Atomic Force Microscope Vibration Solutions Help Obtain the Highest-Quality AFM Images

Atomic force microscope vibration solutions offer a way to reduce external vibration that often causes fuzzy AFM images. AFMs are quite susceptible to external vibrations, which allows them to measure topographic data at resolutions below 0.1 nanometers. To reduce external vibrations and obtain the highest-quality AFM images, particularly for high-resolution scanning, AFMWorkshop has designed a variety of proven options for vibration isolation including vibration tables, vibration enclosures, bungee options, and even custom/OEM enclosures.

Acoustic and structural vibrations degrade the resolution and overall performance of an Atomic Force Microscope. External vibration can affect the resolution of scans by adding extra noise. Vibration Isolation Our Solutions filters out unwanted acoustic structural vibrations that interfere with high-resolution scanning.

Acoustic vibrations are reduced by placing the microscope in an acoustic isolation chamber. Structural vibrations are reduced by using a mechanical isolation platform. Below are the vibration solution products offered by AFM Workshop.

Passive Vibration Table
Passive Vibration Table is a moderate Vibration solution when ultimate AFM Performance is not necessary.

Active Vibration Table
An Active Vibration Table uses a feedback control method for removing vibrations for a better quality of scans.

Bungee Option
Bungee Option is a relatively cost-effective method for reducing unwanted structural vibrations and improving the quality of AFM Image.

Bungee Option is an additional Vibration Solution for Acoustic Enclosure. Such combination allows in a comparatively cost-effective way reducing structural mechanical vibrations and Acoustical noises and obtaining better quality AFM pictures and scans.

Vibration Cabinet
Vibration isolation is essential for high-resolution AFM scanning. Vibrations from buildings, tables, and external vibration can affect the resolution of scans by adding extra noise. To further reduce vibration, we recommend a vibration isolation cabinet.

Custom/OEM vibration enclosure
Customized (OEM) Vibration enclosure – scalable vibration solution for any Atomic Force Microscopy System. To learn more, please visit www.afmworkshop.com Or call at 1 (888) 671-5539.

Atomic Force Microscopy Webinars – An Overview

Atomic force microscope webinars are pre-recorded video sessions with our AFM Experts, covering a range of topics from image processing and sample preparation to the advantages and disadvantages of AFM. Learn how to gain the best performance from your atomic force microscope with instructional videos on the best operating practices and techniques of AFM.

Gain the Best Performance from Your AFM with the help of the following webinars:

AFM Image Processing

Getting the most from your AFM requires effective utilization of image processing software. This video recording of a live-streaming seminar covers how to level, display, and analyze images with AFM image processing software. The demonstration will utilize Gwyddion’s open-source software.

AFM Sample Preparation

With Peter Eaton Ph.D.

Proper sample preparation is perhaps the most important element in successful atomic force microscopy imaging. Techniques for successful sample preparation in life sciences, material sciences, and other applications are covered in this video recording from a live-streaming seminar.

AFM Probe Selection
AFM operators must choose from a wide array of probe types when scanning samples. This video recording from a live streaming AFM seminar covers the probe types that work best for different types of samples.

AFM Performance Vs. Price

AFMWorkshop is the only Atomic Force Microscopy company offering a complete product line of AFMs that balance performance with price. This seminar reviews AFMWorkshop’s high-value product line and includes a demonstration.

TT-AFM Demonstration

Livestreaming demonstration of the TT-AFM, a popular and versatile atomic force microscope for researchers, educators, and engineers. This 40-minute demonstration highlights the TT-AFM’s wide variety of functions and applications. With a sale price starting at $32,275, the TT-AFM’s quality and success in research and business applications are unparalleled within atomic force microscopy.

To learn more about AFMWorkshop and its Free Atomic Force Microscopy Webinars, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

TT-2 Atomic Force Microscope – Capable of Measuring Samples with Features from Nano-Meters to Microns

This compact, second-generation high-resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Key Features and Benefits of the TT-2 AFM

Low Noise Floor
With a noise floor <80 picometers, the TT-2 AFM is capable of measuring samples with features from nano-meters to microns.

Direct Drive Tip Approach
A linear motion stage moves the probe relative to the sample. The probe sample angle does not change, and samples of many thicknesses are readily scanned.

Research Grade Video Optical Microscope
With a mechanical 7:1 zoom and a resolution of 2 µm, the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners
Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software
The TT-2 uses industry-standard lab view software. For customization, the systems VI’s are readily available.

Modular Design
Once you buy the TT-2 AFM you can add options and modes such as focus assist, image logger, lithography, and liquid scanning when you are ready.

Simple Probe Exchange
With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Light Lever Large Adjustment Range
Because the TT-2 Atomic Force Microscopehas a large adjustment range on the laser and photodetector, probes from all major manufacturers can be used.

Applications of TT-2 AFM:

Research
With over 200 TT-2 AFMs in laboratories throughout the world, researchers have published 100s of publications in all types of science and engineering journals. Read More

Instrument Innovators
The TT-2 AFM serves as an ideal platform for creating new and innovative instruments. AFMWorkshopfacilitates instrument innovation with an open architecture. Read More

Education
With its open design, the TT-2 is ideal for colleges and universities that teach students about AFM design, applications, and operation.

With high resolution as low as 0.08 nanometers, these atomic force microscopes offer the highest performance to price ratio in the industry. Our AFMs are the best for Education and Career Transformation, Biology, Medicine, and other Life Sciences, Nano-Profiling, nanoparticle characterization as well as for highly-demanding applications across all nano industries.

To learn more about AFMWorkshop and our Atomic Force Microscopes Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

High Resolution Atomic Force Microscope – Advanced Yet Affordable AFM for Researchers

The HR AFM is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. It is ideal for researchers that need to visualize and measure nanometer or sub-nanometer sized surface features.

Key Features and Benefits of the HR AFM

Low Noise Floor

With a noise floor of 35 picometers, the HR Atomic Force Microscope is capable of measuring samples with features from nano-meters to microns.

Kinematic Tip Approach

A stable kinematic design for probe approach is used in the HR AFM. An optional direct drive approach is available.

Research Grade Top View Video Optical Microscope

With a mechanical 7:1 zoom and a resolution of 2 µm the video optical microscope facilitates locating features, tip approach, and laser alignment.

Multiple Scanners

Linearized piezoelectric scanners with several ranges are available to optimize scanning conditions.

LabVIEW Software

The HR AFM uses industry standard lab view software. For customization, the systems VI’s are readily available.

Modular Design

Once you buy the HR AFM you can add options and modes such as focus assist, image logger, lithography and liquid scanning when you are ready.

Simple Probe Exchange

With the removable probe holder, exchanging probes is simple, and takes less than a minute.

Large Light Lever Adjustment Range

Because the HR AFM has a large adjustment range of the laser and photodetector, probes from all major manufacturers can be used.

Side View Optic

Directly view the tip to surface distance with the side view optic.

Atomic Force Microscopes and AFM Systems manufactured by AFMWorkshop are designed with the essential scanning features for obtaining high-quality AFM images at high resolution, along with flexible scanning software developed in Lab VIEW.

To learn more about AFMWorkshop and our Atomic Force Microscope’s Price, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Has Developed A Reputation of Being the Leading Manufacturer for High-Value Atomic Force Microscopes

We design and manufacture high-quality atomic force microscopes (AFMs) that far exceed the expectations of our customers, and we provide fundamental training to each of our customers. We guarantee our AFMs will run your application, and our customer service is always available to assist.

Our Design: AFMWorkshop atomic force microscopes offer the essential features needed to measure high-quality AFM images, without the additional cost for unnecessary features. For ultimate performance, our HR-AFM is highly stable with ultra-low noise levels. For research, the TT-2 AFM has an open architecture with unsurpassed flexibility needed for research instruments. The LS AFM is the best option for scientists and researchers working with soft samples and biomaterials. The B AFM, is useful for routine scanning and educational purposes. You can also buy an AFM platform, and add the necessary modes and features based on your budget and needs. For scientists and engineers requiring AFM capability, AFMWorkshop is the leader in value.

Satisfaction Guarantee: AFMWorkshop is confident that our atomic force microscope will be able to run your application, and we guarantee it. You tell us what you’re trying to achieve with the application of an AFM and we will make sure you can do it, or we’ll refund the full purchase price of your AFM. Our success is your success, and we will work with you to ensure your productivity using AFMWorkshop products.

Training: About 80% of AFMWorkshop customers are buying and/or using an atomic force microscope for the very first time. We at AFMWorkshop view training as an essential element of AFM operation which is often overlooked, leading to frustration and loss of valuable time. By offering in-house workshops as well as on-site training to each of our customers, we ensure that they are fully prepared to operate their AFM successfully. We also offer tutorials on our website explaining the basic function of an atomic force microscope, as well as videos and webinars for further education.

Research, Industry, and Education: AFMWorkshop has successful customers worldwide in fields ranging from nanotechnology and life sciences to education and industry. Customers consistently comment on the amazing value of their instruments and on the depth and quality of training and technical assistance AFMWorkshop provides. AFMWorkshop customers have hundreds of publications worldwide using AFMWorkshop products; and thousands of students have received training on an AFMWorkshop atomic force microscope. By creating microscopes with a low-cost to the end user, AFMWorkshop is opening up atomic force microscopy to more educational settings in high-schools, colleges, and universities across the globe.

The goal of AFMWorkshop is to provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry. To increase the accessibility of AFMs, we build our AFMs with price and resolution in mind. Our atomic force microscopes provide resolution down to the tens of picometers range – plenty of resolution for most applications. With proper training, AFMWorkshop AFMs are an affordable option for researchers in many emerging fields of science, as well as engineers in industrial fields. At a fraction of the cost of other AFM manufacturers, AFMWorkshop is the only option for high-value atomic force microscopy.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

Introduction to the Atomic Force Microscope

The working principle of the Atomic Force Microscope (AFM) is based on the forces that arise when a sample surface is scanned with a nanometer-sized tip (a few to 10s of nm) attached to a cantilever.

The advancement of the AFM over traditional stylus surface profilers is that the former uses a feedback loop to control the forces between the surface and probe. Because the forces are controlled, very small probes may be used, and not broken while capturing an image.

AFMWorkshop products all include 5 standard modes. There are two primary modes used for measuring the topography of a sample, which are contact mode and vibrating mode. Lateral Force and Phase modes offer surface material contrast. Finally Force-Distance (F/D) curves measure the interaction forces between a probe and surface.

Contact Mode:

The probing tip is in contact with the surface throughout the imaging in contact mode. The short-range forces between the surface and tip cause the deflection of the cantilever, which is recorded to generate the topographical image of the surface. However, the tip-surface contact in this mode can potentially damage the surface or wear the tip. Hence, this mode may not be suitable for imaging of soft surfaces. On the other hand, continuous contact with the surface allows identifying other features such as friction (lateral force imaging) or stiffness/elasticity map of the surface (force modulation imaging).

Vibrating Mode:

In this mode, a probe at the end of a cantilever is vibrated up and down. As the vibrating probe begins to interact with a surface, the vibration amplitude is dampened. The amount of damping is proportional to the amount of force placed on the surface by the probe on each oscillation of the vibrating probe. A feedback loop is used to maintain a fixed vibration amplitude as the probe is scanned across a surface. Forces between the probe and surface in vibrating mode can be as low as a few 10’s of piconewtons.

Phase Imaging:

A phase difference between oscillation of the cantilever and of the signal that drives cantilever oscillation (for example, by a piezoelectric crystal) is measured and visualized in phase imaging.There is no phase contrast when the surface is homogenous, or when there is no interaction between the tip and surface (i.e., the cantilever is well above the surface). However, if specific regions of the surface have distinct mechanical properties, that can be captured with phase imaging. This is because the cantilever loses a different amount of energy as probe taps to surface areas with differing mechanical properties. Hence, phase imaging is helpful to detect variations in mechanical properties such as friction, adhesion, and viscoelasticity on surfaces. It can also be used to detect patterns of various materials such as polymers on the surface or to identify contaminants that cannot be distinguished with topography imaging.

Lateral Force Mode:

In lateral force or frictional force microscopy, lateral deflections of the cantilever, arising due to forces parallel to the plane of the sample surface such as friction force, are measured. This allows detecting inhomogeneities on the material which gives rise to variations in surface friction, or to measure the friction properties of a sample at the nanometer level.

Force-Distance Mode:

A force-distance curve is measured in contact mode. To measure an F/D curve the probe at the end of a cantilever is pushed into the surface of a sample. Once the probe begins to interact with the sample, the cantilever bends. The inbound part of a F/D curve is the deflection of the cantilever when the probe is being pushed into the sample, and the outbound corresponds to when the probe and sample are moving apart.

To learn more about atomic force microscopes, please visit, www.afmworkshop.com or call at 1 (888) 671-5539.

AFMWorkshop Offers Matchless Customer Support and Technical Service to Its AFM Users

AFMWorkshop Customer Support & Technical Service is oriented appropriately toward two differing user groups: Industry/Process Development & Process Control; and Research/ Education. We understand our Industry users’ need for exceptional turn-around time and provide rapid resolution should any problems arise. For researchers and educational users, we know that the actual process of – and involvement in – problem resolution can sometimes be just as important as the resolution itself.

Due to AFMWorkshop’s world-class AFM training program, our customers can usually troubleshoot and service their own AFMs. However, in the event that additional support is needed, AFMWorkshops’ Service Engineers are ready to help. We provide technical service via phone, email, live web training, remote internet access and operation of customer instruments, and on-site servicing.

All AFMWorkshop instruments come with a robust one-year warranty. As of April 1, 2016, North American customers receive a Two-Year Warranty with the purchase of their new AFM from AFMWorkshop. Extended time service contracts are also available for purchase.

AFMWorkshop provides the finest Customer Support and Technical Service. We are distinguished in the field of Atomic Force Microscopes by our 100% commitment to the scientists, educators and nanotechnology researchers using our products. With more than 30 years of experience designing and using AFM, STM & SPM technology, we’ve met thousands of users who’ve shared their collective frustrations with the typical neglect or wait times involved in service and support from most instrument companies. We strive to turn this collective frustration into a historical artifact.

AFMWorkshop has changed the paradigm for AFM instrument design, pricing and service. Our transparency and user-orientation means AFMWorkshop customers learn the intricacies and successful operation of their instruments and can produce world-class images.

To learn more about our Atomic Force Microscopy Services, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

On-Site AFM Installation and Training Facilitates Optimal Installation and Function of Your New AFM

Atomic force microscopes can be purchased with an On-Site Training and Installation; AFMWorkshop will set up the AFM in your lab, and train users on the operation. Generally, two days long, On-Site AFM Installations and Training offer customers assurance that the AFM is placed in a proper vibration environment, and that all users are properly trained to operate the atomic force microscope.

For those AFMWorkshop customers electing On-Site Installation & Training on their AFM, vs. the Assembly and Training program at the AFMWorkshop facility, AFMWorkshop has designed a set of procedures to facilitate optimal installation and function of your new AFM.

Once the new AFMWorkshop AFM is received at your facility, an authorized AFMWorkshop customer service engineer travels to your facility to install the AFM and to train your AFM users on the particular model’s operative techniques.

AFMWorkshop’s on-site training is designed for up to two designated operators of the AFM. These operators are then designated as the primary contact points between AFMWorkshop and the customer’s institution. During the installation and training visit, the focus is on training customers how to make optimal images of standard samples, not on specific applications. We find that this approach yields the best results for future success with the AFM. (If your facility’s AFM operators are interested in continuing their training on specific applications, AFMWorkshop offers five-day advanced applications workshops throughout the year.)

Day 1

The objective is to set up the AFM and ensure it is operating to factory specifications. The AFM’s proposed location is reviewed and remedies to any potential negative ambient impacts on the AFM’s performance are discussed.

• Unpack AFM
• Set up AFM
• Evaluate AFM site for acoustic and structural vibrations
• Verify system specifications

Day 2

The objective is to train up to two operators on the skills required to operate the AFM and to make images of standard samples. Skills reviewed include:

• Changing samples
• Changing probes
• Aligning the light lever
• Positioning the photodetector
• Selecting resonance (vibrating mode only)
• Tip approach
• Scanning
• Optimizing GPID
• High resolution scanning on the AFMWorkshop product

The final component to the AFMWorkshop On-Site Installation and Training is the preparation of a service installation report, completed and signed by both the installation engineer and the customer at the end of Day 2. This report verifies that the instrument is properly functioning and/or makes note of any problems that may need further attention. After the installation, follow-up questions should be primarily directed to the AFMWorkshop service engineer who performed the installation, and come through one of your facility’s two designated AFM users receiving the training.

AFMWorkshop covers all travel costs as well as room and board for the customer service engineer. We request a minimum of two weeks advance notice to schedule the installation.

To learn more about AFM Installation Training, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM

The atomic force microscopy curriculum is an introduction to the instrumentation of atomic force microscopes, including theory, design, and operation. Standard AFM scanning modes are covered including vibrating and non-vibrating modes.

This comprehensive all-inclusive curriculum introduces students to the technology and instrumentation of atomic force microscopy. The background of the hardware and operating principles are reviewed, including the main modes that will be used in the labs: contact mode, tapping mode, and force spectroscopy.

Important applications of atomic force microscopy are discussed in the context of the laboratory assignments. Image processing, using the freeware package Gwyddion, is used for various analyses associated with the labs. The curriculum contains a pre-lab quiz and then the Curriculum for Atomic Force Microscopy–An Introduction to the Technology and Instrumentation of AFM.

Analysis/questions for further discussion for each individual laboratory (the answers are provided in the accompanying Teacher Manual). Aside from the AFM instrument, no other material or parts are necessary!

Objectives

• Learn the basic operating principles behind atomic force microscopy.
• Understand and operate the main modes of AFM: contact mode, tapping mode, force spectroscopy.
• Operate an AFM to measure topography and compositional differences of a sample on the nanoscale.
• Conduct basic analysis on images, including statistics and cross-sectional measurements.

Undergraduates

This curriculum has been developed for undergraduate students in any science or engineering background: biology, chemistry, physics, materials science, mechanical engineering materials engineering, etc. Familiarity with freshman level mathematics and physics concepts is assumed, but all concepts and theory related to atomic force microscopy are explained.

Student Guide

30-page curriculum for students – Covers the background of advanced AFM operation, modes, and application. It then goes through a step-by-step series of labs on contact mode, tapping mode, and force spectroscopy. This section also includes a pre-lab quiz for students as well as suggested analysis questions to be answered in the lab report write-ups.

Teacher Manual

Accompanying Teacher Manual–This accompaniment to the student guide assists teacher/teaching assistant to help students through labs. It includes answers to the pre-lab quiz and detailed answers with sample images to all the suggested analysis questions.

AFM Sample Kit

Samples – A series of 4 prepared and mounted samples which are supplied ready to be inserted into the AFM instrument. The student guide curriculum guides the students through experiments on these samples.

AFM Probe Kit

Probes – A series of 8 probes of different spring constants to be used in the curriculum.

Labs include:
• Measuring Roughness of Thin Films
• Measuring Compositional Heterogeneity of Everyday Materials
• Metrological Measurements
• Probing Mechanical Properties of a Sample

To learn more, please visit, www.afmworkshop.com or call us at 1 (888) 671-5539.

Atomic Force Microscope Book- A Great Introduction to AFMs for Beginners

Atomic Force Microscopy, written by Peter Eaton, PhD and Paul West, PhD, and published by Oxford University Press, is an essential introduction to atomic force microscope theory and practice, principles and application.

Overview

Atomic force microscopy is an amazing technique that allies a versatile methodology (allowing measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques: it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometer resolution.

This book will provide fundamentals of Atomic Force Microscopy, demystify AFM for the reader, making it easy to understand and easy to use. It is written by authors who have more than 30 years’ experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

• A very practical guide to Atomic Force Microscopy
• Authors have unique insight into the field
• Combination in one book of AFM theory, principles, practice, techniques and application of AFM
• Very up-to-date with latest techniques such as multifrequency AFM, high speed AFM, small cantilevers, etc.
• Insight on how instrumental design influences performance, and instrument use
• Section on how to recognise, and avoid, AFM artifacts
• Examples of AFM application in physical sciences, materials science, life sciences, nanotechnology and industry.

Readership: Industrial users of Atomic Force Microscopy. University researchers using AFM (students in undergraduate and postgraduate degrees, and post-doctoral researchers and professors). Both teachers and students in courses involving AFM, especially nanotechnology courses.

To learn more, please visit www.afmworkshop.com or call at 1 (888) 671-5539.