Includes a stepper-motor-driven Z stage, LL-AFM force sensor, and precision X-Y stage. The stage does not include a piezo scanner or video optical microscope. Electrical connections are made at the back of the stage with a 60-pin ribbon cable connector.
Description
Model: MS-3230
The TT-AFM stage has the excellent thermal and mechanical stability required for high-resolution AFM scanning. Additionally, its open design facilitates user modification. This stage is designed to work with the AFMWorkshop Control Station including an Ebox and AFM Control software.
Features and Benefits of the TT-AFM Stage include
Rigid Frame Design
The crossed beam design for the stage support is extremely rigid so the AFM is less susceptible to external vibrations.
Light Lever AFM Force Sensor
Light lever force sensors are used in almost all atomic force microscopes and permit many types of experiments.
Integrated Probe Holder/Probe Exchanger
Probe Exchange is made quick and easy with AFMWorkshop’s unique probe holder and clipping mechanism.
Direct Drive Z stage
A fast probe approach is possible because probe/sample angle alignment is not required. A linear motion stage is used to move the probe in a perpendicular motion to the sample.
Small Footprint
Requires little space and fit easily on a tabletop with stage dimensions of 7.5 x 12″.
Precision XY Stage with Micrometer
The sample can be moved without touch. The sample is moved relative to the probe with a precision XY micrometer stage.
Modes Electric Plug
Capabilities of the TT-AFM are dramatically expanded via a six pole electrical plug at the back of the stage
Laser/Detector Alignment
Laser/detector alignment is simplified via a direct view to both the light lever laser and the photo detector adjustment mechanism.
Video Optical Microscope
A high resolution video optical microscope is used for locating features on a surface, aligning the light lever force sensor, and facilitating probe approach. The video optical microscope includes an XY micrometer stage for moving the video microscope relative to the AFM probe.
Included with the Product
- TT-AFM Stage
- Video Optical Microscope
- 60 pin ribbon cable
- USB cable
- TT-AFM Manual
Besides this, AFM accessories include focus assist and image loggers for AFMs, replacement scanners, probe holders, electronics, dunk and scan and environmental cell scanning options, and documentation packages for all AFM Workshop Products.
You can purchase a standalone AFM stage and customize it as per your requirements using various scanners and light levers. Environmental cells and dunk and scan packages allow AFM scanning for samples submerged in liquids and inert gas.
Additional modes and accessories expand the capabilities of your microscope.
To learn more about atomic force microscope, visit www.afmworkshop.com
AFM Workshop 