AFM Workshop: A Leading Manufacturer for High-Value Atomic Force Microscopes

With over 300 customers worldwide, AFMWorkshop has developed a reputation of being the leading manufacturer for high-value atomic force microscopes. We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS-AFM is the best option for scientists and researchers working with soft samples and biomaterials. Our newest model, the B-AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about AFMWorkshop and its products, feel free to visit, www.afmworkshop.com Or call us at 1 (888) 671-5539.

B-AFM: A Compact and Portable Solution for Educators

The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.

The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.

Simplified Key Operational Steps

Aligning the AFM light lever

A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.

Exchanging probes

With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.

Exchanging samples

Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.

Key Components of the B-AFM

Video Optical Microscope

Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.

XY Sample Stage

The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.

Enclosure

Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.

Electronics

The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.

To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

Biology Applications Which Are Unique to Atomic Force Microscopes

Atomic force microscopes are capable of making measurements on biological samples at the nanoscale that are difficult or even impossible with any other type of microscope. AFM allows the nanoscale imaging of soft biomaterials including cells and DNA in both ambient atmospheric conditions as well as liquid environments, Examples of biology applications which are unique to atomic force microscopes are shown below.

Imaging Biomolecules
Atomic force microscopes are the only microscopes capable of imaging bio-molecules in ambient air as well as liquid.

Double-stranded DNA Molecules
Imaging of oligonucleotides can be used in a wide variety of applications, notably in structural studies, and in the study of interactions between the oligonucleotides and other molecules, such as enzymes.

Tobacco Mosaic Virus (TMV)
Imaging of viruses is commonly carried out in structural studies. In addition, TMV is commonly used as an imaging standard since it has a highly conserved structure. Imaging high aspect ratio samples also helps to characterize tip sharpness.

Such high-resolution imaging requires an instrument noise floor of less than 0.1nm, a good tip approach leading to the maintenance of a sharp tip, the capability to scan with very light forces, and placement of the microscope in an environment with minimal structural and acoustic vibrations.
Proper sample preparation is another critical factor. Sample preparation techniques are described in Atomic Force Microscopy by Eaton and West.

Imaging cells
Atomic force microscopy has a particular advantage over electron microscopy, in that cells and biomaterials can be imaged in partially or totally hydrated conditions including ambient air and liquid environments.

Parasites
The Leishmania cells have been treated with an antimicrobial peptide, leading to highly roughened cell membranes, which can be measured and quantified by AFM.

Epithelial Cells
Measurement of high-resolution images of cells in liquid (e.g., under physiological conditions) is another possibility unique to AFM, and can give much more relevant results than electron microscopy, which requires cell fixation, leading to artifacts.

Bacteria Spore Mutant
The ability to image a very large number of cells allows the researcher to obtain statistically relevant information about a population of cells. Images of multiple cells can be also useful to assess inter-cellular effects, such as clustering and adhesion.

The inverted optical microscope facilitates direct placement of the probe on an area of interest for scanning. Additionally, the inverted microscope can be operated in epifluorescence mode.

Measuring Stiffness of Biomaterials at the Nanoscale
Monitoring the deflection of a cantilever as it is pushed against a sample results in a force/distance curve. From the force distance curve many parameters may be measured, such as stiffness of the sample and probe-sample adhesion.

In biological samples, the most common application is measurement of intermolecular forces. For example, this could be used to measure the interaction force between an antigen and an antibody directly. Cell-cell adhesion forces and cellular stiffness can also be measured.
To learn more about our Atomic force microscopes, feel free to visit www.afmworkshop.com. Or call us at 1 (888) 671-5539

Atomic Force Microscopy Services Offered By Afm workshop

Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and all other AFMWorkshop customers.

Customer Support and Technical Service
AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry / Process Development & Process Control; and Research / Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Custom Engineering of Atomic Force Microscopes
AFMWorkshop’s open architecture allows the ultimate in flexibility and customization. We will work with you to make your instrumentation and application ideas a reality.

Instrumentation from the AFMWorkshop has an open design that allows customization of the products by its users.

Atomic Force Microscopes for OEMs
AFMWorkshop actively partners with OEMs. If your company needs an Atomic Force Microscope for a product and requires an AFM platform, we will work with you in customizing our instrumentation to your product requirements. Discounts on AFM instrumentation are available for volume purchases.

AFM Workshop Customers Area
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Need assistance?

Contact AFMWorkshop to inquire about atomic force microscope information and pricing, training, application help, customer support and technical service. Our customer service will assist with choosing the right atomic force microscope for your application needs, providing any documentation or help you may need to secure funding, as well as troubleshoot over the phone, by email, and by remote-viewing on the AFM computer. Our success is your success, so please don’t hesitate to contact us today.

To learn more about atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.

The Technology Behind Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning

Atomic Force Microscope Technology

Light Lever Force Sensor

The light lever force sensor had its origins in the work of precision engineers working on surface profilers. In 1932, Smaltz presented a light lever stylus profile that used film to record the movement of a sharp probe as it scanned across a surface. This technique was first applied to AFM by Amer, an IBM scientist. The light lever force sensor is now the standard in AFM designs.

Vibrating Mode AFM

As with the light lever force sensor, vibrating probe instruments were developed first for surface profilers. It was discovered that by vibrating the probe above a surface as it was scanned, lateral forces on the probe were reduced. Although Binnig and Quate discussed vibrating modes in their pioneering paper, it was a team of IBM scientists led by Kumar Wickramsinghe that first applied vibrating techniques to the AFM. Wickramsinghe’s group found that they were able to make the technique sensitive enough that they did not have to tap the surface. The AFMWorkshop does not recommend tapping the surface in vibrating mode AFM. This is possible using the technology developed by IBM scientists.

**The Technology Behind Atomic Force Microscopy**

Feedback Circuits

The first scanning tunneling microscope developed at IBM in Switzerland utilized analog feedback to control the relationship between the probe and surface while measuring an image. This is very similar to the pioneering work of Young at the NBS. Soon after that pioneers such as A. Lewis built scanning probe microscopes with digital feedback. However, because of the limitations of ADC and DAC converters, AFM Workshop uses high-fidelity analog feedback circuits to control the Z position of the probe/sample in its microscopes.

Re-Trace Technology

In a scanning probe microscope it is often advantageous to store height information while scanning a sample. This stored information can then be used for a following scan to hold the probe at a fixed distance above a sample’s surface. This technique was pioneered by University of Texas professor Alan Bard.

For a more complete introduction to Atomic Force Microscopy, we recommend Atomic Force Microscopy, by Peter Eaton and Paul West, published by Oxford University Press.

To learn more about atomic force microscopy, feel free to visit www.afmworkshop.com.

Advantages Of Using AFMs For Nanoparticle Characterization

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.

Nanoparticle Characterization Overview

Unique advantages of AFM nanoparticle characterization include

Characterization of nanoparticles that are .5 nm in diameter and larger.
Nanoparticle mixture distributions below 30 nm.
Characterization of variable geometry nanoparticles.
Direct visualization of hydrated nanoparticles/liquid medium.
Characterization of nanoparticle physical properties such as magnetic fields.
Analysis of the size of nanoparticles.

Nanoparticles over 0.5 nm in diameter
An outstanding feature of the Atomic Force Microscope is that it can directly create images of nanoparticles with dimensions between 0.5 nm and 50+ nm. Nanoparticle size distributions are directly calculated from AFM images.
Nanoparticle Mixture Distributions below 30 nm
AFMs can easily identify and characterize bimodal distributions of nanoparticles. AFMWorkshop’s built-in nanoparticle analysis software makes nanoparticle characterization fast and easy.

Variable geometry nanoparticles
AFM can evaluate variable nanoparticle geometry, from traditional spherical nanoparticles to more exotic fractal geometries of nanoparticle clusters.
Hydrated Samples/Liquid Mediums
The atomic force microscope’s ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and biological samples. For samples that need to be kept hydrated or in a controlled liquid or pH solution, AFMWorkshop offers a fluid cell option that allows for AFM analysis in liquid.

Physical Properties of Nanoparticles
Many AFM modes may be used to measure nanoparticle physical properties such as magnetic fields, mechanical properties, electrical properties, and thermal conductivity.

Nanoparticle Size Analysis
A specialized AFMWorkshop optional Nanoparticle Analysis Software measures the critical dimensions of AFM nanoparticle images. This is possible because an AFM measures the entire three dimensional structure of the nanoparticles.

To learn more about AFM analysis of nanoparticles, feel free to visit http://www.afmworkshop.com.

Atomic Force Microscopes: An Ideal Tool For Instrument Innovators

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument. TT-2 AFM customers have access to the systems software, mechanical drawings, and schematics. Because the software is written in LabVIEW, it can be easily modified to meet very specific demands.

TT-2 AFM software was developed in LabVIEW, making it easy for customers with a LabVIEW user license to customize their software. Additionally, National Instrument Data Acquisition Cards can be integrated into the TT-2 AFM to create a customized experiment.

Instrument Innovators are no longer faced with the decision to either create an entirely new AFM, or to live with the limitations of commercial AFMs that have limited documentation and a closed architecture. An engineering documentation package is available as an option to TT-2 AFM customers.

Mechanical Drawings

All the drawings for mechanical parts used to build a TT-2 AFM were created in AutoCAD and are included in the optional documentation package. If you require a .dwg file for a specific part in the TT-2 AFM, AFMWorkshop will provide it to you. Additionally, single parts in the microscope can be purchased if you need to modify a part for your needs. Each part is identified by part numbers on each mechanical drawing.

Software

National Instrument’s LabVIEW instrumentation programming language is setting the standard as the graphical programming environment for developing instrumentation. The TT-2 AFM includes a VI that can be modified for specific needs. The instrument control protocol for addressing functions such as Z feedback, XY scanning and stepper motor control is included with the technical documentation package. The AFMWorkshop does not provide a LabVIEW software development license – this must be purchased from NI.

Electronics

Direct access to TT-2 AFM electronics signals may be gained from a 50 pin ribbon cable at the rear of the TT-2 AFM EBox, or from the mode connector at the front of the microscope stage. For developers who want even more access, the technical guide includes schematics to all electronics in the TT-2 AFM, including: photodetector board, piezo electric control board, controller main board, and even the power supply board. There are several pinned signal access points on the main controller board.

To learn more about afmworkshop’s atomic force microscopes, feel free to visit www.afmworkshop.com.

A brief overview of the TT-2 AFM Assembly Workshop

Learn the theory, design, and operation of atomic force microscopes, as well as hands-on application. You’ll get to build your own AFM including scanner, stage, and light-lever.

TT-2 AFM Assembly & Operation Workshop

Attendees to this five day workshop build a TT-2 AFM atomic force microscope and learn how to operate it. Additionally, daily seminars provide attendees with training on the theory, operation and applications of an atomic force microscope. The workshop is primarily geared for customers who have purchased a TT-AFM Kit.

Each day begins with one to two hours of coursework followed by hands-on microscope assembly,testing and operation.

Attendees of the TT-2 AFM Assembly & Operation Workshop:

Are better able to operate, gain optimal performance, and obtain the best images from their TT-AFM.
Can repair the microscope whenever needed because they know the assembly process and all the parts used in its construction.
May easily modify their instrument to create unique instrumentation designed for their specific research applications.

Atomic force microscopy workshops offer customers an in-depth training experience on the theory, design, and operation of AFMs. The TT-2 Assembly workshop is a five-day intensive workshop giving users a chance to build their own AFM including the scanner, light-lever, and stage, while learning the theory and parameters that affect and make AFM scanning possible. Other workshops offer detailed training sessions on various applications of AFM including Polymers, Nanoparticles, and Bioapplications. In addition to our free AFM School paid AFM Workshops are advanced AFM Classes in specific atomic force microscopy areas.

AFMWorkshop offers multiple AFM courses and atomic force microscopy training opportunities for professionals and students throughout the year. From building your own AFM, to learning advanced techniques and applications, our workshops are intensive, informative, and fun. Learn the best operational scanning practices.

Interested in joining our workshop?

Our upcoming TT-2 AFM assembly workshops:
June 24-28, 2019
Sept. 9-13, 2019

Visit www.afmworkshop.com and fill up the form to register yourself.

AFMWorkshop – On-Site AFM Installation And Training

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

Unpack AFM
Set up AFM
Evaluate AFM site for acoustic and structural vibrations
Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

Changing samples
Changing probes
Aligning the light lever
Positioning the photo-detector
Selecting resonance (vibrating mode only)
Tip approach
Scanning
Optimizing GPID
High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about our AFM Installation Training programs, feel free to visit www.afmworkshop.com.

Nanoparticle Characterization With Atomic Force Microscopy

Two day course focusing on atomic force microscopy for nanoparticle characterization. Participants will learn an overview of AFM hardware and software, as well as imaging and data analysis techniques specific to nanoparticle characterization. Lab work mixed with coursework gives students hands-on experience using AFM to measure the properties of nanoparticles.

Atomic Force Microscopy to Characterize Nanoparticles

Two Day Training Course

The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods. The AFM provides powerful information on size, distribution, and geometries of nanoparticles.

Some of the unique advantages of nanoparticle characterization with an AFM include:

-Characterization of nanoparticles that are .5nm and up.
-Nanoparticle mixture distributions below 30 nm.
-Characterization of variable geometry nanoparticles.
-Direct visualization of hydrated nanoparticles/liquid medium.
-Characterization of nanoparticle physical properties such as magnetic fields.

This two day AFMWorkshop course mixes lecture with labwork on atomic force microscopy operation specifically as it applies to characterizing nanoparticles. AFM hardware and software will be reviewed, with special emphasis on the imaging modes and image processing needed to study nanoparticles. We will utilize AFMs from AFMWorkshop to teach basic concepts and demonstrate AFM operation, however attendees with experience on any make of AFM instrument will find the labwork relevant and practical.

Topics to Be Covered:

-Overview of AFM operation and different modes Topography measurements on nanoparticles.
-Nanoscale resolution
-Overview of AFM hardware
-Overview of AFM software
-Imaging modes for nanoparticles
-Imaging artifacts and best practices
-Image processing for important measurements on nanoparticles

Labwork:

-Scanning standard and reference samples.
-Nanoparticle imaging and image processing.
-AFM calibration

Interested in participating of our workshops?

To learn more about Atomic Force Microscopes Training, feel free to visit www.afmworkshop.com.