The Basic Atomic Force Microscope is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM scanning. The electronics are located at the rear of the B-AFM stage, and only a single USB cable is connected between the computer and the stage. For scientists and engineers with bigger ideas than budgets.
The Basic Atomic Force Microscope is designed with integrated stage and electronics, making it a compact and portable solution for researchers and engineers.
Simplified Key Operational Steps
Aligning the AFM light lever
A unique feature of the B-AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.
Exchanging probes
With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.
Exchanging samples
Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.
Key Components of the B-AFM
Video Optical Microscope
Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.
XY Sample Stage
The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.
Enclosure
Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.
Electronics
The control electronics circuits in the B-AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high-fidelity logue control loop for measuring topography, and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.
To learn more about atomic basic atomic force microscopes, feel free to visit www.afmworkshop.com or call us at 1 (888) 671-5539.
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