educating students on the theory, operation and applications of an atomic force microscope. One of the advantages of the B-AFM for education is the open design of the light lever force sensor.
Routine Scanning
Routine scanning of samples that are not challenging to scan is a common application for the B-AFM. If a noise floor below 300pM is required, we suggest purchasing the AFMControl software and a vibration table.

If our AFMs can’t run your application, we will refund the full purchase price. Additionally, our AFMs are now backed by a two-year, return-to-factory warranty.

Contact us to take advantage of this offer (888)671-5539 or visit www.afmworkshop.com to learn more about Basic Atomic Force Microscope.

AFMWorkshop Offers Instrumentation and Training Materials to Educational Groups

One of our most popular instruments used in university settings is the TT-AFM. Because the TT-AFM is similar to 99% of the Atomic Force Microscopes used in research labs throughout the world, students can use skills developed on the TT-AFM to operate AFMs with more complex instrumentation.

On a TT-AFM, students learn how to operate all of the key modes such as contact, vibrating, lateral force, and phase modes. For example, the TT-AFM and AFMWorkshop was selected as instrument and trainer of choice by Hiroshi Yokoyama, Ph.D., director of Kent State University’s Glenn H. Brown Liquid Crystal Institute.

AFMWorkshop can work with your institution to create your own optimal training program.

AFM Training Programs

TT-2 Assembly Workshop

The ultimate in comprehensive knowledge of Atomic Force Microscope design and function can be gained through AFMWorkshop’s TT-AFM Assembly Workshop. Participants build their own AFM and participate in numerous workshops on AFM theory, operation, and applications. Attendees learn the components of an Atomic Force Microscope, how an AFM operates, key AFM design points, light lever design, scanner design/construction, and how to maximize image signal-to-noise ratio.

AFM Applications Workshop

AFMWorkshop’s five-day AFM Applications Workshop provides access to an AFM for each attendee for extensive hands-on labs. Participants spend time in group lectures on the theory of Atomic Force Microscopy, and put theory into practice by preparing and measuring images for a wide variety of metallurgic and life sciences samples. Participants have time for expert guidance in troubleshooting their particular applications.

For more information on creating a tailored workshop to meet your students’ needs, please contact AFMWorkshop.

Free Atomic Force Microscopy Webinars

AFMWorkshop provides a series of free live-streaming seminars for educators and professionals. Key skills to help all AFM users’ gain the most from their AFM are covered, including effective utilization of image processing software, techniques for successful sample preparation, detecting artifacts, and selecting the right probes. To view pre-recorded webinars, visit the AFMWorkshop Webinar Page.

Animated AFM Tutorials

Learning how an atomic force microscope works is an essential part of proper AFM training. AFMWorkshop provides a series of animations that illuminate key operating principles and efficiently introduce new users to Atomic Force Microscopes.

While minimal training is needed to measure basic AFM images, gaining optimal performance requires greater insight into the operating principles and design of atomic force microscopes. This depth of understanding is especially necessary when users need to measure high-quality images with only a few angstroms of resolution.

Concepts essential to understanding how to optimize AFM performance, such as the design of piezoelectric scanners, light lever design, probe sample interactions, and feedback control can be readily understood by the AFM user and are clearly illustrated in the AFMWorkshop Animated.

AFM Tutorials

Our tutorials act as a starting point for anyone interested in learning about the theory and operation of atomic force microscopes. For example, in the section of animations describing the “Design of the Light Lever AFM,” we:

First show that a photodetector can convert photons to electrical energy;
Then demonstrate how 2 photodetectors are used to create a position-sensitive detector;
Finally show how the motion of a cantilever is measured with a light lever.

Researchers, educators, and students around the globe have voiced their appreciation for the unique and immediately useful knowledge communicated through the AFMWorkshop animated tutorials.

Atomic Force Microscopy Textbook

The book Atomic Force Microscopy, written by Dr. Peter Eaton and Paul West and published by Oxford University Press, is available from Amazon.com, or Oxford University Press. Atomic Force Microscopy has become the leading text for AFM education and is a great resource for both professionals and students.

Presentations

AFMWorkshop customers have access to a complete library of PowerPoint® presentations, including over 500 slides on subjects ranging from AFM image analysis, instrument design, quantitative AFM measurements, and Atomic Force Microscope image artefacts. These presentations may be used for teaching courses to undergraduate and graduate students. Additionally, a trained instructor from the AFMWorkshop is available to lead a three day course derived from these PowerPoint® presentations.

Training for AFM Success

Pick up any scientific journal or click through a website and you’ll see beautiful images produced by scientists and engineers on atomic force microscopes. What’s not so easy to see is the amount of time and effort that went into producing these amazing images.

Training, education, and time on the instrument are the keys to successful AFM imaging. Although basic operation of the instrument is straightforward, acquiring beautiful nano-scale images like those seen in scientific publications requires theoretical knowledge as well as actual practice time on the instrument.

AFMWorkshop is committed to helping our customers develop the strong AFM skill sets necessary to produce world-class AFM images.

To learn more about uses of Atomic Force Microscopy for Education, feel free to visit www.afmworkshop.com.

AFM: An Ideal Tool to Use in the Photonics Industry

Atomic Force Microscopes (AFMs) offer substantially better horizontal and vertical resolution than optical and stylus profilers. For this reason, AFMs are ideal for the analysis of materials used in the photonics industry.

Some of the advantages from using an AFM for analysis of photonics materials include the following:

Three dimensional structures are measured: depth and angles are measurable.
Image is independent of optical properties.
No sample preparation required – no coatings, no cross sections.
Extreme contrast on flat samples.

Atomic Force Microscopy is non-destructive.

AFM applications in the photonics industry include:
Analysis of Polished Fused Silica Substrates
Ruled Gratings
Holographic Gratings

Analysis of Polished Fused Silica Substrates

Once polished, fused silica substrates can have surface roughness values of 0.1 nm. With an AFM it is possible to visualize the surface of polished silica substrates, to measure the surface texture, and to measure the dimensions of structures created by the polishing process.

Ruled Gratings

Atomic Force Microscopes scan and directly measure the topography of ruled grating. From AFM images the ruling angle, pitch, and surface texture of features are measurable. The image below is of a ruled grating measured on a TT-AFM.

Holographic Gratings

Specifications of holographic grating including heights must be maintained to very tight tolerances. Properly operated, an AFM can measure step heights as low as a few angstroms with very high precision and accuracy.

Looking for a reliable Atomic Force Microscope company?

Try AFMWorkshop, We have extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and have been used in a wide variety of applications.

To learn more about AFM Workshop Products, feel free to visit at www.afmworkshop.com.

Why Understanding Atomic Force Microscope Theory Is Important

AFMs are essential instruments for nanoscale measurements and helps nanotechnology researchers in all disciplines of engineering and science. There is a considerable and increasing demand among students and professionals for AFM training and education. There are three levels of AFM training.

Introduce Nano world to students

Instructors who fall under this category wants to introduce learners to an AFM by showing them what it looks like and how it works. Here students learn how to enlarge the view of the surface with the help of the scanning tip. Usually few samples are visually represented during this training so that students can see nanometer sized features of a surface. Students are exposed to the AFM for a couple of hours in this group.

Provide training to students that want to operate an AFM

In this group, the motive of instructors is to train students on how to operate the AFM efficiently for measure different types of images. During this training, students learn the basic functions of the AFM, how the instrument scans, and the function of feedback control. Here students come to know how to operate AFM for both industrial and research laboratiries. The training can be as short as one week and can lasts a whole semester.

Prepare students for better career

The motive of instructors here is to prepare students to do well in their careers in the future in instrument design, customer service or applications development. In this group there are additional categories of researchers who aspire to repair and modify their own instruments. Here students build AFMs on their own and also learn to measure images on standard reference samples. It is a 40 hour intensive course that fulfills the requirments of this third group.

Are you the one who wants to include AFMs in your training programs?

If yes, you just need to browse through our website www.afmworkshop.com. We are 24/7 are here to assist you in any regard concerning your AFM queries.

Uses of Atomic Force Microscope in Life Sciences Applications

Do you think it’s not possible to measure biological samples on nano scale? Actually, Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are as follows.

Imaging Biomolecules

Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquids.

Double-stranded DNA Molecules

Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

High resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.

Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging Сells

Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites

Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Measurement of high resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutants

The ability to image a very large number of cells, allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally the inverted microscope can be operated in epifluorescence mode.

Are you looking for a microscope that fulfills all your research needs? If yes, then choose AFMWorkshop to buy Atomic Force Microscopes. AFMWorkshop is a renowned name in atomic force microscope manufacturers; they offer a wide variety of Atomic Force Microscopes (AFM’s) to suit every research needs.

For more information, feel free to visit https://www.afmworkshop.com.

Why Use Atomic Force Microscopes to Make Measurements on Biological Samples

Atomic force microscopes are well suited for making measurements on biological samples at the nanoscale in ambient air and in liquids.

Recommended AFM products for life sciences applications are TT-2 Atomic Force Microscope and LS-Atomic Force Microscope.

Just have a look at some of these biological applications:

Double-stranded DNA Molecules

Using atomic force microscopes, imaging of DNA of size 5 µm x 5 µm can be done easily. Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)

In structural studies, imaging of Tobacco Mosaic Virus is commonly carried out. Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, placement of the microscope in an environment with minimal structural, the capability to scan with very light forces and acoustic vibrations. Furthermore, TMV is commonly used as an imaging standard since it has a highly conserved structure.

Parasites

In the air, Parasites of size 25 µm x 25µm can be measured using AFM. These Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells

Using an Atomic Force Microscope, Epithelial cell of size 32 µm x 32 µm can be measured in liquid. Measurement of high-resolution images of cells in a liquid (e.g., under physiological conditions) is another possibility unique to AFM and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

If you want to buy high-quality Atomic Force Microscope, feel free to visit https://www.afmworkshop.com/.