The 15-micron scanner is interchangeable with the 50-micron or 100-micron scanner in the TT-2 AFM or HR-AFM. Extremely high-resolution scans are made with the 15-micron scanner.
Description
The PS-2010, PS-2011 and PS-2019 piezoelectric scanners are designed for use with the AFMWorkshop TT-2 and HR-AFM Atomic Force Microscopes, and scan samples in the X, Y, and Z-axis. Both products use temperature compensated strain gauges for linearizing scans in the X and Y-axis. The PS-2010 and PS-2019 have temperature compensated strain gauges in the Z-axis, while the PS-2011 does not.All scanners use a modified tripod design for creating motion in the XY axis. Motion is generated through a lever arm. The lever arm in the 50 µm scanner is approximately 5:1, in the 100 µm scanner it’s 10:1 and in the 15 µm scanner, it is 1:1. Animations on the AFMWorkshop website illustrate how the scanners operate. Each scanner contains a PC board with circuits for measuring ceramic motion with the strain gauge, as well as a 20-pin ribbon cable connector. The scanners are attached to the XY manual positioner with three M6 socket head screws.
Sample Holding Stage
Mounted on standard AFM metal disks, samples are held on an aluminum metal plate with two magnets. As shipped, the sample holder is electronically grounded to the microscope stage to help eliminate unwanted effects from sample charging. Included with each scanner is a leveling sample puck. The puck enables samples to be leveled, reducing the AFM image background bow to less than a few nanometers. The leveling sample puck is magnetically held to the sample stage, and has three set screws to level the puck relative to the XY scan axis.
Interchangeable
The 15 µm, 50 µmand the 100µm scanners are interchangeable. The scanners are removed from the TT-2 AFM stage by simply unscrewing three M6 socket head screws and unplugging a 20-pin ribbon cable. It takes less than 5 minutes to remove one scanner and to replace it with another scanner. The 15 µm scanner is our recommendation for highest resolution scanning and lowest noise on the TT2-AFM and HR-AFM.
AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, and stages, dunk and scan, and environmental cell scanning options, and documentation packages for all AFMWorkshop atomic force microscope products. Customers can purchase a standalone AFM stage and customize it to their needs using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas. For more details, please visit www.afmworkshop.com or call at 1 (888) 671-5539.
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