The Image Logger for the TT-2 AFM features the ability to view forward and reverse images for six channels, display real time oscilloscope-data logger for 6 channels and visualize the spectrum of the 6 data channels.
Image Logger Features
• View forward and reverse images for six channels
• Display real time oscilloscope-data logger for 6 channels
• Visualize the spectrum of the 6 data channels
A great advantage of an atomic force microscope is that it can capture several types of images. Each type of image reveals critical information about the surface topography or physical parameters.
Software
It is possible to display up to six channels from the Z feedback control loop in an atomic force microscope. These include:
• Z Error
• Z Drive (topography)
• Z Sensor
• Phase
• L-R (friction)
• Amplitude
Additionally, these channels may be displayed in the forward and reverse scan directions. With the data logger it is possible to display all six channels of data in the forward and reverse direction. This capability allows real time visualization of all channels.
Image Logger
The image logger simultaneously displays six image channels in forward and reverse directions. During scanning, the palettes and the histogram can be updated. Once a scan is completed, all twelve channel imagescan be saved.
Real Time Oscilloscope
Software for Focus Assist is integrated with the AFMControl software used on the TT-2 AFM. Using the software is easy. Simply focus the optical microscope on the probe, and then on the sample. Once this registration is completed, you can use the software to move directly to the sample, to the probe, or you can even have the optic follow the probe during probe approach.
Spectrum Analyzer
The spectrum of one input data channels can be displayed. Several types of windows and averaging algorithms may be applied to the incoming data stream. Identifying sources of unwanted vibrationsis possible with the spectrum analyser function.
AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.
AFM Workshop 