Are you looking for high-quality atomic force microscopes? If yes, then you should choose AFMWorkshop. They provide affordable atomic force microscopy solutions to scientists, engineers within all levels of academia and industry.
AFMWorkshop instruments provide a high level of flexibility for conducting a wide array of tests and experiments, and always include vibrating, non-vibrating, phase, and lateral force modes.
All AFMWorkshop atomic force microscopes include standard scanning AFM modes: vibrating (tapping), non-vibrating (contact), phase scanning, and lateral force mode (LFM), and force distance. Optional modes including Conductive AFM, Magnetic Force Microscopy (MFM), Lithography, and Advanced Force Distance modes help to expand the capability of your atomic force microscope. These modes help to measure the conductivity, surface magnetic field, force curves, and manipulation of surfaces. Additional AFM modes and accessories expand the capabilities of your microscope.
AFMWorkshop instruments come with many options included. You can expand the range of your atomic force microscopy imaging by adding modes and accessories to your AFM.
Know more about modes of AFM:
Conductive AFM (C-AFM)
C-AFM is an option for the TT, NP, and SA-AFM. The C-AFM measures topography and conductivity images simultaneously. This option allows measuring current-voltage (I/V) curves at specific locations on a surface.
Lithography
This NanoLithography software option enables the AFM probe to alter the physical or chemical properties of the surface. Created in LabVIEW and integrated with the AFMControl software. VI’s are available to customers who want to modify the software and create new capabilities.
Magnetic Force Microscopy (MFM)
MFM is used to generate images of magnetic fields on a surface and is particularly useful in the development of magnetic recording technology. Magnetic fields associated with individual magnetic nanoparticles are also revealed through MFM. Now, easily measure surface magnetic field by incorporating a magnetic probe into the AFM.
Advanced Force/Distance
This advanced AFM module is flexible and enables many types of experiments. Force Distance Curves measure the deflection of a cantilever as it interacts with a surface. Force-Distance measurements monitor surface parameters such as Adhesion, Stiffness, Compliance, Hardness, and Contaminate Thickness.
To learn more, feel free to visit https://www.afmworkshop.com.
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