Atomic force microscopes are essential tools for nanotechnology research, providing the necessary resolution for the visualization and measurement of nanostructures including nanoparticles, DNA, thin films, polymers, and much more. With noise floors as low as 0.08 nm, AFM Workshop microscopes are fully capable of handling your nanotechnology research needs.
Atomic force microscopes are essential for nanotechnology research requiring the visualization and measurement of nano structures. AFMWorkshop’s innovative microscopes offer a balance between an affordable price and the rigorous performance required by many nanotechnology researchers. Our instruments are robust and can be used in single-user as well as multi-user laboratories.
AFMWorkshop’s microscopes share a powerful and intuitive user interface that meet the needs of casual as well as advanced AFM operators.
Our Atomic Force Microscopes:
• give great images of nanostructures on both soft and hard materials;
• have an open architecture to facilitate the development of novel instruments;
• are used by customers to create images used in publications;
• include the most common modes.
Publications
Throughout the world, AFMWorkshop products are used every day for nanotechnology research projects in both life and physical sciences. While AFMWorkshop products were introduced to the market in late 2010, we already have a growing list of publications by successful AFMWorkshop customers. (It typically takes several years for customers to produce publications based on research generated by a new AFM.) To view a list of publications referencing AFMWorkshop products, click here.
Scanned Samples
All types of samples are scanned with AFMWorkshop atomic force microscopes, such as patterned surfaces, materials, and life science samples. Many more AFM images from AFMWorkshop atomic force microscopes can be viewed in our AFM Image Gallery.
Samples Screening
AFMWorkshop’s TT-AFM is a particularly useful AFM for labs with much more expensive Atomic Force Microscopes already dedicated to specialized experiments. Routine and repetitive scanning of not particularly challenging samples can be completed without losing valuable time to readjusting the dedicated and more expensive instruments. Additionally, students and researchers can prepare themselves for operating higher-end microscopes by first learning to operate and master the TT-AFM.
Advanced Features of AFMWorkshop Products
High Resolution Scanning
with a Z noise floor of 0.08 nm, the TT-AFM is capable of high-resolution scanning on samples such as DNA, nanoparticles and nanotubes. To ensure optimal performance, our technical staff can provide pre-sales evaluation of your proposed AFM installation location
Expandable architecture
Our product line is expandable with many features offered as upgrades that can be purchased after your initial purchase. We uniquely offer several stage options that may be purchased for the same SPM Control Station.
Modes
Our products are offered with standard modes such as vibrating, and non-vibrating topography modes as well as phase mode and LFM. Additional modes such as C-AFM, lithography, MFM, and F/D are available as options for all of our products. For more details, feel free to visit www.afmworkshop.com Or call at 1 (888) 671-5539.
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